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Results 1 to 25 of 533

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Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensatorsBROCH, Laurent; EN NACIRI, Aotmane; JOHANN, Luc et al.Thin solid films. 2011, Vol 519, Num 9, pp 2601-2603, issn 0040-6090, 3 p.Conference Paper

THE CONNECTION BETWEEN MUELLER AND JONES MATRICES OF POLARIZATION OPTICSSIMON R.1982; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1982; VOL. 42; NO 5; PP. 293-297; BIBL. 11 REF.Article

Near infra-red Mueller matrix imaging system and application to retardance imaging of strainSANDVIK AAS, Lars Martin; GUNNAR ELLINGSEN, Pal; KILDEMO, Morten et al.Thin solid films. 2011, Vol 519, Num 9, pp 2737-2741, issn 0040-6090, 5 p.Conference Paper

EXPERIMENTAL DETERMINATIONS OF MUELLER SCATTERING MATRICES FOR NONSPHERICAL PARTICLESPERRY RJ; HUNT AJ; HUFFMAN DR et al.1978; APPL. OPT.; USA; DA. 1978; VOL. 17; NO 17; PP. 2700-2710; BIBL. 32 REF.Article

PHOTOPOLARIMETRIC MEASUREMENT OF THE MUELLER MATRIX BY FOURIER ANALYSIS OF A SINGLE DETECTED SIGNAL.AZZAM RMA.1978; OPT. LETTERS; U.S.A.; DA. 1978; VOL. 2; NO 6; PP. 148-150; BIBL. 9 REF.Article

BACKSCATTERING MUELLER-MATRIX PHOTOPOLARIMETER WITH NONRECIPROCAL POLARIZING-ANALYZING OPTICSAZZAM RMA.1981; OPT. LETT.; ISSN 0146-9592; USA; DA. 1981; VOL. 6; NO 9; PP. 417-418; BIBL. 9 REF.Article

MEASUREMENT OF POLARIZED LIGHT INTERACTIONS VIA THE MUELLER MATRIXTHOMPSON RC; BOTTIGER JR; FRY ES et al.1980; APPL. OPT.; USA; DA. 1980; VOL. 19; NO 8; PP. 1323-1332; BIBL. 42 REF.Article

SELF-STUDY MANUAL ON OPTICAL RADIATION MEASUREMENTS. 1. CONCEPTS. CHAPTER 6.NICODEMUS FE.1977; NATION. BUR. STAND., MONOGR.; U.S.A.; DA. 1977; VOL. 6; NO 1; PP. (60P.); BIBL. 1 P. 1/2Serial Issue

PROGRAM FOR MUELLER MATRICESPITLAK RT.1979; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1979; VOL. 11; NO 4; PP. 48-53; BIBL. 3 REF.Article

MUELLER MATRIX ELLIPSOMETRY WITH IMPERFECT COMPENSATORSHAUGE PS.1978; J. OPT. SOC. AMER.; USA; DA. 1978; VOL. 68; NO 11; PP. 1519-1528; BIBL. DISSEM.Article

Transmission Mueller matrix ellipsometry of chirality switching phenomenaARTEAGA, Oriol; EL-HACHEMI, Zoubir; CANILLAS, Adolf et al.Thin solid films. 2011, Vol 519, Num 9, pp 2617-2623, issn 0040-6090, 7 p.Conference Paper

Dual rotating compensator ellipsometry: Theory and simulationsJIAN LI; RAMANUJAM, Balaji; COLLINS, R. W et al.Thin solid films. 2011, Vol 519, Num 9, pp 2725-2729, issn 0040-6090, 5 p.Conference Paper

Spectroscopic Mueller matrix polarimeter using four-channeled spectraOTANI, Yukitoshi; WAKAYAMA, Toshitaka; OKA, Kazuhiko et al.Optics communications. 2008, Vol 281, Num 23, pp 5725-5730, issn 0030-4018, 6 p.Article

Useful Mueller matrix symmetries for ellipsometryARTEAGA, Oriol.Thin solid films. 2014, Vol 571, pp 584-588, issn 0040-6090, 5 p., 3Conference Paper

Spectroscopic Mueller polarimeter based on liquid crystal devicesGARCIA-CAUREL, E; DE MARTINO, A; DREVILLON, B et al.Thin solid films. 2004, Vol 455-56, pp 120-123, issn 0040-6090, 4 p.Conference Paper

Expanding horizons: new developments in ellipsometry and polarimetryASPNES, D. E.Thin solid films. 2004, Vol 455-56, pp 3-13, issn 0040-6090, 11 p.Conference Paper

Measuring loss from polarization sensitivitySTOLZE, Gunnar.Laser focus world. 2001, Vol 37, Num 3, pp 113-118, issn 1043-8092, 4 p.Article

Canonical forms of depolarizing Mueller matricesOSSIKOVSKI, Razvigor.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2010, Vol 27, Num 1, pp 123-130, issn 1084-7529, 8 p.Article

Polarization entropy transfer and relative polarization entropyBARAKAT, R.Optics communications. 1996, Vol 123, Num 4-6, pp 443-448, issn 0030-4018Article

Normal form for Mueller matrices in polarization opticsSRIDHAR, R; SIMON, R.Journal of modern optics (Print). 1994, Vol 41, Num 10, pp 1903-1915, issn 0950-0340Article

Depolarizing differential Mueller matricesORTEGA-QUIJANO, Noé; ARCE-DIEGO, José Luis.Optics letters. 2011, Vol 36, Num 13, pp 2429-2431, issn 0146-9592, 3 p.Article

Components of purity of a Mueller matrixGIL, Jose J.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2011, Vol 28, Num 8, pp 1578-1585, issn 1084-7529, 8 p.Article

Mueller matrix differential decompositionORTEGA-QUIJANO, Noé; ARCE-DIEGO, Jose Luis.Optics letters. 2011, Vol 36, Num 10, pp 1942-1944, issn 0146-9592, 3 p.Article

MATRICES DE MUELLER ET DE JONES DES MILIEUX QUASI-HOMOGENES MAGNETO-OPTIQUEMENT ACTIFSTRON'KO VD; GOLOVACH GP; KOLESNIKOVA EH P et al.1978; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1978; VOL. 44; NO 3; PP. 534-539; BIBL. 11 REF.Article

DIE ANWENDUNG DER MUELLER-MATRIX AUF DIE SPEKTROSKOPISCHE INFRAROT-ELLIPSOMETRIE MIT DEM FOURIERSPEKTROMETER = L'APPLICATION DE LA MATRICE DE MUELLER A L'ELLIPSOMETRIE INFRAROUGE SPECTROSCOPIQUE AVEC LE SPECTROMETRE FOURIERROSELER A.1982; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1982; VOL. 61; NO 2; PP. 177-186; ABS. ENG; BIBL. 6 REF.Article

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