Influence of part material on the results of measurement of the roughness parameters Rα by the reflectometric methodDVINYANINOV, B.L.Zavodskaâ laboratoriâ. 1984, Vol 50, Num 2, pp 43-46, issn 0321-4265Article

Zur optischen Messung der Oberflaechenrauheit = Optical measurement of the surface roughnessSCHMIDT, K.Feingerätetechnik. 1986, Vol 35, Num 10, pp 446-447, issn 0014-9683Article

Thickness and roughness measurements in poly(o-methoxyaniline) layer-by-layer films using AFMRAPOSO, M; LOBO, R. F. M; PEREIRA-DA-SILVA, M. A et al.International symposium on electrets. 1999, pp 533-536, isbn 0-7803-5025-1Conference Paper

Examination of several novel approaches for the measurement of two-dimensional roughness of sidewalls of high aspect ratio patterns using the Atomic Force MicroscopeKINGSLEY, J. R; PLANO, R. J; GORDON CHAO, K.-J et al.SPIE proceedings series. 1998, pp 508-517, isbn 0-8194-2777-2Conference Paper

Oberflächenmesstechnik für Labor und Produktion = Surface measurement for laboratory and productionFRIES, T.VDI-Berichte. 2003, pp 217-225, issn 0083-5560, isbn 3-18-091806-3, 9 p.Conference Paper

Scattering from normal incidence EUV opticsGULLIKSON, E. M.SPIE proceedings series. 1998, pp 72-80, isbn 0-8194-2776-4Conference Paper

An optical method for profilometry = Ein optisches Verfahren zur RauhigkeitsmessungBABU RAO, C; BALDEV, R; BHATTACHARYA, D.K et al.Experimental techniques (Westport, CT). 1985, Vol 9, Num 12, pp 31-34, issn 0732-8818Article

Rebonds d'atomes froids sur un miroir magnétique = Recoil of cold atoms on a magnetic mirrorFEATONBY, P. D; SAVALLI, V; LEE, C et al.Journal de physique. IV. 2000, Vol 10, Num 8, pp Pr8-139, issn 1155-4339, -Pr8-140Conference Paper

Analyse der Hautrauhigkeit bei Personen unterschiedlicher Altersgruppeen mit dem Visiometer: ein neuartiges EDV-gestütztes Messverfahren = Analysis of skin roughness in persons of different age with the visiometer. A new computer-Assisted methodFLUHR, J. W; GEHRING, W; GLOOR, M et al.Aktuelle Dermatologie. 1995, Vol 21, Num 5, pp 151-156, issn 0340-2541Article

Round robin determination of power spectral densities of different Si wafer surfacesMARX, E; MALIK, I. J; STRAUSSER, Y. E et al.SPIE proceedings series. 1998, pp 26-36, isbn 0-8194-2714-4Conference Paper

Field measurement of surface profile of abrasive blast cleaned steel surfaces using a replica tape = Utilisation d'une bande de réplique pour la mesure du profil superficiel d'un acier nettoyé par abrasionMaterials performance. 1987, Vol 26, Num 11, pp 57-60, issn 0094-1492Article

Numerical filtering used in microtopographical surface measurement = Numerische Filterung bei mikrotopographischen OberflaechenmessungenCHUARD, M; RONDOT, D; MIGNOT, J et al.Wear. 1984, Vol 97, Num 3, pp 267-274, issn 0043-1648Article

Development of a goniometric light scatter instrument with sample imaging abilityZERRAD, Myriam; LEQUIME, Michel; DEUMIE, Carole et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7102, pp 710207.1-710207.15, issn 0277-786X, isbn 978-0-8194-7332-5 0-8194-7332-4, 1VolConference Paper

Photomask edge roughness characterization using an atomic force microscopeFULLER, S; YOUNG, M.SPIE proceedings series. 1998, pp 433-440, isbn 0-8194-2777-2Conference Paper

Statistical process control by employing circular and spherical statistics for the interpretation of BDRF measurementsROTHE, H; HUESER, D; KASPER, A et al.SPIE proceedings series. 1998, pp 47-56, isbn 0-8194-2714-4Conference Paper

Optical Systems Design of Surface Roughness Photoelectric Inspection InstrumentXIAO, Ze-Xin; LI PENG; CAO JIE et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7849, issn 0277-786X, isbn 978-0-8194-8379-9, 78492U.1-78492U.9Conference Paper

Pavement Roughness Measurement Based on Structure LightWANYU LIU; XIAOMING SUN; JIANPING HUANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7133, issn 0277-786X, isbn 978-0-8194-7367-7 0-8194-7367-7, 71332X.1-71332X.6, 2Conference Paper

Study on Computer controlled polishing machine with small air bag toolWANG YI; NI YING; YU, Jing-Chi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6722, pp 67224O.1-67224O.7, issn 0277-786X, isbn 978-0-8194-6879-6 0-8194-6879-7, 2Conference Paper

Size effects on stylus tip reconstruction for micro and nano roughness measurementCHEN, Chao-Chang A; CHEN, Jr-Rung; LIOU, Huay-Chung et al.SPIE proceedings series. 2005, pp 58790H.1-58790H.8, isbn 0-8194-5884-8, 1VolConference Paper

Scattering and surface roughness II (San Diego CA, 21-23 July 1998)Zu-Han Gu; Maradudin, Alexei A.SPIE proceedings series. 1998, isbn 0-8194-2881-7, VII, 382 p, isbn 0-8194-2881-7Conference Proceedings

Advanced surface inspection techniques for SOI wafersNOZOE, M; SUGIMOTO, A; IKEDA, T et al.SPIE proceedings series. 1998, pp 488-492, isbn 0-8194-2777-2Conference Paper

Requirements for accurate estimation of fractal parameters for self-affine roughness profiles using the line scaling methodKULATILAKE, P. H. S. W; UM, J; PAN, G et al.Rock mechanics and rock engineering. 1997, Vol 30, Num 4, pp 181-206, issn 0723-2632Article

X-ray measurements of total reflectivity and scattering from Au-coated foilsHORNSTRUP, A; CHRISTENSEN, F. E; JESPERSEN, E et al.Optical engineering (Bellingham. Print). 1990, Vol 29, Num 7, pp 745-751, issn 0091-3286Article

Vergleichende Untersuchungen zur mechanischen und optischen Rauheitsmessung = Comparative examinations of mechanical and optical roughness measurementPAULMANN, R.Industrie-Anzeiger. 1986, Vol 108, Num 99, pp 34-35, issn 0019-9036Article

Determination of Hurst exponent by optical signal processing applied on surface roughness measurementsMARBAN SALGADO, José Antonio; SARMIENTO MARTINEZ, Oscar; MAYORGA CRUZ, Darwin et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7499, issn 0277-786X, isbn 978-0-8194-7810-8 0-8194-7810-5, 1Vol, 749909.1-749909.6Conference Paper