kw.\*:("MODE REFLEXION")
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ULTRASOUND COMPUTERIZED TOMOGRAPHY USING TRANSMISSION AND REFLECTION MODE: APPLICATION TO MEDICAL DIAGNOSISHILLER D; ERMERT H.1982; ACOUSTICAL IMAGING; ISSN 0270-5117; USA; DA. 1982; VOL. 12; PP. 553-563; BIBL. 10 REF.Conference Paper
SCANNING ACOUSTIC MICROSCOPE OPERATING IN THE REFLECTION MODENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1980; ACOUST. IMAG.; USA; DA. 1980; VOL. 8; PP. 629-639; BIBL. 4 REF.Conference Paper
ACOUSTIC MICROSCOPYNONGAILLARD B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 423-431; BIBL. 8 REF.Conference Paper
PHOTOSENSITIVE FIELD EMISSION FROM SILICON POINT ARRAYSTHOMAS RN; NATHANSON HC.1972; APPL. PHYS. LETTERS; U.S.A.; DA. 1972; VOL. 21; NO 8; PP. 384-386; BIBL. 10 REF.Serial Issue
VISUALIZATION OF THICK SPECIMENS USINGA REFLECTION ACOUSTIC MICROSCOPENONGAILLARD B; ROUVAEN JM; BRIDOUX E et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 3 PART. 1; PP. 1245-1249; BIBL. 7 REF.Article
AN ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPYATALAR A.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 10; PP. 5130-5139; BIBL. 18 REF.Article
PHOTOCATHODES A AFFINITE ELECTRONIQUE NEGATIVEGOLOWACZ H.1974; PRACE OSRODKA BADAWCZO-ROZWOJOW. ELEKTRON. PROZNIOW.; POLSKA; DA. 1974; VOL. 2; NO 2; PP. 19-37; ABS. ANGL. RUSSE; BIBL. 1 P.Article
LINEARLY FOCUSED ACOUSTIC BEAMS FOR ACOUSTIC MICROSCOPYKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 520-522; BIBL. 8 REF.Article
EXPANDING-APERTURE ANNULAR ARRAYDIETZ DR; PARKS SI; LINZER M et al.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 56-75; BIBL. 23 REF.Article
MICROWAVE OVEN MODE TUNING BY SLAB DIELECTRIC LOADSMIHRAN TG.1978; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1978; VOL. 26; NO 6; PP. 381-387; BIBL. 8 REF.Article
GAAS REFLECTION PHOTOCATHODES GROWN BY METAL ALKYL VAPOR PHASE EPITAXY.ALLENSON M; BASS SJ.1976; APPL. PHYS. LETTERS; U.S.A.; DA. 1976; VOL. 28; NO 3; PP. 113-115; BIBL. 12 REF.Article
THE APPLICATION OF SEMICONDUCTORS WITH NEGATIVE ELECTRON AFFINITY SURFACES TO ELECTRON EMISSION DEVICES.MARTINELLI RU; FISHER DG.1974; PROC. I.E.E.E.; U.S.A.; DA. 1974; VOL. 62; NO 10; PP. 1339-1360; BIBL. 2 P.Article
ANISOTROPY DETECTION IN SAPPHIRE BY ACOUSTIC MICROSCOPE USING LINE-FOCUS BEAMKUSHIBIKI J; OHKUBO A; CHUBACHI N et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 15; PP. 534-536; BIBL. 9 REF.Article
BROADBAND RANDOM PHASE DIFFUSER FOR ULTRASONIC IMAGINGALPHONSE GA; VILKOMERSON D.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 4; PP. 325-332; BIBL. 11 REF.Article
REFLEXION X-RAY TOPOGRAPHY OF OXIDATION-INDUCED STACKING FAULTS IN SILICON.OPPOLZER H.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 42; NO 2; PP. K91-K93; BIBL. 11 REF.Article
ULTRASONIC B-SCAN IMAGING: THEORY OF IMAGE FORMATION AND A TECHNIQUE FOR RESTORATIONMOSTAFA FATEMI; KAK AC.1980; ULTRASON. IMAG.; USA; DA. 1980; VOL. 2; NO 1; PP. 1-47; BIBL. 40 REF.Article
AN ACOUSTIC GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPY AND DIAGNOSTIC ULTRASOUNDWEGLEIN RD.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 89-100; BIBL. 10 REF.Article
AN INTERDIGITAL TRANSDUCER FOR ACOUSTIC IMAGING.TODA K; MURATA Y.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 3; PP. 144-145; BIBL. 4 REF.Article
CONSTRUCTION OF LIQUID CRYSTAL LIGHT VALVE IN REFLECTION MODE.YOSHIKAWA S; HORIE M; TAKAHASHI H et al.1976; FUJITSU SCI. TECH. J.; JAP.; DA. 1976; VOL. 12; NO 3; PP. 57-72; BIBL. 7 REF.Article
MAGNIFICATION VARIATIONS IN REFLECTION ELECTRON MICROSCOPY USING DIFFRACTED BEAMS.COWLEY JM; NIELSEN PEH.1975; ULTRAMICROSCOPY; NETHERL.; DA. 1975; VOL. 1; NO 2; PP. 145-150; BIBL. 6 REF.Article
REFLECTION ELECTRON MICROSCOPE OBSERVATIONS OF DISLOCATIONS AND SURFACE STRUCTURE PHASE TRANSITION ON CLEAN (111) SILICON SURFACESOSAKABE N; YAGI K; HONJO G et al.1980; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1980; VOL. 19; NO 6; PP. L309-L312; BIBL. 10 REF.Article
ETUDE DE LA REPARTITION DE L'ENERGIE DES ELECTRONS DANS LES BANDES ET LES LIGNES DE KIKUCHI OBTENUES PAR REFLEXION AVEC DES ELECTRONS INCIDENTS DE 40 KEV SUR DES CRISTAUX DE SILICIUM.BOVIER C; BURGGRAF C; COUSANDIER R et al.1978; C.R. ACAD. SCI., A; FRA; DA. 1978; VOL. 286; NO 21; PP. 283-284; ABS. ENG; BIBL. 2 REF.Article
EXTINCTION THEORY FOR A PLANE-PARALLEL MOSAIC CRYSTAL IN TRANSMISSIONMAZZONE G.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 3; PP. 391-397; BIBL. 6 REF.Article
ASPECTS GEOMETRIQUES DANS LA CONSIDERATION DES FACTEURS D'APPAREIL POUR OBTENIR LES SPECTRES DE RAYONS X AU DIFFRACTOMETRE. II. ANALYSE DE LA RELATION INTEGRALE ENTRE LES SPECTRES EXPERIMENTAUX ET LES SPECTRES VRAIS ET METHODE DE CALCUL DU PROFIL DES FONCTIONS INSTRUMENTALES POUR LES CLICHES EN REFLEXION ET EN TRANSMISSIONNAGORNYJ VG; PLESHAKOV VF.1981; KRISTALLOGRAFIJA; ISSN 0023-4761; SUN; DA. 1981; VOL. 26; NO 2; PP. 271-276; BIBL. 4 REF.Article
Explosives identification model in reflection mode for THz security systemRYNIEC, Radoslaw; ZAGRAJEK, Przemysław; TRZCINSKI, Tomasz et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8119, issn 0277-786X, isbn 978-0-8194-8729-2, 811904.1-811904.6Conference Paper