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Results 1 to 25 of 163654

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A method for the examination of the same cell using light, scanning and transmission electron microscopySLATER, M.Biotechnic & histochemistry. 1991, Vol 1, Num 2, pp 63-68Article

Développement d'un microscope électronique analytique de ultra haute résolution à 300 kV = 300 kV ultra high resolution analytical electron microscope developmentARAI, Y; FUKUSHIMA, K; KOKUBO, Y et al.Spectra 2000. 1991, Vol 19, Num 160, pp 55-58, issn 0399-1172Article

Application of the imaging plate to TEM observationAYATO, H; MORI, N; MIYAHARA, J et al.Journal of electron microscopy. 1990, Vol 39, Num 6, pp 444-448, issn 0022-0744Article

Moncontact high-speed waveform measurements with the picosecond photoelectron scanning electron microscopeMAY, P. G; HALBOUT, J.-M; CHIU, G. L.-T et al.IEEE journal of quantum electronics. 1988, Vol 24, Num 2, pp 234-239, issn 0018-9197Article

Structure and properties of interfaces. WorkshopSMITH, David J; CARPENTER, R. W.Ultramicroscopy. 1992, Vol 40, Num 3, issn 0304-3991Conference Proceedings

Scan system for the sextupole-corrected scanning transmission electron microscopyRUAN, S; KAPP, O. H.Review of scientific instruments. 1992, Vol 63, Num 9, pp 4066-4070, issn 0034-6748Article

Review and outline of environmental SEM at presentDANILATOS, G. D.Journal of microscopy (Print). 1991, Vol 162, pp 391-402, issn 0022-2720, 3Article

A novel technique for voltage measurements of the passivation layer in SEMKODAMA, T; IKEDA, S; UCHIKAWA, Y et al.Journal of electron microscopy. 1989, Vol 38, Num 1, pp 6-15, issn 0022-0744, 10 p.Article

Optical calibration of a submicrometer magnification standardGEIST, J; BELZER, B; MILLER, M. L et al.Journal of research of the National Institute of Standards and Technology. 1992, Vol 97, Num 2, pp 267-272, issn 1044-677XArticle

Energy-filtered convergent-beam electron diffraction in STEMPEIRONG XU; LOANE, R. F; SILCOX, J et al.Ultramicroscopy. 1991, Vol 38, Num 2, pp 127-133, issn 0304-3991Article

Utilization of STEM nanodiffraction dataKONNERT, J; D'ANTONIO, P.Ultramicroscopy. 1991, Vol 38, Num 2, pp 169-179, issn 0304-3991Article

Annual conference of the Netherlands Society of Electron Microscopy: abstracts of papers, Kerkrade, 30 November-2 December 1988Ultramicroscopy. 1989, Vol 27, Num 2, issn 0304-3991Conference Proceedings

A procedure for making phosphor viewing screens for the transmission electron microscopeMURRAY VERNON KING.Journal of electron microscopy technique. 1988, Vol 8, Num 4, pp 389-390, issn 0741-0581Article

Instrumentation, techniques, and applications of electron microscopy in the solid state physics group at Glasgow universityCRAVEN, A. J; MCVITIE, S; CHAPMAN, J. N et al.Microscopy research and technique. 1993, Vol 24, Num 4, pp 316-332, issn 1059-910XArticle

Proceedings/1 st. Conference on frontiers of electron microscopy in materials science, Argonne IL, USA, 20-23 April 1986BRADLEY, S. A; KING, W. E.Ultramicroscopy. 1987, Vol 22, Num 1-4, issn 0304-3991, X-329 pConference Proceedings

Thermophoretic Coating with Molybdenum Oxide NanoparticlesBOSKOVIC, Lucija; AGRANOVSKI, Igor E.Chemical engineering & technology. 2012, Vol 35, Num 9, pp 1583-1587, issn 0930-7516, 5 p.Article

Determination of microstructural parameters of random spatial surface fractals by measuring chord length distributionsHERMANN, H; OHSER, J.Journal of microscopy (Print). 1993, Vol 170, pp 87-93, issn 0022-2720, 1Article

On high-resolution transmission electron microscopy in an unstable magnetic environmentLUZZI, D. E.Journal of electron microscopy technique. 1990, Vol 15, Num 4, pp 406-413, issn 0741-0581, 8 p.Article

On the resolution of the low-energy electron reflection microscope based on wave electron opticsZHIFENG SHAO; CREWE, A. V.Ultramicroscopy. 1989, Vol 31, Num 2, pp 199-203, issn 0304-3991Article

VG microscopes' ultra-high resolution lensMULVEY, T.TIZ-Fachberichte. 1989, Vol 113, Num 10, pp 800-801, issn 0170-0146Article

Surface imaging techniques and magnetic materialsSPENCE, J. C. H.Materials science & engineering. B, Solid-state materials for advanced technology. 1989, Vol 3, Num 4, pp 421-425, issn 0921-5107, 5 p.Article

Scaling low of voltage contrast in scanning electron microscopeURA, K.Journal of electron microscopy. 1988, Vol 37, Num 2, pp 54-57, issn 0022-0744Article

Use of sputter coating to prepare whole mounts of cytoskeletons for transmission and high-resolution scanning and scanning transmission electron microscopyBELL, P. B. JR; LINDROTH, M; FREDRIKSSON, B.-A et al.Journal of electron microscopy technique. 1987, Vol 7, Num 3, pp 149-159, issn 0741-0581Article

Quelques aspects de la microscopie électronique à haute tension = Some aspects of the high-voltage electron microscopyJOUFFREY, B; TRINQUIER, J.Journal de microscopie et de spectroscopie électroniques. 1987, Vol 12, Num 6, pp 513-530, issn 0395-9279Article

Investigation of STM image artifacts by in-situ reflection electron microscopyLO, W. K; SPENCE, J. C. H.Ultramicroscopy. 1993, Vol 48, Num 4, pp 433-444, issn 0304-3991Article

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