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Results 1 to 25 of 290

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ULTRASOUND COMPUTERIZED TOMOGRAPHY USING TRANSMISSION AND REFLECTION MODE: APPLICATION TO MEDICAL DIAGNOSISHILLER D; ERMERT H.1982; ACOUSTICAL IMAGING; ISSN 0270-5117; USA; DA. 1982; VOL. 12; PP. 553-563; BIBL. 10 REF.Conference Paper

SCANNING ACOUSTIC MICROSCOPE OPERATING IN THE REFLECTION MODENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1980; ACOUST. IMAG.; USA; DA. 1980; VOL. 8; PP. 629-639; BIBL. 4 REF.Conference Paper

ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper

PHOTOSENSITIVE FIELD EMISSION FROM SILICON POINT ARRAYSTHOMAS RN; NATHANSON HC.1972; APPL. PHYS. LETTERS; U.S.A.; DA. 1972; VOL. 21; NO 8; PP. 384-386; BIBL. 10 REF.Serial Issue

VISUALIZATION OF THICK SPECIMENS USINGA REFLECTION ACOUSTIC MICROSCOPENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 3 PART. 1; PP. 1245-1249; BIBL. 7 REF.Article

AN ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPYATALAR A.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 10; PP. 5130-5139; BIBL. 18 REF.Article

PHOTOCATHODES A AFFINITE ELECTRONIQUE NEGATIVEGOLOWACZ H.1974; PRACE OSRODKA BADAWCZO-ROZWOJOW. ELEKTRON. PROZNIOW.; POLSKA; DA. 1974; VOL. 2; NO 2; PP. 19-37; ABS. ANGL. RUSSE; BIBL. 1 P.Article

LINEARLY FOCUSED ACOUSTIC BEAMS FOR ACOUSTIC MICROSCOPYKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 520-522; BIBL. 8 REF.Article

EXPANDING-APERTURE ANNULAR ARRAYDIETZ DR; PARKS SI; LINZER M et al.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 56-75; BIBL. 23 REF.Article

MICROWAVE OVEN MODE TUNING BY SLAB DIELECTRIC LOADSMIHRAN TG.1978; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1978; VOL. 26; NO 6; PP. 381-387; BIBL. 8 REF.Article

GAAS REFLECTION PHOTOCATHODES GROWN BY METAL ALKYL VAPOR PHASE EPITAXY.ALLENSON M; BASS SJ.1976; APPL. PHYS. LETTERS; U.S.A.; DA. 1976; VOL. 28; NO 3; PP. 113-115; BIBL. 12 REF.Article

THE APPLICATION OF SEMICONDUCTORS WITH NEGATIVE ELECTRON AFFINITY SURFACES TO ELECTRON EMISSION DEVICES.MARTINELLI RU; FISHER DG.1974; PROC. I.E.E.E.; U.S.A.; DA. 1974; VOL. 62; NO 10; PP. 1339-1360; BIBL. 2 P.Article

ANISOTROPY DETECTION IN SAPPHIRE BY ACOUSTIC MICROSCOPE USING LINE-FOCUS BEAMKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 534-536; BIBL. 9 REF.Article

BROADBAND RANDOM PHASE DIFFUSER FOR ULTRASONIC IMAGINGALPHONSE GA; VILKOMERSON D.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 4; PP. 325-332; BIBL. 11 REF.Article

REFLEXION X-RAY TOPOGRAPHY OF OXIDATION-INDUCED STACKING FAULTS IN SILICON.OPPOLZER H.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 42; NO 2; PP. K91-K93; BIBL. 11 REF.Article

ULTRASONIC B-SCAN IMAGING: THEORY OF IMAGE FORMATION AND A TECHNIQUE FOR RESTORATIONMOSTAFA FATEMI; KAK AC.1980; ULTRASON. IMAG.; USA; DA. 1980; VOL. 2; NO 1; PP. 1-47; BIBL. 40 REF.Article

AN ACOUSTIC GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPY AND DIAGNOSTIC ULTRASOUNDWEGLEIN RD.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 89-100; BIBL. 10 REF.Article

AN INTERDIGITAL TRANSDUCER FOR ACOUSTIC IMAGING.TODA K; MURATA Y.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 3; PP. 144-145; BIBL. 4 REF.Article

CONSTRUCTION OF LIQUID CRYSTAL LIGHT VALVE IN REFLECTION MODE.YOSHIKAWA S; HORIE M; TAKAHASHI H et al.1976; FUJITSU SCI. TECH. J.; JAP.; DA. 1976; VOL. 12; NO 3; PP. 57-72; BIBL. 7 REF.Article

MAGNIFICATION VARIATIONS IN REFLECTION ELECTRON MICROSCOPY USING DIFFRACTED BEAMS.COWLEY JM; NIELSEN PEH.1975; ULTRAMICROSCOPY; NETHERL.; DA. 1975; VOL. 1; NO 2; PP. 145-150; BIBL. 6 REF.Article

REFLECTION ELECTRON MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE STRUCTURE PHASE TRANSITION ON CLEAN (111) SILICON SURFACESOSAKABE N; YAGI K; HONJO G et al.1980; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1980; VOL. 19; NO 6; PP. L309-L312; BIBL. 10 REF.Article

ETUDE DE LA REPARTITION DE L'ENERGIE DES ELECTRONS DANS LES BANDES ET LES LIGNES DE KIKUCHI OBTENUES PAR REFLEXION AVEC DES ELECTRONS INCIDENTS DE 40 KEV SUR DES CRISTAUX DE SILICIUM.BOVIER C; BURGGRAF C; COUSANDIER R et al.1978; C.R. ACAD. SCI., A; FRA; DA. 1978; VOL. 286; NO 21; PP. 283-284; ABS. ENG; BIBL. 2 REF.Article

EXTINCTION THEORY FOR A PLANE-PARALLEL MOSAIC CRYSTAL IN TRANSMISSIONMAZZONE G.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 3; PP. 391-397; BIBL. 6 REF.Article

ASPECTS GEOMETRIQUES DANS LA CONSIDERATION DES FACTEURS D'APPAREIL POUR OBTENIR LES SPECTRES DE RAYONS X AU DIFFRACTOMETRE. II. ANALYSE DE LA RELATION INTEGRALE ENTRE LES SPECTRES EXPERIMENTAUX ET LES SPECTRES VRAIS ET METHODE DE CALCUL DU PROFIL DES FONCTIONS INSTRUMENTALES POUR LES CLICHES EN REFLEXION ET EN TRANSMISSIONNAGORNYJ VG; PLESHAKOV VF.1981; KRISTALLOGRAFIJA; ISSN 0023-4761; SUN; DA. 1981; VOL. 26; NO 2; PP. 271-276; BIBL. 4 REF.Article

Explosives identification model in reflection mode for THz security systemRYNIEC, Radoslaw; ZAGRAJEK, Przemysław; TRZCINSKI, Tomasz et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8119, issn 0277-786X, isbn 978-0-8194-8729-2, 811904.1-811904.6Conference Paper

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