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Results 1 to 25 of 39809

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Dislocation modeling for the microelectronics industrySCHWARZ, K. W; CHIDAMBARRAO, D.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 400-01, pp 435-438, issn 0921-5093, 4 p.Conference Paper

Analysis of a platform for thermal management studies of microelectronics cooling methodsTIGNER, Julaunica; SEDEH, Mahmoud Moeini; SHARPE, Trena et al.Applied thermal engineering. 2013, Vol 60, Num 1-2, pp 88-95, issn 1359-4311, 8 p.Article

Pioneering and continuing contributions to the semiconductor industry. The Franklin Institute's 2002 Bower Award for business leadership presented to Gordon E. MooreJournal of the Franklin Institute. 2003, Vol 340, Num 3-4, pp 243-247, issn 0016-0032, 5 p.Article

International Conference on Microelectronics (ICM 2004)MOHAMED IBRAHIM EL MASRY; MASMOUDI, Mohamed.Microelectronics journal. 2006, Vol 37, Num 11, pp 1188-1260, issn 0959-8324, 72 p.Conference Paper

Reliability prediction for microelectronic systemsO'CONNOR, P. D. T; HEAD, M. G; JOY, M et al.Reliability engineering. 1985, Vol 10, Num 3, pp 129-140, issn 0143-8174Article

2004 24th internationcal conference on microelectronics (Nis, Serbia and Montenegro, 16-19 May 20)International conference on microelectronics. 2004, isbn 0-7803-8166-1, 2Vol, XXIII-802 p, isbn 0-7803-8166-1Conference Proceedings

Microelectronic system reliability predictionÓCONNOR, P. D. T.IEEE transactions on reliability. 1983, Vol 32, Num 1, pp 9-13, issn 0018-9529Article

International Conference on Materials for Microelectronics and Nanoengineering (MFMN2006)MCNALLY, Patrick.Journal of materials science. Materials in electronics. 2008, Vol 19, Num 4, issn 0957-4522, 301―318 [17 p.]Conference Paper

Toward the domestication of microelectronicsBIRNBAUM, J. S.Communications of the ACM. 1985, Vol 28, Num 11, pp 1225-1235, issn 0001-0782Article

Entwicklung der Mikroelektronik und ihr Einfluss auf die Gerätetechnik = Développement de la microélectronique et son influence sur l'appareillage = Development of the microelectronics and its effect on the equipmentKÖSTNER, R; RETTELBUSH, L; KÖSTER, G et al.Nachrichtentechnik. Elektronik. 1985, Num 9, pp 322-327, issn 0323-4657Article

Perspektiven der Mikroelektronikanwendung in BaumaschinenPOPPY, W.Konstruktion (1981). 1991, Vol 43, Num 12, pp 437-442, issn 0720-5953Article

A-SiC: H low-k deposition as copper diffusion barrier layer in advanced microelectronic interconnectionsCHARLES-ALFRED, C; JOUSSEAUME, V.Surface & coatings technology. 2007, Vol 201, Num 22-23, pp 9260-9263, issn 0257-8972, 4 p.Conference Paper

Design of quantum filters with pre-determined reflection and transmission propertiesSOFIANOS, S. A; RAMPHO, G. J; AZEMTSA DONFACK, H et al.Microelectronics journal. 2007, Vol 38, Num 2, pp 235-244, issn 0959-8324, 10 p.Article

System-in-package technologies for photonicsTEKIN, Tolga.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7605, issn 0277-786X, isbn 0-8194-8001-0 978-0-8194-8001-9, 1Vol, 760506.1-760506.12Conference Paper

European Micro and Nano SystemsMicroelectronics journal. 2005, Vol 36, Num 7, issn 0959-8324, 75 p.Conference Proceedings

ICMTS 2002 : proceedings of the 2002 international conference on microelectronic test structures (Cork, 4-11 April 2002)2002 international conference on microelectronic test structures. 2002, isbn 0-7803-7464-9, X, 254 p, isbn 0-7803-7464-9Conference Proceedings

14TH Workshop on dielectrics in microelectronics (WoDiM 2006)LOMBARDO, Salvatore.Microelectronics and reliability. 2007, Vol 47, Num 4-5, issn 0026-2714, 362 p.Conference Proceedings

Technologische Ausrüstungen der Mikroelektronik-Montage = Equipements technologiques du montage de la microélectronique = Technological equipment for microelectronics and assemblyBARTSCH, P.Wissenschaftliche Zeitschrift der Technischen Universität Dresden. 1983, Vol 32, Num 3, pp 29-34, issn 0043-6925Article

VOLKSWIRTSCHAFTLICHE BEDEUTUNG UND EFFEKTE DER MIKROELEKTRONIK = IMPORTANCE ET EFFETS DE LA MICROELECTRONIQUE EN ECONOMIE POLITIQUEHAUPT E; STERNAGEL M.1980; NACHRICHTENTECH., ELEKTRON.; ISSN 0323-4657; DDR; DA. 1980; VOL. 30; NO 12; PP. 488-491; ABS. RUS/ENG/FRE; BIBL. 7 REF.Article

Advanced topics in optoelectronics, microelectronics, and nanotechnologies V (26-29 August 2010, Constanta, Romania)Schiopu, Paul; Caruntu, George.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7821, issn 0277-786X, isbn 978-0-8194-8330-0, 1 vol, isbn 978-0-8194-8330-0Conference Proceedings

Fatigue of advanced materialsSOBOYEJO, W. O; DAUSKARDT, R; RITCHIE, R. O et al.Mechanics of materials. 2004, Vol 36, Num 1-2, issn 0167-6636, 198 p.Conference Proceedings

Yugoslavia in the global microelectronics worldPENN, M. G.International conference on microelectronic. 1997, pp 3-10, isbn 0-7803-3664-X, 2VolConference Paper

Zuverlässigkeit und Fehlertoleranz in der Mikroelektronik = Fiabilité et tolérance de défauts dans la microélectronique = Reliability and error tolerance in microelectroniqueBEMMANN, H.-B.Nachrichtentechnik. Elektronik. 1985, Vol 35, Num 2, pp 75-77, issn 0323-4657Article

Equipment maintenance focus in defect density improvements IBM microelectronics, burlington, vermontBILODEAU, Matthew P; DELIBAC, W. David.IEEE / SEMI advanced semiconductor manufacturing conference. 2004, pp 22-26, isbn 0-7803-8312-5, 1Vol, 5 p.Conference Paper

Recherche et technologie en microélectronique = Research and technology in microelectronicsDANNEELS, J; RAHIER, M; MOZER, A et al.Revue des Télécommunications. 1988, Vol 62, Num 3-4, pp 352-361, issn 0373-8582Article

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