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An introduction to process visualization capabilities and considerations in the environmental scanning electron microscope (ESEM)PRACK, E. R.Microscopy research and technique. 1993, Vol 25, Num 5-6, pp 487-492, issn 1059-910XArticle

Introduction of the ESEM instrumentDANILATOS, G. D.Microscopy research and technique. 1993, Vol 25, Num 5-6, pp 354-361, issn 1059-910XArticle

HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY AT THE SUBCELLULAR LEVEL = MICROSCOPIE ELECTRONIQUE A BALAYAGE DE HAUTE RESOLUTION AU NIVEAU SUBCELLULAIRESHAU DA LIN; LAMVIK MK.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 2; PP. 249-257; BIBL. 16REF.Article

New linewidth measurement system using environmental scanning electron microscope technologyYAMAGUCHI, T; KAWATA, S; SUZUKI, S et al.Japanese journal of applied physics. 1993, Vol 32, Num 12B, pp 6277-6280, issn 0021-4922, 1Conference Paper

Environmental scanning electron microscope imaging examples related to particle analysisWIGHT, S. A; ZEISSLER, C. J.Microscopy research and technique. 1993, Vol 25, Num 5-6, pp 393-397, issn 1059-910XArticle

IntroductionMANIGUET, Laurent; REPOUX, Monique; RUSTE, Jacky et al.École d'été sur la microscopie électronique à balayage et microanalyses. 2008, pp 1-12, isbn 978-2-7598-0082-7, 1Vol, 12 p.Conference Paper

XXII - Le MEB STEMGRILLON, François; CHARLOT, Frédéric.École d'été sur la microscopie électronique à balayage et microanalyses. 2008, pp 733-736, isbn 978-2-7598-0082-7, 1Vol, 4 p.Conference Paper

Determining the Uncertainty in Measuring Length in Light and Scanning-Electron Microscopy = Bestimmung der Messunsicherheit für die Langenmessung in der Licht- und Rasterelektronenmikroskopie in einem MetallographielaborMEYER, B; HORN-SAMODELKIN, G; PIETSCHMANN, F et al.Praktische Metallographie. 2012, Vol 49, Num 4, pp 200-209, issn 0032-678X, 10 p.Article

Remote operation of a Cameca SX100 scanning electron microprobeWAGSTAFF, J; MCKAY, G; REID, A et al.Computers & geosciences. 1999, Vol 25, Num 4, pp 523-529, issn 0098-3004Article

CORRELATED SCANNING ELECTRON MICROSCOPY IN TRANSMISSION (STEM) AND REFLECTION (SEM) ON SECTIONS OF SKELETAL MUSCLE.GEISSINGER HD; GRINYER I.1977; MIKROSKOPIE; OESTERR.; DA. 1977; VOL. 32; NO 11-12; PP. 329-333; ABS. ANGL.; BIBL. 5 REF.Article

METHODE POUR L'OBTENTION D'IMAGES DISTINCTES D'ECHANTILLONS BIOLOGIQUES AU MICROSCOPE ELECTRONIQUE A BALAYAGEKRYMSKIJ LD; ARSHINOVA MN.1975; BJULL. EKSPER. BIOL. MED.; S.S.S.R.; DA. 1975; VOL. 79; NO 1; PP. 90-93; ABS. ANGL.; BIBL. 2REF.Article

A ROBUST MICROMANIPULATOR FOR THE SCANNING ELECTRON MICROSCOPE = UN MICROMANIPULATEUR ROBUSTE POUR LA MICROSCOPIE ELECTRONIQUE A BALAYAGEPAWLEY JB; BOYDE A.1975; J. MICR.; G.B.; DA. 1975; VOL. 103; NO 2; PP. 265-270; BIBL. 5REFArticle

A SIMPLE TECHNIQUE FOR EXAMINING FRESH, FROZEN, BIOLOGICAL SPECIMENS IN THE SCANNING ELECTRON MICROSCOPETURNER RH; SMITH CB.1974; J. MICR.; G.B.; DA. 1974; VOL. 102; NO 2; PP. 209-214; BIBL. 10REF.Article

Use, applications and value of stereo-EBIC imagingVALDRE, U; BERGONZONI, A; MERLI, M et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 366-381, issn 0304-3991Article

Effets d'irradiations aux électrons basse et moyenne énergie sur des isolants et des transistors MOS issus de diverses technologies = Low energy electron radiation effects on MOS transistors and insulators from several technologiesCharpenel, Philippe; Girard, Paul.1992, 148 p.Thesis

Discriminating between atomic number and topographic contrast using a wide-angle backscattered electron detector in scanning electron microscopyROBINSON, V. N. E.Journal of electron microscopy. 1989, Vol 38, Num 5, pp 389-393, issn 0022-0744, 5 p.Article

Increase in osmotic fragility of bovine erythrocytes induced by bacterial phospholipases CTAGUCHI, R; MIZUNO, M; INOUE, M et al.Journal of biochemistry (Tokyo). 1983, Vol 93, Num 2, pp 403-412, issn 0021-924XArticle

Scanning electron microscopy of the scalies burrow and its contents, with special reference to the Sarcoptes scabiei eggSHELLEY, N. B; SHELLEY, E. D.Journal of the American Academy of Dermatology. 1983, Vol 9, Num 5, pp 673-679, issn 0190-9622Article

Scanning electron microscopy of Pseudogymnoascus roseusTSUNEDA, A.Mycologia. 1982, Vol 74, Num 5, pp 844-847, issn 0027-5514Article

Microstructure isolation testing using a scanning electron mecroscopeMAHANT-SHETTI, S. S; ATON, T. J; GALE, R. J et al.Applied physics letters. 1990, Vol 56, Num 23, pp 2310-2312, issn 0003-6951Article

The STM learning curve and where it may take usDEMUTH, J. E; KOEHLER, U; HAMERS, R. J et al.Journal of microscopy (Print). 1988, Vol 152, Num 2, pp 299-316, issn 0022-2720Article

Hyperparasitism of Puccinia violae by Cladosporium uredinicolaTRAQUAIR, J. A; MELOCHE, R. B; JARVIS, W. R et al.Canadian journal of botany. 1984, Vol 62, Num 1, pp 181-184, issn 0008-4026Article

Darstellung Verstärkter Kunststoffe mittels RE-Detektor (REM) und Mikroradiografie = Imaging of reinforced plastics by means of a BE detector (SEM) and microradiographyBÜRGER, Colette; EHRENSTEIN, Gottfried W.Praktische Metallographie. 2006, Vol 43, Num 4, pp 161-183, issn 0032-678X, 23 p.Article

Onychoschizia: scanning electron microscopySHELLEY, W. B; SHELLEY, E. D.Journal of the American Academy of Dermatology. 1984, Vol 10, Num 4, pp 623-627, issn 0190-9622Article

Role of ammonium nitrate in morphological differentiation of Aspergillus niger in a submerged cultureJOUNG, J. J; BLASKOVITZ, R. J.Developments in industrial microbiology. 1984, Vol 26, pp 487-494, issn 0070-4563Conference Paper

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