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Results 1 to 25 of 9074

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The basic principles of sieve analysisGIT laboratory journal Europe. 2005, Vol 9, Num 1, pp 16-19, issn 1611-6038, 4 p.Article

Metrology in Chemistry: considerations, approaches and developments on the applicability of methods of 'higher order' : Fundamental metrologyLAVAL, Guy.Comptes rendus. Physique. 2004, Vol 5, Num 8, pp 907-920, issn 1631-0705, 14 p.Article

Solutions in all dimensionsGUNST, Stefan; KUHNE, Michael.GIT laboratory journal Europe. 2004, Vol 8, Num 5, pp 12-13, issn 1611-6038, 2 p.Article

Laser power-meter employing neutral density filtersDUARTE, M; VIEIRA, M. M. F.Optics and lasers in engineering. 1997, Vol 28, Num 6, pp 481-484, issn 0143-8166Article

Metrology break-out group SPIE conferenceBENNETT, Marylyn; BANKE, Bill; LYONS, Kevin et al.SPIE proceedings series. 2002, pp 97-101, isbn 0-8194-4347-6, 5 p.Conference Paper

Nanometer-Scale metrology: Meeting the nanotechnology measurement challengesPOSTEK, Michael T.SPIE proceedings series. 2002, pp 102-111, isbn 0-8194-4347-6, 10 p.Conference Paper

Microscopy and image analysis unlock the fine detail in particle size analysisRIDEAL, Graham.GIT laboratory journal Europe. 2005, Vol 9, Num 1, pp 12-15, issn 1611-6038, 3 p.Article

Mesurer les sensations pour concevoir des produits attrayants = Measuring sensations toURSO, P.Technologies internationales (Strasbourg). 1997, Num 31, pp 36-39, issn 1165-8568Article

Application comparison of NIR spectrometers: Fourier transform (FT) versus diode arraysBEUERMANN, Thomas; WITTWER, Robert; WOHLFARTH, Michael et al.GIT laboratory journal Europe. 2004, Vol 8, Num 6, pp 40-42, issn 1611-6038, 3 p.Article

The challenge of nanometrologyPOSTEK, Michael T.SPIE proceedings series. 2002, pp 84-96, isbn 0-8194-4347-6, 13 p.Conference Paper

Guide to NISTKAMMER, Raymond.NIST special publication. 1998, issn 1048-776X, 184 p., GUIDESerial Issue

Solid electrolytes and materials science researchCHANDRASEKHARAIAH, M. S; MARGRAVE, J. L.High temperature and materials science. 1995, Vol 33, Num 2/3, pp 231-237, issn 1080-1278Conference Paper

How to optimize spatial resolution in infrared microscopy & imagingNUNN, Simon.GIT laboratory journal Europe. 2004, Vol 8, Num 6, issn 1611-6038, p. 39Article

Standardisation: The future in NIRSEIDEL, Stefan.GIT laboratory journal Europe. 2004, Vol 8, Num 5, pp 22-23, issn 1611-6038, 2 p.Article

La métrologie au Brésil = Metrology in BrazilKINDUNDU, Christian.Technologies internationales (Strasbourg). 2003, Num 94, pp 3-6, issn 1165-8568, 4 p.Article

The critical role of metrology in nanotechnologySCHATTENBURG, Mark L; SMITH, Henry I.SPIE proceedings series. 2002, pp 116-124, isbn 0-8194-4347-6, 9 p.Conference Paper

A fast algorithm for determining the Gaussian filtered mean line in surface metrologyYUAN, Y.-B; QIANG, X.-F; SONG, J.-F et al.Precision engineering. 2000, Vol 24, Num 1, pp 62-69, issn 0141-6359Article

Calibration of micropipettes for pressure-probe studiesMURPHY, R; ORTEGA, J. K. E.Australian journal of plant physiology. 1998, Vol 25, Num 8, pp 947-951, issn 0310-7841Article

Rôle du porte-échantillon lors de mesures en cavité hyperfréquence (bande X) = Accounting for the sample holder when performing microwave cavity measurements (X band)JOUFFROY, M.Annales scientifiques de l'Université de Franche-Comté. Physique. 1995, Num 11, pp 23-34, issn 1162-9592Article

Microscopy in the UKWAITE, John; ASWANI, Kavita.GIT laboratory journal Europe. 2005, Vol 9, Num 2, pp 40-41, issn 1611-6038, 2 p.Article

Variability in the performance of MIL-STD-810 sand testingJACOBY, Keith T.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 137-146, issn 0277-786X, isbn 0-8194-5771-X, 1Vol, 10 p.Conference Paper

CASS upgrade COSSI: A systematic approach to incorporating NxTest technology into legacy military ateORLET, James L; MURDOCK, Gerald L.sans titre. 2002, pp 49-57, isbn 0-7803-7441-X, 9 p.Conference Paper

Evaluation of economics of testing in a manufacturing environmentCURRY, Robert J.sans titre. 2002, pp 481-489, isbn 0-7803-7441-X, 9 p.Conference Paper

A design pattern to encapsulate measurement uncertainty in reusable instrumentation modulesHALL, B. D.sans titre. 2002, pp 678-686, isbn 0-7803-7441-X, 9 p.Conference Paper

A broad-band method for measuring the complex permeability of thin soft magnetic filmsFESSANT, A; GIERALTOWSKI, J; LOAEC, J et al.Journal of magnetism and magnetic materials. 1994, Vol 133, Num 1-3, pp 413-415, issn 0304-8853Conference Paper

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