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A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFMPUTMAN, C. A. J; DE GROOTH, B. G; VAN HULST, N. F et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1509-1513, issn 0304-3991Conference Paper

Atomic force microscope coupled with an optical microscopeKANEKO, R; OGUCHI, S; HARA, S et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1542-1548, issn 0304-3991Conference Paper

Force microscopy utilizing tunnel junction controlKIM, H. S; BRYANT, P. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 641-644, issn 0734-2101, 1Conference Paper

High-frequency circuit characterization using the AFM as a reactive near-field probeBRIDGES, G. E; THOMSON, D. J.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 321-328, issn 0304-3991Conference Paper

Laser thermal effects on atomic force microscope cantileversALLEGRINI, M; ASCOLI, C; BASCHIERI, P et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 371-378, issn 0304-3991Conference Paper

Micro-tribological evaluations of a polymer surface by atomic force microscopesHAMADA, E; KANEKO, R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 184-190, issn 0304-3991Conference Paper

Characterization of Surface Coats of Bacterial Spores with Atomic Force Microscopy and WaveletsWEI SUN; ROMAGNOLI, Jose A; PALAZOGLU, Ahmet et al.Industrial & engineering chemistry research. 2011, Vol 50, Num 5, pp 2877-2883, issn 0888-5885, 7 p.Conference Paper

Atomic force microscopy: probing the spatial organization, interactions and elasticity of microbial cell envelopes at molecular resolutionSCHEURING, Simon; DUFRENE, Yves F.Molecular microbiology (Print). 2010, Vol 75, Num 6, pp 1327-1336, issn 0950-382X, 10 p.Article

Measurement of elastic properties of prostate cancer cells using AFMCORREIA FARIA, Elsa; NAN MA; GAZI, Ehsan et al.Analyst (London. 1877. Print). 2008, Vol 133, Num 11, pp 1498-1500, issn 0003-2654, 3 p.Article

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A novel ZnO whisker tip for atomic force microscopyKADO, H; YOKOYAMA, K; TOHDA, T et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1659-1663, issn 0304-3991Conference Paper

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Magnetic force microscope utilizing an ultra-small-spring-constant vertically cantilevered tipDICARLO, A; SCHEINFEIN, M. R; CHAMBERLIN, R. V et al.Ultramicroscopy. 1992, Vol 47, Num 4, pp 383-392, issn 0304-3991Conference Paper

Forces in atomic force microscopy in air and waterWEISENHORN, A. L; HANSMA, P. K; ALBRECHT, T. R et al.Applied physics letters. 1989, Vol 54, Num 26, pp 2651-2653, issn 0003-6951, 3 p.Article

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An AFM with integrated micro-fluorescence optics : design and performanceRADMACHER, M; EBERLE, K; GAUB, H. E et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 968-972, issn 0304-3991Conference Paper

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Rocking-beam force-balance approach to atomic force microscopyGRIGG, D. A; RUSSELL, P. E; GRIFFITH, J. E et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1504-1508, issn 0304-3991Conference Paper

Etude théorique de l'interaction de van der Waals entre une sonde métallique et une surface diélectrique : application à la microscopie par mesure de forces atomiques = Theoretical study of the van des Waals interaction between a metallic probe and a dielectric surface: application to atomic force microscopyMAGHEZZI, S; GIRARD, C; VAN LABEKE, D et al.Journal de physique 1, General physics, statistical physics, condensed matter, cross-disciplinary physics. 1991, Vol 1, Num 2, pp 289-307, 19 p.Article

A magnetic force microscope using an optical lever sensor and its application to longitudinal recording mediaHONDA, Y; HOSAKA, S; KIKUGAWA, A et al.Japanese journal of applied physics. 1992, Vol 31, Num 8A, pp L1061-L1064, issn 0021-4922, 2Article

Influence of sodium chromate and dodecylamine on enhanced dissolution behavior of Cu-Ni alloy induced by AFM tip scratchingQU, Jun-E; XINGPENG GUO; ZHENYU CHEN et al.Journal of materials science. 2006, Vol 41, Num 12, pp 3663-3669, issn 0022-2461, 7 p.Article

Molecular dynamic study for nanopatterning using atomic force microscopyKIM, Young-Suk; NA, Kyoung-Hoan; KIM, Chan-Il et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2005, Vol 36, Num 1, pp 169-176, issn 1073-5623, 8 p.Article

Microbial surfaces investigated using atomic force microscopyBOLSHAKOVA, Anastassia V; KISELYOVA, Olga I; YAMINSKY, Igor V et al.Biotechnology progress. 2004, Vol 20, Num 6, pp 1615-1622, issn 8756-7938, 8 p.Article

Visualization of reconstituted solenoid chromatin structure by tapping mode atomic force microscopyDAGE LIU; CHEN WANG; JUNWEI LI et al.Surface and interface analysis. 2001, Vol 32, Num 1, pp 20-26, issn 0142-2421Conference Paper