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Macular pucker. II: UltrastructureTRESE, M; CHANDLER, D. B; MACHEMER, R et al.Graefe's archive for clinical and experimental ophthalmology. 1983, Vol 221, Num 1, pp 16-26, issn 0721-832XArticle

A method for the examination of the same cell using light, scanning and transmission electron microscopySLATER, M.Biotechnic & histochemistry. 1991, Vol 1, Num 2, pp 63-68Article

XXVIII - Une introduction à la microscopie électronique en transmissionDONNADIEU, Patricia.École d'été sur la microscopie électronique à balayage et microanalyses. 2008, pp 823-832, isbn 978-2-7598-0082-7, 1Vol, 10 p.Conference Paper

Développement d'un microscope électronique analytique de ultra haute résolution à 300 kV = 300 kV ultra high resolution analytical electron microscope developmentARAI, Y; FUKUSHIMA, K; KOKUBO, Y et al.Spectra 2000. 1991, Vol 19, Num 160, pp 55-58, issn 0399-1172Article

Binocular scanning electron microscope for simultaneous stereography = Microscopie électronique binoculaire à balayage pour stéréographie simultanéeSHOJI, T; OKAYA, K; GOTO, K et al.Mineralogical Journal. 1986, Vol 13, Num 4, pp 195-201, issn 0544-2540Article

Radio frequency glow discharge and solid-phase lactoperoxidase-glucose oxidase beads as methods for etching ultra-thin plastic sections for immunoelectron microscopyMAROTTA, L; SHERO, M; CARTER, J. M et al.Journal of immunological methods. 1984, Vol 71, Num 1, pp 69-82, issn 0022-1759Article

VIII - La microscopie électronique à balayage à pression contrôléeREPOUX, Monique; MATHIEU, Christian.École d'été sur la microscopie électronique à balayage et microanalyses. 2008, pp 243-268, isbn 978-2-7598-0082-7, 1Vol, 26 p.Conference Paper

100 ps resolution simple delay circuit for scanning electron microscope stroboscopyFUJIOKA, H; NAKAMAE, K; URA, K et al.Journal of physics. E. Scientific instruments. 1984, Vol 17, Num 3, pp 198-199, issn 0022-3735Article

Analytical electron microscopy of InP/(In, Ga)As heterogeneous structuresBURZIK, J; WEATHERLY, G. C.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 253-256, issn 0254-0584, 4 p.Conference Paper

Transmission and scanning electron microscopy findings in 37 patients with monocytic leukemiaDJALDETTI, M; PEREK, J; MITTELMAN, M et al.Journal of submicroscopic cytology. 1984, Vol 16, Num 2, pp 371-377, issn 0022-4782Article

Sphere-on-tape method of rapid selected-area thinning of samples for transmission electron microscopyBROESE VAN GROENOU, A; VAN OERS, D. J. C.Journal of the American Ceramic Society. 1983, Vol 66, Num 12, pp C223-C224, issn 0002-7820Article

Transmission electron microscopy investigation of the microstructure and chemistry of Si/Cu/In/Cu/Si interconnectionsSOMMADOSSI, S; LITYNSKA, L; ZIEBA, P et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 566-568, issn 0254-0584, 3 p.Conference Paper

Transmission electron microscopy study of Au/ZrB2/Ag(Te) contacts to GaSbKATCKI, J; ŁASZCZ, A; RATAJCZAK, J et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 260-264, issn 0254-0584, 5 p.Conference Paper

Review on Ceramic Interphases by Transmission and Scanning Electron Microscopy = Bewertung keramischer Interphasen mittels Transmissions- und RasterelektronenmikroskopieSOLDATI, Analia; MONTENEGRO-HERNANDEZ, Alejandra; BAQUE, Laura et al.Praktische Metallographie. 2014, Vol 51, Num 9, pp 675-688, issn 0032-678X, 14 p.Article

Evolution de la microstructure et des propriétés mécaniques d'alliages Ni-Al-Ti par vieillissement thermique et sous irradiationNjah, Nabil; Fayard.1989, 132 p.Thesis

ELECTRON PROBE X-RAY MICROANALYSIS IN CYTOCHEMISTRY = MICROANALYSE AUX RAYONS X A L'AIDE D'UNE SONDE ELECTRONIQUE EN CYTOCHIMIECHANDLER JA.1975; TECH. BIOCHEM. BIOPHYS. MORPHOL.; U.S.A.; DA. 1975; VOL. 2; PP. 307-437; BIBL. 4P.1/2Article

ELECTRON MICROSCOPY CONFERENCE. ABSTRACTS; NIJMEGEN, NETH.; 19751975; J. MICR. BIOL. CELL.; FR.; DA. 1975; VOL. 24; NO 2-3; PP. 175-202; BIBL. DISSEM.Conference Paper

SCANNING AND TRANSMISSION ELECTRON MICROSCOPIC EVALUATION OF PARATHYROID GLANDSCAPEN CC; FETTER AW.1971; IN: 29TH ANNU. MEET. ELECTRON MICROSC. SOC. AMERICA PROC. BOSTON, MASS., 1971; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1971; PP. 500-501Conference Paper

Meeting of the French Microscopy SocietyEPJ. Applied physics (Print). 2008, Vol 44, Num 1, pp 1-42, issn 1286-0042, 41 p.Conference Paper

Application of the imaging plate to TEM observationAYATO, H; MORI, N; MIYAHARA, J et al.Journal of electron microscopy. 1990, Vol 39, Num 6, pp 444-448, issn 0022-0744Article

Moncontact high-speed waveform measurements with the picosecond photoelectron scanning electron microscopeMAY, P. G; HALBOUT, J.-M; CHIU, G. L.-T et al.IEEE journal of quantum electronics. 1988, Vol 24, Num 2, pp 234-239, issn 0018-9197Article

Ätiologie und Pathogenese der rezidivierenden Erosion der Hornhaut ― Eine Raster- und Transmissionelektronenmikroskopische studie = Etiolgie et pathogénie de l'érosion récidivante de la cornée. Etude au microscope électronique à transmission et au microscope électronique à balayage = Etiology and pathogenesis of recurrent erosion of the cornea. A scanning electron and transmission electron microscopy studyCONRADS, H; BLASCHKE, R; KRUG, U et al.Ophthalmologica (Basel). 1983, Vol 187, Num 4, pp 185-191, issn 0030-3755Article

On the analytical methods of line defect and beam direction determinationsDRABIK, W; TORUN, J.Physica status solidi. A. Applied research. 1983, Vol 77, Num 2, pp 513-519, issn 0031-8965Article

Structure and properties of interfaces. WorkshopSMITH, David J; CARPENTER, R. W.Ultramicroscopy. 1992, Vol 40, Num 3, issn 0304-3991Conference Proceedings

Low voltage scanning electron microscopyPAWLEY, J.Journal of microscopy (Print). 1984, Vol 136, Num 1, pp 45-68, issn 0022-2720Article

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