Bloch wave treatment of symmetry and multiple beam cases in reflection high energy electron diffraction and reflection electron microscopyPENG, L.-M; GJØNNES, K; GJØNNES, J et al.Microscopy research and technique. 1992, Vol 20, Num 4, pp 360-370Article

REM studies of surface crystallographyLEHMPFUHL, G; UCHIDA, Y.Ultramicroscopy. 1993, Vol 48, Num 4, pp 445-451, issn 0304-3991Article

Reflection electron holographyBANZHOF, H; HERMANN, K.-H.Ultramicroscopy. 1993, Vol 48, Num 4, pp 475-481, issn 0304-3991Article

Electron optical analysis of a retarding Wien filter for electron spectroscopic imagingTSUNO, K.Review of scientific instruments. 1993, Vol 64, Num 3, pp 659-666, issn 0034-6748Article

Imaging friction tracks at diamond surfaces using reflection electron microscopyWANG, Z. L.Journal of electron microscopy technique. 1991, Vol 17, Num 2, pp 231-240, issn 0741-0581Article

Steady-state motion of silicon islands driven by a DC currentMETOIS, J.-J; HEYRAUD, J.-C; PIMPINELLI, A et al.Surface science. 1999, Vol 420, Num 2-3, pp 250-258, issn 0039-6028Article

On the resolution of the low-energy electron reflection microscope based on wave electron opticsZHIFENG SHAO; CREWE, A. V.Ultramicroscopy. 1989, Vol 31, Num 2, pp 199-203, issn 0304-3991Article

Surface imaging techniques and magnetic materialsSPENCE, J. C. H.Materials science & engineering. B, Solid-state materials for advanced technology. 1989, Vol 3, Num 4, pp 421-425, issn 0921-5107, 5 p.Article

Competing effects of current and strain on step structures on Si(001)2 x 1 studied by REMTAMURA, H; TANISHIRO, Y; MINODA, H et al.Surface science. 1997, Vol 382, Num 1-3, pp 310-319, issn 0039-6028Article

Dynamical calculation of high-resolution reflection electron microscopy lattice fringes from the Si(111) 7 x 7 surfaceMCCOY, J. M; MAKSYM, P. A.Surface science. 1997, Vol 375, Num 2-3, pp 183-194, issn 0039-6028Article

Thermal properties of anisotropic diffusion of Si adsorbates on a Si(001) surfaceDOI, T; ICHIKAWA, M; HOSOKI, S et al.Surface science. 1996, Vol 357-58, pp 868-872, issn 0039-6028Conference Paper

REM observations of the birth stage of the flat facets on an inner cylindrical silicon surfaceSUZUKI, T; METOIS, J. J; YAGI, K et al.Surface science. 1995, Vol 339, Num 1-2, pp 105-113, issn 0039-6028Article

Reflection electron microscope imaging of an operating scanning tunneling microscopeKUWABARA, M; LO, W; SPENCE, J. C. H et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1989, Vol 7, Num 4, pp 2745-2751, issn 0734-2101, 7 p.Article

Reflection electron microscopy observation of formation process of palladium silicide islands on silicon (111) surfaceTAKEGUCHI, Masaki; TANAKA, Miyoko; YASUDA, Hidehiro et al.Scripta materialia. 2001, Vol 44, Num 8-9, pp 2363-2367, issn 1359-6462Conference Paper

What does an evaporating surface look like ?PIMPINELLI, A; VILLAIN, J.Physica. A. 1994, Vol 204, Num 1-4, pp 521-542, issn 0378-4371Conference Paper

Reflection electron holographic observation of surface displacement fieldOSAKABE, N; MATSUDA, T; ENDO, J et al.Ultramicroscopy. 1993, Vol 48, Num 4, pp 483-488, issn 0304-3991Article

Reflection electron microscopy studies of the step meandering and evaporation on vicinal surfaces of siliconBERMOND, J. M; METOIS, J. J; HEYRAUD, J. C et al.Surface science. 1995, Vol 331-333, pp 855-864, issn 0039-6028, bConference Paper

Scanning reflection electron microscopy and associated techniques for surface studiesLIU, J; COWLEY, J. M.Ultramicroscopy. 1993, Vol 48, Num 4, pp 381-416, issn 0304-3991Article

Kinetic step pairingPIERRE-LOUIS, O; METOIS, J.-J.Physical review letters. 2004, Vol 93, Num 16, pp 165901.1-165901.4, issn 0031-9007Article

Oxygen-induced restructuring of Au(111) observed by reflection electron microscopyUCHIDA, Y; BAO, X; WEISS, K et al.Surface science. 1998, Vol 401, Num 3, pp 469-475, issn 0039-6028Article

PEEM and REM studies of surface dynamics : electromigration and C1 adsorption and desorptionSHIDAHARA, Y; AOKI, K; TANISHIRO, Y et al.Surface science. 1996, Vol 357-58, pp 820-824, issn 0039-6028Conference Paper

Study of twinning with reflection electron microscopy (REM)TUNG HSU; COWLEY, J. M.Ultramicroscopy. 1994, Vol 55, Num 3, pp 302-307, issn 0304-3991Article

Transformation of a Si(111) stepped surface during the formation of a Si(3×1)Ca superstructureKRASILNIKOV, A. B; LATYSHEV, A. V; ASEEV, A. L et al.Surface science. 1993, Vol 290, Num 3, pp 232-238, issn 0039-6028Article

Contrast variation of Au(111) reconstructed surfaces with defocus in REMWANG, N; UCHIDA, Y; LEHMPFUHL, G et al.Ultramicroscopy. 1993, Vol 50, Num 3, pp 239-243, issn 0304-3991Article

Experimental conditions for surface microanalysis with reflection electron energy-loss spectroscopyWANG, Z. L.Journal of electron microscopy technique. 1989, Vol 11, Num 1, pp 70-75, issn 0741-0581Article