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Results 1 to 25 of 653

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ANALYSE DES COUCHES D'OXYDATION SUR AL PAR MOCROSONDE IONIQUEABE T; AIZAWA H; UCHIYAMA T et al.1974; J. METAL FINISHG SOC. JAP.; JAP.; DA. 1974; VOL. 25; NO 8; PP. 458-459; ABS. ANGL.; BIBL. 5 REF.Article

CONCENTRATION PROFILES THROUGH THIN OXIDE SCALES BY ION-PROBE MICROANALYSISWRIGHT IG; SELTZER MS.1973; METALLURG. TRANS.; U.S.A.; DA. 1973; VOL. 4; NO 2; PP. 411-417; BIBL. 8 REF.Serial Issue

ION MICROPROBE ANALYSIS FOR NIOBIUM HYDRIDE IN HYDROGENEMBRITTLED NIOBIUMWILLIAMS P; EVANS CA JR; GROSSBECK ML et al.1976; ANAL. CHEM.; U.S.A.; DA. 1976; VOL. 48; NO 7; PP. 964-968; BIBL. 12 REF.Article

AIMING PERFORMANCE OF THE ATOM PROBEKRISHNASWAMY SV; MCLANE SB; MULLER EW et al.1975; REV. SCI. INSTRUM.; U.S.A.; DA. 1975; VOL. 46; NO 9; PP. 1237-1240; BIBL. 24 REF.Article

EFFECTS OF SECONDARY PHASES IN STEELS ON THE ION INTENSITY RATIOS MEASURED BY THE ION MICROPOBE MASS ANALYZERTSUNOYAMA K; OHASHI Y; SUZUKI T et al.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 6; PP. 1039-1040; BIBL. 4 REF.Article

THE COMBINED EFFECT OF SI AND P ON THE OXIDATION OF IRON AND THE CAMECA STUDIES OF THE OXIDE SCALE.POMPE R; SVEDUNG I; VANNERBERG NG et al.1976; SCAND. J. METALLURGY; SWED.; DA. 1976; VOL. 5; NO 6; PP. 258-261; BIBL. 6 REF.Article

THE ION MICROPROBE: INSTRUMENTATION AND TECHNIQUESLIEBL H.1975; NATION. BUR. STAND., SPEC. PUBL.; U.S.A.; DA. 1975; NO 427; PP. 1-31; BIBL. 3 P.; (SECONDARY ION MASS SPECTROM. PROC. WORKSHOP SECONDARY ION MASS SPECTROM. ION MICROPROBE MASS ANAL.; GAITHERSBURG, MD.; 1974)Conference Paper

THE ATOM PROBE AND MARKOV CHAIN STATISTICS OF CLUSTERINGJOHNSON CA; KLOTZ JH.1974; TECHNOMETRICS; U.S.A.; DA. 1974; VOL. 16; NO 4; PP. 483-493; BIBL. 13 REF.Article

ANALYSE DE SEMICONDUCTEURS A L'AIDE D'UN MICROANALYSEUR IONIQUENAKAJIMA S; YAEGASHI Y.1975; OYO BUTURI; JAP.; DA. 1975; VOL. 44; NO 12; PP. 1303-1311; BIBL. 1 P. 1/2Article

ANALYSE QUANTITATIVE DES ACIERS FAIBLEMENT ALLIES AVEC UN MICROANALYSEUR IONIQUEKONDO T; TAMURA H; ISHITANI T et al.1975; MASS. SPECTROSC.; JAP.; DA. 1975; VOL. 23; NO 3; PP. 221-229; ABS. ANGL.; BIBL. 8 REF.Article

ION MICROPROBE MEASUREMENTS OF CONCENTRATION DEPTH PROFILES OF ERBIUM OXIDE ON THIN FILM ERBIUM METALGUTHRIE JW.1973; J. LESS-COMMON METALS; NETHERL.; DA. 1973; VOL. 30; NO 2; PP. 317-320; BIBL. 8 REF.Serial Issue

PERFORMANCE EVALUATION OF AN ION MICROPROBEWHATLEY TA; SLACK CB; DAVIDSON E et al.1972; J. RADIOANAL. CHEM.; NETHERL.; DA. 1972; VOL. 12; NO 1; PP. 367-368; (CHEM. ANAL. CHARGED PART. BOMBARDMENT INT. MEET.; NAMUR BELG.; 1971)Conference Paper

