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A DIAGNOSTIC MODEL FOR ANY-TYPE-FAULT TEST GENERATION IN SWITCHING CIRCUITSNOWICKI M.1980; DIGIT. PROCESS.; CHE; DA. 1980; VOL. 6; NO 1; PP. 69-74; ABS. FRE/GER; BIBL. 8 REF.Article
Testable designs of one-count generatorsHANIOTAKIS, T; PASCHALIS, A; HALATSIS, C et al.International journal of electronics. 1998, Vol 85, Num 5, pp 629-650, issn 0020-7217Article
Fault models for embedded systemsGODSKESEN, J. C.Lecture notes in computer science. 1999, pp 354-359, issn 0302-9743, isbn 3-540-66559-5Conference Paper