Microscopie RX à balayage: une nouvelle méthode d'analyse non-destructive des matériaux composites = XR scanning microscopy: a new method of non destructive testing of composite materialsHENTSCHEL, M. P; LANGE, A.Composites (Paris). 1988, Vol 28, Num 3, pp 241-243, issn 0754-0876Article

Condenser for koehler-like illumination in transmission x-ray microscopes at undulator sourcesVOGT, Ulrich; LINDBLOM, Magnus; CHARALAMBOUS, Pambos et al.Optics letters. 2006, Vol 31, Num 10, pp 1465-1467, issn 0146-9592, 3 p.Article

Soft X-ray microscopy of ultrathin resin sectionsWEBSTER, P; RICHARDS, K. S; RUSH, A. D et al.Journal of microscopy (Print). 1986, Vol 143, Num 3, pp 321-322, issn 0022-2720Article

Developments in imaging in soft X-ray microscopyMICHETTE, A. G.Journal of Photographic Science. 1984, Vol 32, Num 1, pp 45-48, issn 0022-3638Article

Reflection X-ray microscopyFRANKS, A; STEDMAN, M.Journal of microscopy (Print). 1985, Vol 138, Num 3, pp 237-244, issn 0022-2720Article

Scanning X-ray radiography with an improved detection schemeMOUZE, D; CAZAUX, J; THOMAS, X et al.Ultramicroscopy. 1985, Vol 17, Num 3, pp 269-272, issn 0304-3991Article

Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopyGUANXIAOCHENG; CHAO HU; PING XU et al.Optics letters. 2010, Vol 35, Num 21, pp 3610-3612, issn 0146-9592, 3 p.Article

X-ray microscope with multilayer mirrorsUNDERWOOD, J. H; BARBEE, T. W. JR; FRIEBER, C et al.Applied optics. 1986, Vol 25, Num 11, pp 1730-1732, issn 0003-6935Article

Spiral photon sieves apodized by digital prolate spheroidal window for the generation of hard-x-ray vortexCHANGQING XIE; XIAOLI ZHU; LINA SHI et al.Optics letters. 2010, Vol 35, Num 11, pp 1765-1767, issn 0146-9592, 3 p.Article

Development of a one-dimensional Wolter mirror for an advanced Kirkpatrick-Baez mirrorMATSUYAMA, S; WAKIOKA, T; YAMAUCHI, K et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7802, issn 0277-786X, isbn 978-0-8194-8298-3, 780202.1-780202.9Conference Paper

Excitation of luminescence by a Bessel radiation beam for detection of radiophotoluminescent images with a high spatial resolutionLYAKH, V. V; PINDYURIN, V. F; KOCHUBEI, D. I et al.Quantum electronics (Woodbury). 2001, Vol 31, Num 9, pp 811-813, issn 1063-7818Article

At the frontiers of high-resolution hard-x-ray microscopy: an international programme : THE FRONTIER OF X-RAY AND ELECTRON IMAGINGWU, S. R; LIN, C. H; CHEN, Y. S et al.Journal of physics. D, Applied physics (Print). 2013, Vol 46, Num 49, issn 0022-3727, 494005.1-494005.14Article

3d chemical mapping of toners by serial section scanning transmission X-ray microscopyHITCHCOCK, A. P; ARAKI, T; IKEURA-SEKIGUCHI, H et al.Journal de physique. IV. 2003, Vol 104, pp 509-512, issn 1155-4339, 4 p.Conference Paper

Diagnostics d'imagerie X par microscopes X à miroirs développés dans le cadre du programme LIL = X-ray imaging diagnostics using mirror X-ray microscopes developed within the LIL programROSCH, R; BOUTIN, J.-Y; LE BRETON, J. P et al.Journal de physique. IV. 2003, Vol 108, pp 207-210, issn 1155-4339, 4 p.Conference Paper

Considerations of zone plate optics for soft X-ray microscopySIMPSON, M. J; MICHETTE, A. G.Optica acta. 1984, Vol 31, Num 12, pp 1417-1426, issn 0030-3909Article

Design of nano-lithographic system based on phase photon sieveWENBO JIANG; SONG HU.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7133, issn 0277-786X, isbn 978-0-8194-7367-7 0-8194-7367-7, 71333U.1-71333U.6, 2Conference Paper

Concept and realization of the novel rotating condenser-monochromator at the Göttingen TXM at BESSY IINIEMANN, B; GUTTMANN, P; REHBEIN, S et al.Journal de physique. IV. 2003, Vol 104, pp 273-276, issn 1155-4339, 4 p.Conference Paper

Applications of short wavelength radiation : Soft X-ray microscopy and EUV lithographyATTWOOD, D. T.Journal de physique. IV. 2001, Vol 82, pp Pr2.441-Pr2.449, issn 1155-4339Conference Paper

Laser produced plasmas as intense X-ray sources for microscopy at the central laser facilityRUMSBY, P. T.Journal of microscopy (Print). 1985, Vol 138, Num 3, pp 245-265, issn 0022-2720Article

Imaging properties of modified Fresnel zone platesSIMPSON, M. J; MICHETTE, A. G.Optica acta. 1984, Vol 31, Num 4, pp 403-413, issn 0030-3909Article

Structure of nylon 7 solution grown crystalsPRIETO, A; MONTSERRAT, J. M; MUNOZ-GUERRA, S et al.Journal of materials science. 1990, Vol 25, Num 4, pp 2091-2094, issn 0022-2461, 4 p.Article

X-ray microscopy in polymer science prospects of a 'new' imaging techniqueADE, H; SMITH, A. P; CAMERON, S et al.Polymer (Guildford). 1995, Vol 36, Num 9, pp 1843-1848, issn 0032-3861Conference Paper

ULTRASOFT X-RAY MICROSCOPY: ITS APPLICATION TO BIOLOGICAL AND PHYSICAL SCIENCESPARSONS DF ED.1980; ANN. NEW YORK ACAD. SCI.; USA; DA. 1980; VOL. 342; 402 P.; BIBL. DISSEM.Serial Issue

X-ray Phase Nanotomography through Ptychographic Coherent Lensless ImagingGUIZAR-SICAIROS, Manuel; DIAZ, Ana; MENZEL, Andreas et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8011, issn 0277-786X, isbn 978-0-8194-8585-4, 80118F.1-80118F.3, 4Conference Paper

Precision-mechanisms for high accuracy beamline instruments at the ESRF: A reviewDABIN, Y; ROSTAING, G; GAGLIARDINI, E et al.Journal de physique. IV. 2003, Vol 104, pp 109-112, issn 1155-4339, 4 p.Conference Paper