IONEN-MIKROSONDEN-ANALYSATOREN = ANALYSEURS A MICROSONDES IONIQUESLIEBL H.1972; MESSTECHNIK; DTSCH.; DA. 1972; VOL. 80; NO 12; PP. 358-365; ABS. ANGL.; BIBL. 17 REF.Serial Issue

AN AUTOMATED SCANNING ION MICROBEAM SYSTEMREQUICHA FERREIRA LF; CALVERT JM.1981; NUCL. INSTRUM. METHODS PHYS. RES.; ISSN 502936; NLD; DA. 1981; VOL. 188; NO 1; PP. 177-183; BIBL. 18 REF.Article

SECONDARY-ION COLLECTION SYSTEM FOR AN ION MICROPROBE ANALYZER OF HIGH MASS RESOLUTION = SYSTEME DE COLLECTION DES IONS SECONDAIRES POUR UN ANALYSEUR A MICROSONDE DE HAUTE RESOLUTIONKROHN VE; RINGO GR.1972; REV. SCI. INSTRUM.; U.S.A.; DA. 1972; VOL. 43; NO 12; PP. 1771-1772; BIBL. 5 REF.Serial Issue

ION MICROANALYZER AND ITS APPLICATION TO SOLID SAMPLESAOKI S; HIRANO T; FUJIWARA M et al.1972; HITACHI REV.; JAP.; DA. 1972; VOL. 21; NO 10; PP. 399-411Serial Issue

SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

ETUDE DES SURFACES METALLIQUES PAR MICROANALYSE IONIQUE ET SPECTROMETRIE AUGERLEROY V; SERVAIS JP; GRAAS H et al.1975; SILIC. INDUSTR.; BELG.; DA. 1975; VOL. 40; NO 2; PP. 37-47; ABS. ANGL. ALLEM.; BIBL. 12 REF.Article

APPLICATION DES MICROSONDES ELECTRONIQUES ET IONIQUES A L'ETUDE DES SEMI-CONDUCTEURSGIMEL'FARB FA.1975; IZVEST. SIBIR. OTDEL. AKAD. NAUK S.S.S.R., KHIM. NAUK; S.S.S.R.; DA. 1975; NO 2; PP. 41-58; BIBL. 12 REF.Article

DEVELOPPEMENT D'UN SYSTEME DE TRAITEMENT DES DONNEES "ON-LINE" EN TEMPS REEL POUR L'ANALYSEUR A MICROSONDE IONIQUEKATO Y; TAJIMA Y; KAYAKAWA H et al.1975; MASS SPECTROSC.; JAP.; DA. 1975; VOL. 23; NO 4; PP. 271-279; ABS. ANGL.; BIBL. 2 REF.Article

ELECTROHYDRODYNAMIC CAPILLARY SOURCE OF IONS AND CHARGED DROPLETS.KROHN VE.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 3; PP. 1144-1146; BIBL. 24 REF.Article

THE SCIENCE OF STEELSHONEYCOMBE RWK.1974; PROC. R. INSTIT. G.B.; G.B.; DA. 1974; VOL. 47; PP. 253-273Article

RECENT IMPROVEMENTS OF THE ION ANALYZER AND TYPICAL EXAMPLES OF APPLICATIONSROUBEROL JM; BASSEVILLE P; LENOIR JP et al.1972; J. RADIOANAL. CHEM.; NETHERL.; DA. 1972; VOL. 12; NO 1; PP. 59-67; (CHEM. ANAL. CHARGED PART. BOMBARDMENT INT. MEET.; NAMUR BELG.; 1971)Conference Paper

ANALYSE QUANTITATIVE DE LA SURFACE DE L'ACIER PAR MICROANALYSE IONIQUESERVAIS JP; GRAAS H; LEROY V et al.1976; VIDE; FR.; DA. 1976; VOL. 31; NO 181; PP. 27-29; ABS. ANGL.; BIBL. 2 REF.Article

A COMPARISON OF MASS SPECTRA FROM THREE ION PROBESBRADLEY JG; JEROME DY; EVANS CA et al.1975; NATION. BUR. STAND., SPEC. PUBL.; U.S.A.; DA. 1975; PP. 69-77; BIBL. 5 REF.; (SECONDARY ION MASS SPECTROM. PROC. WORKSHOP SECONDARY ION MASS SPECTROM. ION MICROPROBE MASS ANAL.; GAITHERSBURG, MD.; 1974)Conference Paper

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