A configurable angle-resolving detector system in STEMDABERKOW, I; HERRMANN, K.-H; LENZ, F et al.Ultramicroscopy. 1993, Vol 50, Num 1, pp 75-82, issn 0304-3991Article

Tip alignment system in a sextupole-corrected scanning transmission electron microscopeSHENGYANG RUAN; KAPP, O. H.Review of scientific instruments. 1993, Vol 64, Num 3, pp 667-671, issn 0034-6748Article

Error analysis of crystalline ptychography in the STEM modeMCCALLUM, B. C; RODENBURG, J. M.Ultramicroscopy. 1993, Vol 52, Num 1, pp 85-99, issn 0304-3991Article

Resolution limits in annular dark field STEMSILCOX, J; XU, P; LOANE, R. F et al.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 173-186, issn 0304-3991Conference Paper

An automatic field-emission tip conditioning systemRUAN, S; KAPP, O. H.Review of scientific instruments. 1992, Vol 63, Num 9, pp 4056-4060, issn 0034-6748Article

Scan system for the sextupole-corrected scanning transmission electron microscopyRUAN, S; KAPP, O. H.Review of scientific instruments. 1992, Vol 63, Num 9, pp 4066-4070, issn 0034-6748Article

Dedicated image analysis techniques for three-dimensional reconstruction from serial sections in electron microscopyGREMILLET, P; JOURLIN, M; BRON, C et al.Machine vision and applications. 1991, Vol 4, Num 4, pp 263-270, issn 0932-8092Article

Annular dark-field imaging : resolution and thickness effectsHILLYARD, S; LOANE, R. F; SILCOX, J et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 14-25, issn 0304-3991Article

Nanometer-resolution scanning Auger electron microscopyHEMBREE, G. G; VENABLES, J. A.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 109-120, issn 0304-3991Conference Paper

Configured detectors for STEM imaging of thin specimensCOWLEY, J. M.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 4-13, issn 0304-3991Article

STEM imaging of monatomic surface steps and emergent dislocationsMILNE, R. H.Journal of microscopy (Print). 1989, Vol 153, pp 23-30, issn 0022-2720, 8 p., 1Article

Resolution and optimum conditions for dark-field STEM and CTEM imagingHAMMEL, M; ROSE, H.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 81-86, issn 0304-3991Article

Incoherent imaging of zone axis crystals with ADF STEMLOANE, R. F; PEIRONG XU; SILCOX, J et al.Ultramicroscopy. 1992, Vol 40, Num 2, pp 121-138, issn 0304-3991Article

Theory of phase correlations in localized inelastic electron diffraction and imagingWANG, Z. L; BENTLEY, J.Ultramicroscopy. 1991, Vol 38, Num 2, pp 181-213, issn 0304-3991Article

Defocus determination in the STEM by phase contrast methodsHAMMEL, M; COLLIEX, C; MORY, C et al.Ultramicroscopy. 1990, Vol 34, Num 4, pp 257-269, issn 0304-3991Article

Compton-scattering X-ray artefacts observed in an STEM with high take-off angle EDS detectorWILSON, A. R; LAMBRIANIDIS, L. T.Journal of microscopy (Print). 1990, Vol 160, pp 1-7, issn 0022-2720, 1Article

VG microscopes' ultra-high resolution LensMULVEY, T.Sprechsaal (1976). 1989, Vol 122, Num 11, pp 1041-1042, issn 0341-0676Article

The microprocessor-controlled CM12/STEM scanning-transmission electron microscopeGROSS, U; MESCHER, F. J. M; TEIMEIJER, J. C et al.Philips technical review. 1987, Vol 43, Num 10, pp 273-291, issn 0031-7926Article

Measurement of spherical aberration in STEMWONG, K; KIRKLAND, E; PEIRONG XU et al.Ultramicroscopy. 1992, Vol 40, Num 2, pp 139-150, issn 0304-3991Article

Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxidesMACLAREN, Ian; RAMASSE, Quentin M.International materials reviews. 2014, Vol 59, Num 3, pp 115-131, issn 0950-6608, 17 p.Article

Inelastic scattering probabilities in scanning transmission electron microscopyRITCHIE, R. H.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1988, Vol 58, Num 5, pp 753-767, issn 0141-8610Article

Carbons with narrow pore size distribution prepared by simultaneous carbonization and self-activation of tobacco stems and their application to supercapacitorsKLESZYK, P; RATAJCZAK, P; SKOWRON, P et al.Carbon (New York, NY). 2015, Vol 81, pp 148-157, issn 0008-6223, 10 p.Article

Experimental tests on double-resolution coherent imaging via STEMRODENBURG, J. M; MCCALLUM, B. C; NELLIST, P. D et al.Ultramicroscopy. 1993, Vol 48, Num 3, pp 304-314, issn 0304-3991Article

Development of an ultrahigh vacuum high resolution scanning transmission electron microscopeHARADA, Y; TOMITA, T; KOKUBO, Y et al.Journal of electron microscopy. 1993, Vol 42, Num 5, pp 294-304, issn 0022-0744Article

Characteristics of YAG single crystals for electron scintillators of STEMHIBINO, M; IRIE, K; AUTRATA, R et al.Journal of electron microscopy. 1992, Vol 41, Num 6, pp 453-457, issn 0022-0744Article