Calculations of field ionization in the field ion microscopeDE CASTILHO, C. M. C; KINGHAM, D. R.Surface science. 1986, Vol 173, Num 1, pp 75-96, issn 0039-6028Article

Simulated electron beam trajectories toward a field ion microscopy specimenLARSON, D. J; CAMUS, P. P; KELLY, T. F et al.Applied surface science. 1993, Vol 67, Num 1-4, pp 473-480, issn 0169-4332Conference Paper

Feldionenmikroskopie der Gitterstörungen im Metallkristallen = Microscopie ionique à émission de champ pour l'étude des défauts cristallins dans les cristaux métalliques = Field ion microscopy of lattice defects in metallic crystalsKRAUTZ, E.Optik (Stuttgart). 1987, Vol 77, Num 1, pp 35-38, issn 0030-4026Article

Atom-probe field ion microscopy and applications to surface scienceTSONG, T. T.Surface science. 1994, Vol 299-300, Num 1-3, pp 153-169, issn 0039-6028Article

Simulation of FIM images of precipitation-hardening alloysSANO, N.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 297-302, issn 0169-4332Conference Paper

Theory of electron tunneling in scanning tunneling microscopy and field ion microscopyTSUKADA, M.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 312-321, issn 0169-4332Conference Paper

Composite thin-film characterization by atom probe field ion microscopyMELMED, A. J; CAMUS, P. P.Ultramicroscopy. 1991, Vol 35, Num 3-4, pp 277-287, issn 0304-3991Article

Imaging gas concentration in the field ion microscope: a theoretical analysisDE CASTILHO, C. M. C; KINGHAM, D. R.Surface science. 1988, Vol 204, Num 3, pp 568-586, issn 0039-6028Article

Resolution of the field ion microscopeDE CASTILHO, C. M. C; KINGHAM, D. R.Journal of physics. D, Applied physics (Print). 1987, Vol 20, Num 1, pp 116-124, issn 0022-3727Article

Atomic events at lattice steps and clusters: a direct view of crystal growth processesEHRLICH, G.Surface science. 1995, Vol 331-333, pp 865-877, issn 0039-6028, bConference Paper

Lateral and depth scale calibration of the position sensitive atom probeHYDE, J. M; CEREZO, A; SETNA, R. P et al.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 382-391, issn 0169-4332Conference Paper

Negative field ion microscopy of the initial stages of polymerization of tetracyanoethyleneTHEISS, A; RÖLLGEN, F. W.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 307-311, issn 0169-4332Conference Paper

Study of proper conditions for quantitative atom-probe analysisROLANDER, U; ANDREN, H.-O.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 392-402, issn 0169-4332Conference Paper

IFES'92 International field emission symposiumMILLER, Michael K; KREUZER, H. Jürgen.Applied surface science. 1993, Vol 67, Num 1-4, issn 0169-4332Conference Proceedings

On the full-width-at-half-maximum of field ion energy distributionsERNST, N; BOZDECH, G; SCHMIDT, H et al.Applied surface science. 1993, Vol 67, Num 1-4, pp 111-117, issn 0169-4332Conference Paper

IFES'95: International Field Emission SymposiumMILLER, Michael K; KELLY, Thomas F; CAMUS, Patrick P et al.Applied surface science. 1996, Vol 94-95, issn 0169-4332, 532 p.Conference Proceedings

A new electronic detector for FIM and AP : Initial WoW resultsCAMUS, P. P; LARSON, D. J; HOLZMAN, L. M et al.Journal de physique. IV. 1996, Vol 6, Num 5, pp C5.291-C5.295, issn 1155-4339Conference Paper

Noble-gas-like mechanism of localized field ionization of nitrogen as detected by field ion appearance energy spectroscopySUCHORSKI, Y; MEDVEDEV, V. K; BLOCK, J. H et al.Applied surface science. 1996, Vol 94-95, pp 217-223, issn 0169-4332Conference Paper

Electrostatic fields above individual atomsSUCHORSKI, YU; SCHMIDT, W. A; ERNST, N et al.Progress in surface science. 1995, Vol 48, Num 1-4, pp 121-134, issn 0079-6816Conference Paper

Field ion-scanning tunneling microscopySAKURAI, T; HASHIZUME, T; KAMIYA, I et al.Progress in surface science. 1990, Vol 33, Num 1, pp 3-89, issn 0079-6816, 87 p.Article

Application of a position-sensitive detector to atom probe microanalysisCEREZO, A; GODFREY, T. J; SMITH, G. D. W et al.Review of scientific instruments. 1988, Vol 59, Num 6, pp 862-866, issn 0034-6748Article

APFIM characterization of single-crystal PWA 1480 nickel-based superalloyMILLER, M. K; JAYARAM, R; LIN, L. S et al.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 172-176, issn 0169-4332Conference Paper

Direct observations of surface diffusionEHRLICH, G.Scanning microscopy. 1990, Vol 4, Num 4, pp 829-842, issn 0891-7035Article

Theory of the FIM image of phthalocyanineKAGESHIMA, H; TSUKADA, M.Surface science. 1990, Vol 236, Num 3, pp 385-397, issn 0039-6028, 13 p.Article

Atomic-level studies of superconducting and nonsuperconducting YBa₂Cu₃O_7-xKELLOGG, G. L; BRENNER, S. S.Applied physics. A, Solids and surfaces. 1989, Vol 48, Num 3, pp 197-201, issn 0721-7250, 5 p.Article