Dislocation modeling for the microelectronics industrySCHWARZ, K. W; CHIDAMBARRAO, D.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 400-01, pp 435-438, issn 0921-5093, 4 p.Conference Paper

Analysis of a platform for thermal management studies of microelectronics cooling methodsTIGNER, Julaunica; SEDEH, Mahmoud Moeini; SHARPE, Trena et al.Applied thermal engineering. 2013, Vol 60, Num 1-2, pp 88-95, issn 1359-4311, 8 p.Article

International Conference on Microelectronics (ICM 2004)MOHAMED IBRAHIM EL MASRY; MASMOUDI, Mohamed.Microelectronics journal. 2006, Vol 37, Num 11, pp 1188-1260, issn 0959-8324, 72 p.Conference Paper

2004 24th internationcal conference on microelectronics (Nis, Serbia and Montenegro, 16-19 May 20)International conference on microelectronics. 2004, isbn 0-7803-8166-1, 2Vol, XXIII-802 p, isbn 0-7803-8166-1Conference Proceedings

Microelectronic system reliability predictionÓCONNOR, P. D. T.IEEE transactions on reliability. 1983, Vol 32, Num 1, pp 9-13, issn 0018-9529Article

International Conference on Materials for Microelectronics and Nanoengineering (MFMN2006)MCNALLY, Patrick.Journal of materials science. Materials in electronics. 2008, Vol 19, Num 4, issn 0957-4522, 301―318 [17 p.]Conference Paper

Entwicklung der Mikroelektronik und ihr Einfluss auf die Gerätetechnik = Développement de la microélectronique et son influence sur l'appareillage = Development of the microelectronics and its effect on the equipmentKÖSTNER, R; RETTELBUSH, L; KÖSTER, G et al.Nachrichtentechnik. Elektronik. 1985, Num 9, pp 322-327, issn 0323-4657Article

A-SiC: H low-k deposition as copper diffusion barrier layer in advanced microelectronic interconnectionsCHARLES-ALFRED, C; JOUSSEAUME, V.Surface & coatings technology. 2007, Vol 201, Num 22-23, pp 9260-9263, issn 0257-8972, 4 p.Conference Paper

Design of quantum filters with pre-determined reflection and transmission propertiesSOFIANOS, S. A; RAMPHO, G. J; AZEMTSA DONFACK, H et al.Microelectronics journal. 2007, Vol 38, Num 2, pp 235-244, issn 0959-8324, 10 p.Article

System-in-package technologies for photonicsTEKIN, Tolga.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7605, issn 0277-786X, isbn 0-8194-8001-0 978-0-8194-8001-9, 1Vol, 760506.1-760506.12Conference Paper

European Micro and Nano SystemsMicroelectronics journal. 2005, Vol 36, Num 7, issn 0959-8324, 75 p.Conference Proceedings

ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures (Cork, 4-11 April 2002)2002 international conference on microelectronic test structures. 2002, isbn 0-7803-7464-9, X, 254 p, isbn 0-7803-7464-9Conference Proceedings

14TH Workshop on dielectrics in microelectronics (WoDiM 2006)LOMBARDO, Salvatore.Microelectronics and reliability. 2007, Vol 47, Num 4-5, issn 0026-2714, 362 p.Conference Proceedings

Technologische Ausrüstungen der Mikroelektronik-Montage = Equipements technologiques du montage de la microélectronique = Technological equipment for microelectronics and assemblyBARTSCH, P.Wissenschaftliche Zeitschrift der Technischen Universität Dresden. 1983, Vol 32, Num 3, pp 29-34, issn 0043-6925Article

VOLKSWIRTSCHAFTLICHE BEDEUTUNG UND EFFEKTE DER MIKROELEKTRONIK = IMPORTANCE ET EFFETS DE LA MICROELECTRONIQUE EN ECONOMIE POLITIQUEHAUPT E; STERNAGEL M.1980; NACHRICHTENTECH., ELEKTRON.; ISSN 0323-4657; DDR; DA. 1980; VOL. 30; NO 12; PP. 488-491; ABS. RUS/ENG/FRE; BIBL. 7 REF.Article

Advanced topics in optoelectronics, microelectronics, and nanotechnologies V (26-29 August 2010, Constanta, Romania)Schiopu, Paul; Caruntu, George.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7821, issn 0277-786X, isbn 978-0-8194-8330-0, 1 vol, isbn 978-0-8194-8330-0Conference Proceedings

Fatigue of advanced materialsSOBOYEJO, W. O; DAUSKARDT, R; RITCHIE, R. O et al.Mechanics of materials. 2004, Vol 36, Num 1-2, issn 0167-6636, 198 p.Conference Proceedings

Yugoslavia in the global microelectronics worldPENN, M. G.International conference on microelectronic. 1997, pp 3-10, isbn 0-7803-3664-X, 2VolConference Paper

Zuverlässigkeit und Fehlertoleranz in der Mikroelektronik = Fiabilité et tolérance de défauts dans la microélectronique = Reliability and error tolerance in microelectroniqueBEMMANN, H.-B.Nachrichtentechnik. Elektronik. 1985, Vol 35, Num 2, pp 75-77, issn 0323-4657Article

La spintronique = SpintronicsAWSCHALOM, D; FLATTE, M; SAMARTH, N et al.Pour la science. 2002, Num 299, pp 44-52, issn 0153-4092Article

Modulare Entwicklung : Anforderungen an Mikroelektronik und Software in der Telekommunikation = Modular developmentKRAUTKRÄMER, W; STRUGALA, M; STAMEN, F.-J et al.F & M. Feinwerktechnik, Mikrotechnik, Messtechnik. 1997, Vol 105, Num 1-2, pp 26-31, issn 0944-1018, 5 p.Article

Einsatz der Mikroelektronik im Maschinenbau, dargestellt an ausgewählten Beispielen der Baumaschinen-, Förder- und WalzwerkstechnikPRUSSEIT, P; ECKARDT, G; BECKER, H et al.Wissenschaftliche Zeitschrift der Technischen Hochschule Otto von Guericke Magdeburg. 1989, Vol 33, Num 4, pp 97-104, issn 0541-8933, 8 p.Article

Entwicklungstrends der Mikroelektronik und Informationstechnik = Tendances des développements de la microélectronique et des techniques de l'information = Development trends of microelectronics and information technologyFÄRBER, G.Automatisierungstechnische Praxis. 1986, Vol 28, Num 9, pp 411-422, issn 0178-2320Article

Bericht/Mikroelektronik in der Automatisierungstechnik, Tagung, Baden-Baden, 24. und 25. April 1985 = La microélectronique dans la technologie de l'automatisation, rapport de conférence = Micro-electronics in automation technology. A conference reportHENSEL, H; MÄNCHER, H; JONAS, M et al.Automatisierungstechnische Praxis. 1985, Vol 27, Num 9, pp 405-413, issn 0178-2320Conference Proceedings

La microelettronica e l'informatica nella didattica = Microélectrique et informatique dans l'éducation = Microelectronics and computer science in educationCICCARELLA, G; DI FONSO, M.Elettronica e telecomunicazioni. 1984, Vol 33, Num 1, pp 31-33, issn 0013-6123Article