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ELECTRON PROBE X-RAY MICROANALYSIS IN CYTOCHEMISTRY = MICROANALYSE AUX RAYONS X A L'AIDE D'UNE SONDE ELECTRONIQUE EN CYTOCHIMIECHANDLER JA.1975; TECH. BIOCHEM. BIOPHYS. MORPHOL.; U.S.A.; DA. 1975; VOL. 2; PP. 307-437; BIBL. 4P.1/2Article

Orientation and Phase Analysis of Nanoscale Grains Using Transmission Electron Microscopy = Orientierungs- und Phasenanalyse nanoskaliger Körner mittels TransmissionselektronenmikroskopieSEYRING, M; SONG, X; RETTENMAYR, M et al.Praktische Metallographie. 2012, Vol 49, Num 10, pp 623-632, issn 0032-678X, 10 p.Article

Sub-Ångstrom high-resolution transmission electron microscopy at 300 keVO'KEEFE, M. A; HETHERINGTON, C. J. D; THUST, A et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 215-241, issn 0304-3991Article

Präparation einer TEM-Probe aus einem metallographischen Schliff = Preparing a TEM sample from a polished metallographic sectionMÜHLE, Uwe; JANSEN, Sören; LEINERT, Susann et al.Praktische Metallographie. 2006, Vol 43, Num 6, pp 306-315, issn 0032-678X, 10 p.Article

TEM-Preparation mittels ,,low-voltage-FIB = TEM preparation by low voltage FIBALTMANN, Frank; GRAFF, Andreas; SIMON, Michél et al.Praktische Metallographie. 2006, Vol 43, Num 8, pp 396-405, issn 0032-678X, 10 p.Article

A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant SubstratesTAYLOR, A. A; CORDILL, M. J; MOSER, G et al.Praktische Metallographie. 2011, Vol 48, Num 8, pp 408-413, issn 0032-678X, 6 p.Article

Analytical TEM of i-phase in an Al94Mn2Be2Cu2 alloyROZMAN, Niko; BONCINA, Tonica; ZUPANIC, Franc et al.Praktische Metallographie. 2010, Vol 47, Num 7, pp 388-391, issn 0032-678X, 4 p.Article

In Situ Transmission Electron MicroscopyFERREIRA, P. J; MITSUISHI, K; STACH, E. A et al.MRS bulletin. 2008, Vol 33, Num 2, issn 0883-7694, 49 p.Serial Issue

FIB-Präparation und TEM-Analytik an AISi1-Bondkontakten = Fib preparation and TEM analytics on AISI1 bond padsGEIBLER, Ute; ENGELMANN, Hans-Jürgen; URBAN, Ingrid et al.Praktische Metallographie. 2006, Vol 43, Num 10, pp 520-532, issn 0032-678X, 13 p.Article

TEM-Präparation in drei Raumrichtungen zur Defektanalyse = TEM Preparation in Three Spatial Directions for a Defect AnalysisHILLMANN, Lutz; PRANG, Robby; MÜHLE, Uwe et al.Praktische Metallographie. 2009, Vol 46, Num 6, pp 292-302, issn 0032-678X, 11 p.Article

Transmission electron microscopy identification of a new Ti-Al-Fe intermetallic compoundGERTSMAN, V. Y; DREMAILOVA, O.Journal of materials science. 2006, Vol 41, Num 14, pp 4490-4504, issn 0022-2461, 15 p.Conference Paper

Transmission electron microscopy of Re and Ru films deposited on NiCoCrAlYTa powdersLAFONT, Marie-Christine; JUAREZ L., Fernando; VAHLAS, Constantin et al.Scripta materialia. 2004, Vol 51, Num 7, pp 699-703, issn 1359-6462, 5 p.Article

Resolution in conventional transmission electron microscopySARIKAYA, M; HOWE, J. M.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 145-161, issn 0304-3991Conference Paper

Improved anticontaminator for cryo-electron microscopy with a Philips EM 400HOMO, J.-C; BOOY, F; LABOUESSE, P et al.Journal of microscopy (Print). 1984, Vol 136, Num 3, pp 337-340, issn 0022-2720Article

Plasmids in alkalophilic Bacillus spUSAMI, R; HONDA, H; KUDO, T et al.Agricultural and biological chemistry. 1983, Vol 47, Num 9, pp 2101-2102, issn 0002-1369Article

Practical autoalignment of transmission electron microscopesKOSTER, A. J; DE RUIJTER, W. J.Ultramicroscopy. 1992, Vol 40, Num 2, pp 89-107, issn 0304-3991Article

Melanosis oculi: an ultrastructural study of an affected irisRENNIE, I. G; BLEEHEN, S. S.Archives of ophthalmology (1960). 1983, Vol 101, Num 12, pp 1912-1916, issn 0003-9950Article

TEM and HAADF-STEM study of the structure of Au nano-particles on CeO2AKITA, Tomoki; TANAKA, Koji; KOHYAMA, Masanori et al.Journal of materials science. 2008, Vol 43, Num 11, pp 3917-3922, issn 0022-2461, 6 p.Conference Paper

TEM-Untersuchungen an Erosionskratern, die durch elektrische Entladungen erzeugt werden = TEM-Investigations of erosion craters caused by electrical dischargeSOLDERA, Flavio; ILIC, Nenad; MüCKLICH, Frank et al.Praktische Metallographie. 2005, Vol 42, Num 11, pp 546-554, issn 0032-678X, 9 p.Article

Quand la compresse s'y met, rien ne va plusLE PRIOL, C; BILDEA, A; FREMIOT, K et al.Risques & qualité en milieu de soins. 2009, Num 3, pp 173-175, issn 1767-3445, 3 p.Article

Ultrastructure of the cyanobacterium Mastigocladus laminosus before and during reactivation of a stationary cultureBALKWILL, D. L; NIERZWICKI-BAUER, S. A; STEVENS, S. E. JR et al.Cytobios. 1984, Vol 39, Num 155-156, pp 135-149, issn 0011-4529Article

Mycorrhizal improvement in non-leguminous nitrogen fixing associations with particular reference to hippophaë rhamnoides LGARDNER, I. C; CLELLAND, D. M; SCOTT, A et al.Plant and soil. 1984, Vol 78, Num 1-2, pp 189-199, issn 0032-079XConference Paper

Bidirectional shadowing in freeze-etchingWILLISON, J. H. M; MOIR, R. D.Journal of microscopy (Print). 1983, Vol 132, Num 2, pp 171-178, issn 0022-2720Article

Une nouvelle méthode d'élaboration de films minces: le dépôt d'agrégats. Application au cas de l'antimoine = A new method of thin films elaboration: cluster deposition. Application to the antimony caseHu, Jianxiong; Huareau, A.1993, 114 p.Thesis

Transmission Electron Microscopy of Fe79.5B6.5C14 Network Alloys: Part IIYIP, Y. L; LEUNG, C. C; MOK, S. W et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 3, pp 1457-1469, issn 1073-5623, 13 p.Article

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