Pascal and Francis Bibliographic Databases


Search results

Your search

kw.\*:("Microscopía electrónica barrido")


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 80946

  • Page / 3238

Selection :

  • and

Use, applications and value of stereo-EBIC imagingVALDRE, U; BERGONZONI, A; MERLI, M et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 366-381, issn 0304-3991Article

Discriminating between atomic number and topographic contrast using a wide-angle backscattered electron detector in scanning electron microscopyROBINSON, V. N. E.Journal of electron microscopy. 1989, Vol 38, Num 5, pp 389-393, issn 0022-0744, 5 p.Article

Microstructure isolation testing using a scanning electron mecroscopeMAHANT-SHETTI, S. S; ATON, T. J; GALE, R. J et al.Applied physics letters. 1990, Vol 56, Num 23, pp 2310-2312, issn 0003-6951Article

The STM learning curve and where it may take usDEMUTH, J. E; KOEHLER, U; HAMERS, R. J et al.Journal of microscopy (Print). 1988, Vol 152, Num 2, pp 299-316, issn 0022-2720Article

Practical advantages of a cascade diffusion pump system of a scanning electron microscopeNORIOKA, S; YOSHIMURA, N.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1991, Vol 9, Num 4, pp 2384-2388, issn 0734-2101Article

La microscopie électronique à balayage = Scanning electron microscopyBLANCHARD, M.Revue pratique de contrôle industriel (1984). 1990, Vol 29, Num 162, pp 78-80, issn 0766-5210, 3 p.Article

Scanning Electron Microscopy of Fe79.5B6.5C14 Network Alloys: Part ICHOW, W. H; LEUNG, C. C; YIP, Y. L et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2013, Vol 44, Num 8, pp 3532-3543, issn 1073-5623, 12 p.Article

Conditions required for detection of specimen-specific SE-I secondary electrons in an analytical SEMAPKARIAN, R. P.Journal of microscopy (Print). 1989, Vol 154, Num 2, pp 177-188, issn 0022-2720, 12 p.Article

Biologie et microscopie à balayage = Biology and scanning electron microscopyCOUTE, Alain.Revue française d'histotechnologie (Amboise). 2005, Vol 18, Num 1, pp 111-127, issn 0997-6434, 17 p.Article

Energy-filtered convergent-beam electron diffraction in STEMPEIRONG XU; LOANE, R. F; SILCOX, J et al.Ultramicroscopy. 1991, Vol 38, Num 2, pp 127-133, issn 0304-3991Article

Characteristics of YAG single crystals for electron scintillators of STEMHIBINO, M; IRIE, K; AUTRATA, R et al.Journal of electron microscopy. 1992, Vol 41, Num 6, pp 453-457, issn 0022-0744Article

Utilization of STEM nanodiffraction dataKONNERT, J; D'ANTONIO, P.Ultramicroscopy. 1991, Vol 38, Num 2, pp 169-179, issn 0304-3991Article

Surface studies in UHV SEM and STEMMILNE, R. H; HEMBREE, G. G; DRUCKER, J. S et al.Journal of microscopy (Print). 1993, Vol 170, pp 193-199, issn 0022-2720, 3Article

Role of ammonium nitrate in morphological differentiation of Aspergillus niger in a submerged cultureJOUNG, J. J; BLASKOVITZ, R. J.Developments in industrial microbiology. 1984, Vol 26, pp 487-494, issn 0070-4563Conference Paper

Alginate lyase-secreting bacteria associated with the algal genus SargassumPRESTON, J. F. III; ROMEO, T; BROMLEY, J. C et al.Developments in industrial microbiology. 1984, Vol 26, pp 727-740, issn 0070-4563Conference Paper

Scanning Electron Microscopy Measurements of the Surface Roughness of PaperBANERJEE, Sujit; YANG, Rallming; COURCHENE, Charles E et al.Industrial & engineering chemistry research. 2009, Vol 48, Num 9, pp 4322-4325, issn 0888-5885, 4 p.Article

A study on heat source modeling of scanning electron microscopy modified for material processingHWANG, Il-Han; NA, Suck-Joo.Metallurgical and materials transactions. B, Process metallurgy and materials processing science. 2005, Vol 36, Num 1, pp 133-139, issn 1073-5615, 7 p.Article

Theoretical calculation of probe size of low-voltage scanning electron microscopesXIMEN, J; SHAO, Z; LIN, P. S. D et al.Journal of microscopy (Print). 1993, Vol 170, pp 119-124, issn 0022-2720, 2Article

Basic technique for preparation of down for examination with the scanning electron microscopeLAYBOURNE, R. C; SABO, B. A; MORNINGSTAR, A et al.The Auk. 1992, Vol 109, Num 1, pp 195-197, issn 0004-8038Article

Two-dimensional demonstration of Wigner phase-retrieval microscopy in the STEM configurationMCCALLUM, B. C; RODENBURG, J. M.Ultramicroscopy. 1992, Vol 45, Num 3-4, pp 371-380, issn 0304-3991Article

Growing and in-situ processing of cells on beem capsule caps for scanning electron microscopyBERNARD, E. F; HASE, T.Scanning microscopy. 1991, Vol 5, Num 2, pp 595-599, issn 0891-7035Article

Utilisation de la technique de microscopie électronique à balayage en cytopathologie gynécologique = Scanning electron microscopy in gynecologic cytopathologyMAILLET, M; CHIARASINI, D; COPIN, H et al.Revue française d'histotechnologie (Amboise). 1991, Vol 4, Num 1, pp 45-51, issn 0997-6434Article

Liquid helium cooled sampled stage for the investigation of microwave irradiated samples by scanning electron microscopyDODERER, T; WENER, H.-G; MOECK, R et al.Cryogenics (Guildford). 1990, Vol 30, Num 1, pp 65-67, issn 0011-2275, 3 p.Article

Scanning electron microscopy observations of insulation cork agglomeratesPEREIRA, H; FERREIRA, E.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 1989, Vol 111, pp 217-225, issn 0921-5093Article

Electrochemical and SEM characterization of NiTi alloy coated with chitosan by PLD techniqueMARECI, D; CIMPOESU, N; POPA, M. I et al.Materials and corrosion (1995). 2012, Vol 63, Num 11, pp 985-991, issn 0947-5117, 7 p.Article

  • Page / 3238