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Kinetic studies of glutathione S-transferase-catalysed processes through on-line liquid chromatography-electrospray mass spectrometryROSSI, B; MANCINI, I; GUELLA, G et al.Philosophical magazine (2003. Print). 2004, Vol 84, Num 13-16, pp 1373-1382, issn 1478-6435, 10 p.Conference Paper

SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3POLLAK, C; REICHMANN, K; HUTTER, H et al.Applied surface science. 2001, Vol 179, Num 1-4, pp 133-137, issn 0169-4332Conference Paper

Comment on : The 'infinite velocity method' : a means of concentration calibration in secondary ion mass spectrometry? Author's replyVAN DER HEIDE, P. A. W; WITTMAACK, K.Surface science. 2000, Vol 453, Num 1-3, pp L328-L335, issn 0039-6028Article

GaAs delta-doped layers in Si for evaluation of SIMS depth resolutionMOON, D. W; WON, J. Y; KIM, K. J et al.Surface and interface analysis. 2000, Vol 29, Num 6, pp 362-368, issn 0142-2421Article

The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profilingORMSBY, T. J; CHU, D. P; DOWSETT, M. G et al.Applied surface science. 1999, Vol 144-45, pp 292-296, issn 0169-4332Conference Paper

SIMS investigation of MoS2 based sputtercoatingsHEINISCH, C; PIPLITS, K; KUBEL, F et al.Applied surface science. 2001, Vol 179, Num 1-4, pp 269-274, issn 0169-4332Conference Paper

The 'infinite velocity method' : a means of concentration calibration in secondary ion mass spectrometry?WITTMAACK, K.Surface science. 1999, Vol 429, Num 1-3, pp 84-101, issn 0039-6028Article

Application of self-organizing maps to chemical analysisTOKUTAKA, H; YOSHIHARA, K; FUJIMURA, K et al.Applied surface science. 1999, Vol 144-45, pp 59-63, issn 0169-4332Conference Paper

Laser ablation inductively coupled plasma mass spectrometryALEXANDER, M. L; SMITH, M. R; HARTMAN, J. S et al.Applied surface science. 1998, Vol 127-29, pp 255-261, issn 0169-4332Conference Paper

Mid-infrared matrix assisted laser desorption ionization with a water/glycerol matrixCALDWELL, K. L; MURRAY, K. K.Applied surface science. 1998, Vol 127-29, pp 242-247, issn 0169-4332Conference Paper

Rare earth oxide equilibria in pulsed direct current glow discharge mass spectrometryMEI, Y; HARRISON, W. W.Analytical chemistry (Washington, DC). 1996, Vol 68, Num 13, pp 2135-2140, issn 0003-2700Article

Characterization of physical-chemical drivers of Hg1-xCdxTe etch rate using time of flight-secondary ion mass spectrometry and optical interferometryOLSHOVE, R; GARWOOD, G; PETTIJOHN, E et al.Journal of electronic materials. 2006, Vol 35, Num 6, pp 1185-1191, issn 0361-5235, 7 p.Conference Paper

L'ionisation electrospray ou l'art d'effleurer les molécules : Bilan d'une décennie et prospectives = Electrospray ionization mass spectrometry or the art of skimming molecules: A decade of progress and future prospectsARPINO, Patrick.L' Actualité chimique (Paris. 1973). 2002, Num 2, pp 13-20, issn 0151-9093Article

Static SIMS inter-laboratory studyGILMORE, I. S; SEAH, M. P.Surface and interface analysis. 2000, Vol 29, Num 9, pp 624-637, issn 0142-2421Article

The surface transient in Si for SIMS with oblique low-energy O2+ beamsJIANG, Z. X; ALKEMADE, P. F. A.Surface and interface analysis. 1999, Vol 27, Num 3, pp 125-131, issn 0142-2421Article

Dynamic SIMS study of Cr3C2, Cr7C3and Cr23C6SALAITA, G. N; HOFLUND, G. B.Applied surface science. 1998, Vol 134, Num 1-4, pp 194-196, issn 0169-4332Article

LIF imaging and gas-phase diagnostics of laser desorbed MALDI-matrix plumesPURETZKY, A. A; GEOHEGAN, D. B.Applied surface science. 1998, Vol 127-29, pp 248-254, issn 0169-4332Conference Paper

Mass spectroscopic studies on the laser ablation of boron nitrideHEEBYUNG CHAE; SEUNG MIN PARK.Applied surface science. 1998, Vol 127-29, pp 304-308, issn 0169-4332Conference Paper

Chemical effects in the Auger spectrum of copper-oxygen compoundsTIMMERMANS, B; RENIERS, F; HUBIN, A et al.Applied surface science. 1999, Vol 144-45, pp 54-58, issn 0169-4332Conference Paper

Static SIMS : metastable decay and peak intensitiesGILMORE, I. S; SEAH, M. P.Applied surface science. 1999, Vol 144-45, pp 26-30, issn 0169-4332Conference Paper

IR-MALDI of low molecular weight compounds using a free electron laserHESS, W. P; PARK, H. K; YAVAS, O et al.Applied surface science. 1998, Vol 127-29, pp 235-241, issn 0169-4332Conference Paper

The use of inductively coupled plasma mass spectrometry to provide an absolute measurement of surface coverage, and comparison with the quartz crystal microbalanceNARINE, S. S; HUGHES, R; SLAVIN, A. J et al.Applied surface science. 1999, Vol 137, Num 1-4, pp 204-206, issn 0169-4332Article

Characterization of rapid thermal processing oxynitrides by SIMS and XPS analysesBERSANI, M; VANZETTI, L; SBETTI, M et al.Applied surface science. 1999, Vol 144-45, pp 301-305, issn 0169-4332Conference Paper

Routine analysis at sub-micron resolution through the use of sputtered initiated resonance ionization spectroscopyWILLEY, K. F; ARLINGHAUS, H. F; WHITAKER, T. J et al.Applied surface science. 1999, Vol 144-45, pp 36-40, issn 0169-4332Conference Paper

Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMSHODOROABA, Vasile-Dan; UNGER, Wolfgang E. S; JENETT, Holger et al.Applied surface science. 2001, Vol 179, Num 1-4, pp 30-37, issn 0169-4332Conference Paper

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