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Etude théorique de l'interaction de van der Waals entre une sonde métallique et une surface diélectrique : application à la microscopie par mesure de forces atomiques = Theoretical study of the van des Waals interaction between a metallic probe and a dielectric surface: application to atomic force microscopyMAGHEZZI, S; GIRARD, C; VAN LABEKE, D et al.Journal de physique 1, General physics, statistical physics, condensed matter, cross-disciplinary physics. 1991, Vol 1, Num 2, pp 289-307, 19 p.Article

Rhenium tips for stable scanning tunneling microscopyWATANABE, M. O; KINNO, T.Japanese journal of applied physics. 1993, Vol 32, Num 9A, pp L1266-L1268, issn 0021-4922, 2Article

Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscopePANGARIBUAN, T; YAMADA, K; JIANG, S et al.Japanese journal of applied physics. 1992, Vol 31, Num 9A, pp L1302-L1304, issn 0021-4922, 2Article

The use of silver tips in scanning tunnelling microscopyGORBUNOV, A. A; WOLF, B; EDELMANN, J et al.Review of scientific instruments. 1993, Vol 64, Num 8, pp 2393-2394, issn 0034-6748Article

Integrated electrostatically resonant scan tip for an atomic force microscopeKONG, L. C; ORR, B. G; WISE, K. D et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1993, Vol 11, Num 3, pp 634-641, issn 1071-1023Conference Paper

Method for the experimental investigation of tip profiles for scanning tunneling microscopyEFREMOV, V. V; LOUSKINOVICH, P. N; NIKISHIN, V. I et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1459-1463, issn 0304-3991Conference Paper

Silicon cantilevers and tips for scanning force microscopyBRUGGER, J; BUSER, R. A; DE ROOIJ, N. F et al.Sensors and actuators. A, Physical. 1992, Vol 34, Num 3, pp 193-200, issn 0924-4247Conference Paper

Direct observation of the tip shape in scanning probe microscopyMONTELIUS, L; TEGENFELDT, J. O.Applied physics letters. 1993, Vol 62, Num 21, pp 2628-2630, issn 0003-6951Article

z calibration of the atomic force microscope by means by a pyramidal tipJENSEN, F.Review of scientific instruments. 1993, Vol 64, Num 9, pp 2595-2597, issn 0034-6748Article

New method for producing sharp atomic protrusions on blunt tungsten tipsSHARMA, A. K; VISPUTE, R. D; OGALE, S. B et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1992, Vol 10, Num 3, pp 1208-1210, issn 0734-211XArticle

Calibration of atomic-force microscope tipsHUTTER, J. L; BECHHOEFER, J.Review of scientific instruments. 1993, Vol 64, Num 7, pp 1868-1873, issn 0034-6748Article

Use of a ReO3 single crystal as the tip for scanning tunneling microscopyIKEBE, S.-I; SHIMADA, D; AKAHANE, T et al.Japanese journal of applied physics. 1991, Vol 30, Num 3A, pp L405-L406, issn 0021-4922, 2Article

A tip approach system for a scanning tunneling microscope using an inchwormKURODA, T; TANAKA, K; WATANABE, M. O et al.Japanese journal of applied physics. 1993, Vol 32, Num 11A, pp 5176-5177, issn 0021-4922, 1Article

Interaction forces between a tungsten tip and methylated SiO2 surfaces studies with scanning for microscopyOLSSON, L; TENGVALL, P; WIGREN, R et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 73-79, issn 0304-3991Conference Paper

On the limits of the spectroscopic ability of AFM and the interaction between an AFM tip and a sampleSOKOLOV, I. YU.Surface science. 1994, Vol 311, Num 3, pp 287-294, issn 0039-6028Article

Change in scanning tunneling microscope (STM) tip shape during nanofabricationYOKOI, N; UEDA, S; NAMBA, S et al.Japanese journal of applied physics. 1993, Vol 32, Num 1A/B, pp L129-L131, issn 0021-4922, 2Article

Atomic force microscopy using ZnO whisker tipKADO, H; YOKOYAMA, K; TOHDA, T et al.Review of scientific instruments. 1992, Vol 63, Num 6, pp 3330-3332, issn 0034-6748Article

A development in the preparation of sharp scanning tunneling microscopy tipsSONG, J. P; PRYDS, N. H; GLEJBØL, K et al.Review of scientific instruments. 1993, Vol 64, Num 4, pp 900-903, issn 0034-6748Article

Efficient microtip fabrication with carbon coating and electron beam deposition for atomic force microscopyYAMAKI, M; MIWA, T; YOSHIMURA, H et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1992, Vol 10, Num 6, pp 2447-2450, issn 1071-1023Conference Paper

Kinetic limits for sensing tip morphology in near-field scanning optical microscopesYAKOBSON, B. I; MOYER, P. J; PAESLER, M. A et al.Journal of applied physics. 1993, Vol 73, Num 11, pp 7984-7986, issn 0021-8979, 1Article

Fabrication of microtips on planar specimensLARSON, D. J; CHEN-MING TENG; CAMUS, P. P et al.Applied surface science. 1995, Vol 87-88, pp 446-452, issn 0169-4332Conference Paper

An automatic field-emission tip conditioning systemRUAN, S; KAPP, O. H.Review of scientific instruments. 1992, Vol 63, Num 9, pp 4056-4060, issn 0034-6748Article

Tip-structure effects on atomic force microscopy imagesTEKMAN, E; CIRACI, S.Journal of physics. Condensed matter (Print). 1991, Vol 3, Num 16, pp 2613-2619, issn 0953-8984, 7 p.Article

Transient thermography of semiconductors using the evanescent microwave microscopeCIOCAN, R; TABIB-AZAR, M.Microscale thermophysical engineering (Print). 1999, Vol 3, Num 4, pp 253-262, issn 1089-3954Article

Characterization of bulk micromachined tunneling tip integrated with positioning actuatorMITA, M; TOSHIYOSHI, H; KAKUSHIMA, K et al.Proceedings, IEEE micro electro mechanical systems. 2002, pp 352-355, issn 1084-6999, isbn 0-7803-7185-2, 4 p.Conference Paper

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