Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Microscopía fuerza")

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 14937

  • Page / 598

Export

Selection :

  • and

Force microscopySTUTZMANN, Martin.Physica status solidi. Rapid research letters (Print). 2008, Vol 2, Num 3, issn 1862-6254, 56 p.Serial Issue

Atomic force microscope detection system using an optical fiber heterodyne interferometer free from from external disturbancesOSHIO, T; NAKATANI, N; SAKAI, Y et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 310-314, issn 0304-3991Conference Paper

Proposal for a new optical device to sense AFM forcesDIASPRO, A; AGUILAR, M.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1668-1670, issn 0304-3991Conference Paper

Theoretical modelling of AFM for bimetallic tip-substrate interactionsBOZZOLO, G; FERRANTE, J.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 55-58, issn 0304-3991Conference Paper

A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFMPUTMAN, C. A. J; DE GROOTH, B. G; VAN HULST, N. F et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1509-1513, issn 0304-3991Conference Paper

Atomic force microscope coupled with an optical microscopeKANEKO, R; OGUCHI, S; HARA, S et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1542-1548, issn 0304-3991Conference Paper

Force microscopy utilizing tunnel junction controlKIM, H. S; BRYANT, P. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 641-644, issn 0734-2101, 1Conference Paper

High-frequency circuit characterization using the AFM as a reactive near-field probeBRIDGES, G. E; THOMSON, D. J.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 321-328, issn 0304-3991Conference Paper

Laser thermal effects on atomic force microscope cantileversALLEGRINI, M; ASCOLI, C; BASCHIERI, P et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 371-378, issn 0304-3991Conference Paper

Micro-tribological evaluations of a polymer surface by atomic force microscopesHAMADA, E; KANEKO, R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 184-190, issn 0304-3991Conference Paper

Atomic force microscopyTENDLER, Saul J. B; WILLIAMS, Philip M.Analytica chimica acta. 2003, Vol 479, Num 1, issn 0003-2670, 117 p.Serial Issue

Early detection of cytotoxic events between hepatic natural killer cells and colon carcinoma cells as probed with the atomic force microscopeBRAET, F; VERMIJLEN, D; BOSSUYT, V et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 265-273, issn 0304-3991Article

Scanned-cantilever atomic force microscopeBASELT, D. R; BALDESCHWIELER, J. D.Review of scientific instruments. 1993, Vol 64, Num 4, pp 908-911, issn 0034-6748Article

A stand-alone scanning force and friction microscopeHIPP, M; BIELEFELDT, H; COLCHERO, J et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1498-1503, issn 0304-3991Conference Paper

Atomic force microscope featuring an integrated optical microscopePUTMAN, C. A. J; VAN DER WERF, K. O; DE GROOTH, B. G et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1549-1552, issn 0304-3991Conference Paper

Characterization of Surface Coats of Bacterial Spores with Atomic Force Microscopy and WaveletsWEI SUN; ROMAGNOLI, Jose A; PALAZOGLU, Ahmet et al.Industrial & engineering chemistry research. 2011, Vol 50, Num 5, pp 2877-2883, issn 0888-5885, 7 p.Conference Paper

Atomic force microscopy: probing the spatial organization, interactions and elasticity of microbial cell envelopes at molecular resolutionSCHEURING, Simon; DUFRENE, Yves F.Molecular microbiology (Print). 2010, Vol 75, Num 6, pp 1327-1336, issn 0950-382X, 10 p.Article

Measurement of elastic properties of prostate cancer cells using AFMCORREIA FARIA, Elsa; NAN MA; GAZI, Ehsan et al.Analyst (London. 1877. Print). 2008, Vol 133, Num 11, pp 1498-1500, issn 0003-2654, 3 p.Article

Regulation of microcantilever response by force feedbackMERTZ, J; MARTI, O; MLYNEK, J et al.Applied physics letters. 1993, Vol 62, Num 19, pp 2344-2346, issn 0003-6951Article

A novel ZnO whisker tip for atomic force microscopyKADO, H; YOKOYAMA, K; TOHDA, T et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1659-1663, issn 0304-3991Conference Paper

An evaluation of the use of the atomic force microscope for studies in nanomechanicsCOHEN, S. R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 66-72, issn 0304-3991Conference Paper

Magnetic force microscope utilizing an ultra-small-spring-constant vertically cantilevered tipDICARLO, A; SCHEINFEIN, M. R; CHAMBERLIN, R. V et al.Ultramicroscopy. 1992, Vol 47, Num 4, pp 383-392, issn 0304-3991Conference Paper

Forces in atomic force microscopy in air and waterWEISENHORN, A. L; HANSMA, P. K; ALBRECHT, T. R et al.Applied physics letters. 1989, Vol 54, Num 26, pp 2651-2653, issn 0003-6951, 3 p.Article

Scan speed limit in atomic force microscopyBUTT, H.-J; SIEDLE, P; SEIFERT, K et al.Journal of microscopy (Print). 1993, Vol 169, pp 75-84, issn 0022-2720, 1Article

An AFM with integrated micro-fluorescence optics : design and performanceRADMACHER, M; EBERLE, K; GAUB, H. E et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 968-972, issn 0304-3991Conference Paper

  • Page / 598