White light scanning interferometry adapted for large-area optical analysis of thick and rough hydroxyapatite layersPECHEVA, Emilia; MONTGOMERY, Paul; MONTANER, Denis et al.Langmuir. 2007, Vol 23, Num 7, pp 3912-3918, issn 0743-7463, 7 p.Article

Investigations optiques submicroniques par microscopie à saut de phase et par microscopie à glissement de franges (nanoscopie) des défauts dans les couches minces et les dispositifs microélectroniques = Submicron optical analysis of defects in epitaxial layers and micro-electronic devices by phase stepping microscopy and peak fringe scanning microscopyMontaner, Denis; Montgomery, Paul-C.1993, 140 p.Thesis

Teager-kaiser energy and higher-order operators in white-light interference microscopy for surface shape measurementSALZENSTEIN, Fabien; MONTGOMERY, Paul C; MONTANER, Denis et al.EURASIP journal on applied signal processing. 2005, Vol 2005, Num 17, pp 2804-2815, issn 1110-8657, 12 p.Article

Buried interface characterization in optoelectronic materials by interference microscopyBENHADDOU, Driss; MONTGOMERY, Paul C; MONTANER, Denis et al.Journal of modern optics (Print). 2001, Vol 48, Num 3, pp 533-547, issn 0950-0340Article

Optimised 3D surface measurement of hydroxyapatite layers using adapted white light scanning interferometryPECHEVA, Emilia; MONTGOMERY, Paul; MONTANER, Denis et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 634137.1-634137.6, issn 0277-786X, isbn 0-8194-6426-0, 1VolConference Paper

Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?MONTGOMERY, Paul C; SERIO, Bruno; ANSTOTZ, Freddy et al.Applied surface science. 2013, Vol 281, pp 89-95, issn 0169-4332, 7 p.Conference Paper

Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopyHALTER, Eric; MONTGOMERY, Paul; MONTANER, Denis et al.Applied surface science. 2010, Vol 256, Num 21, pp 6144-6152, issn 0169-4332, 9 p.Article