ct.\*:("Metrology, measurements and laboratory procedures")
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Metrology break-out group SPIE conferenceBENNETT, Marylyn; BANKE, Bill; LYONS, Kevin et al.SPIE proceedings series. 2002, pp 97-101, isbn 0-8194-4347-6, 5 p.Conference Paper
Nanometer-Scale metrology: Meeting the nanotechnology measurement challengesPOSTEK, Michael T.SPIE proceedings series. 2002, pp 102-111, isbn 0-8194-4347-6, 10 p.Conference Paper
Application comparison of NIR spectrometers: Fourier transform (FT) versus diode arraysBEUERMANN, Thomas; WITTWER, Robert; WOHLFARTH, Michael et al.GIT laboratory journal Europe. 2004, Vol 8, Num 6, pp 40-42, issn 1611-6038, 3 p.Article
The challenge of nanometrologyPOSTEK, Michael T.SPIE proceedings series. 2002, pp 84-96, isbn 0-8194-4347-6, 13 p.Conference Paper
Guide to NISTKAMMER, Raymond.NIST special publication. 1998, issn 1048-776X, 184 p., GUIDESerial Issue
Solid electrolytes and materials science researchCHANDRASEKHARAIAH, M. S; MARGRAVE, J. L.High temperature and materials science. 1995, Vol 33, Num 2/3, pp 231-237, issn 1080-1278Conference Paper
How to optimize spatial resolution in infrared microscopy & imagingNUNN, Simon.GIT laboratory journal Europe. 2004, Vol 8, Num 6, issn 1611-6038, p. 39Article
Standardisation: The future in NIRSEIDEL, Stefan.GIT laboratory journal Europe. 2004, Vol 8, Num 5, pp 22-23, issn 1611-6038, 2 p.Article
La métrologie au Brésil = Metrology in BrazilKINDUNDU, Christian.Technologies internationales (Strasbourg). 2003, Num 94, pp 3-6, issn 1165-8568, 4 p.Article
The critical role of metrology in nanotechnologySCHATTENBURG, Mark L; SMITH, Henry I.SPIE proceedings series. 2002, pp 116-124, isbn 0-8194-4347-6, 9 p.Conference Paper
A fast algorithm for determining the Gaussian filtered mean line in surface metrologyYUAN, Y.-B; QIANG, X.-F; SONG, J.-F et al.Precision engineering. 2000, Vol 24, Num 1, pp 62-69, issn 0141-6359Article
Calibration of micropipettes for pressure-probe studiesMURPHY, R; ORTEGA, J. K. E.Australian journal of plant physiology. 1998, Vol 25, Num 8, pp 947-951, issn 0310-7841Article
Rôle du porte-échantillon lors de mesures en cavité hyperfréquence (bande X) = Accounting for the sample holder when performing microwave cavity measurements (X band)JOUFFROY, M.Annales scientifiques de l'Université de Franche-Comté. Physique. 1995, Num 11, pp 23-34, issn 1162-9592Article
Centro SIT 28/M ENEA-CR faenzaTIMPANARO, Marcello.Energia, ambiente e innovazione. 2006, Vol 52, Num 5, pp 51-57, issn 1124-0016, 7 p.Article
Combined virtual and physical hardware performance analysisLEISS, David.sans titre. 2002, pp 551-562, isbn 0-7803-7441-X, 12 p.Conference Paper
Missile test confidence via test systems certification and associated data analysisMAUPIN, David L.sans titre. 2002, pp 687-702, isbn 0-7803-7441-X, 16 p.Conference Paper
Proposed new techniques for: (i) the indication of the level of liquids; (ii) the measurement of strainMAHAJAN, A. S.Journal of materials processing technology. 1994, Vol 40, Num 1-2, pp 239-242, issn 0924-0136Article
A device for measuring the magnetic properties of ring specimens at high frequenciesBIRKFELD, M; HEMPEL, K. A.Journal of magnetism and magnetic materials. 1994, Vol 133, Num 1-3, pp 393-395, issn 0304-8853Conference Paper
Study of horizontal-type single sheet testersNAKATA, T; TAKAHASHI, N; FUJIWARA, K et al.Journal of magnetism and magnetic materials. 1994, Vol 133, Num 1-3, pp 416-418, issn 0304-8853Conference Paper
Multimètres physico-chimique: ils savent tout faire ou presque… = Physical and chemical multimeter: they know how for all or nearly all…MIZIER, M.-O.Mesures (1983). 1989, Num 603, pp 53-57, issn 0755-219XArticle
Angular-resolved ion-bean sputtering apparatus for large-area depositionMOTOHIRO, T; YAMADENA, H; TAGA, Y et al.Review of scientific instruments. 1989, Vol 60, Num 8, pp 2657-2665, issn 0034-6748Article
Measurements of the atomic nitrogen population produced by a microwave electron cyclotron resonance plasmaMEIKLE, S; HATANAKA, Y.Applied physics letters. 1989, Vol 54, Num 17, pp 1648-1649, issn 0003-6951, 2 p.Article
A new accurate interatomic potential for helium and its application to the second virial coefficientsAZIZ, R. A; JANZEN, A. R.Metrologia. 1988, Vol 25, Num 1, pp 57-58, issn 0026-1394Article
L'image instrument de mesure, Gif-sur-Yvette, 9 mars 1988 = Image as measurement instrument. Gif-sur-Yvette, March 9, 1988L'image instrument de mesure. Journée d'études. 1988, 66 p.Conference Proceedings
Compound modulated scatterer measuring systemHAJNAL, J. V.IEE proceedings. Part H. Microwaves, antennas and propagation. 1987, Vol 134, Num 4, pp 350-356, issn 0950-107XArticle