STARS: SCANNING PROBE MICROSCOPYMODY, Cyrus C. M.Proceedings of the IEEE. 2014, Vol 102, Num 7, pp 1107-1112, issn 0018-9219, 6 p.Article

Scanning Probe MicroscopySALAPAKA, Srinivasa M; SALAPAKA, Murti V.IEEE control systems. 2008, Vol 28, Num 2, pp 65-83, issn 1066-033X, 19 p.Article

Solid surface dependent layering of self-arranged structures with fibril-like assemblies of alpha-synucleinBUKAUSKAS, V; SETKUS, A; SIMKIENE, I et al.Applied surface science. 2012, Vol 258, Num 10, pp 4383-4390, issn 0169-4332, 8 p.Article

Papers presented at SXM-4, 25-27 September 2000, Münster, GermanyFUCHS, H; RÖTHIG, C.Surface and interface analysis. 2002, Vol 33, Num 2, issn 0142-2421, 125 p.Conference Proceedings

L'exploration d'un monde nouveau = Exploration of a new worldJOACHIM, Christian; GAUTHIER, Sébastien.Pour la science. 2001, Num 290, pp 30-36, issn 0153-4092Article

Scanning probe microscopesITTIPOL JANGCHUD; SERRANO, A. M; EBY, R. K et al.Advanced materials & processes. 1995, Vol 148, Num 1, pp 33-34, issn 0882-7958Article

Etude théorique et expérimentale de la profondeur de pénétration du champ frustré dans un microscope à effet tunnel photonique = Theoretical and experimental study of frustrated field penetration depth in a photon scanning tunneling microscopeSALOMON, L.Journal of optics. 1992, Vol 23, Num 2, pp 49-55, issn 0150-536XArticle

SXM 2 Workshop, Vienna, Austria, 16-18 September 1996FRIEDBACHER, Gernot.Surface and interface analysis. 1997, Vol 25, Num 7-8, issn 0142-2421, 147 p.Conference Proceedings

Scanning capacitance microscopy on a 25 nm scaleWILLIAMS, C. C; HOUGH, W. P; RISHTON, S. A et al.Applied physics letters. 1989, Vol 55, Num 2, pp 203-205, issn 0003-6951, 3 p.Article

Pooling analysis of scanning probe microscopy imagesDOOLEY, P; BERNASEK, S. L.Surface science. 1998, Vol 406, Num 1-3, pp 206-220, issn 0039-6028Article

Scanning tunnelling optical microscopy : breaking a resolution barrier ?WILLIAMSON, R. L; BINKS, C. J; MILES, M. J et al.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 235-240, issn 0304-3991Conference Paper

Investigation into Sources of Random Uncertainties in the NanoScan-3Di Metrological Scanning Probe MicroscopeGOGOLINSKII, K. V; GUBSKII, K. L; KUZNETSOV, A. P et al.Nanotechnologies in Russia (Print). 2013, Vol 8, Num 5-6, pp 337-341, issn 1995-0780, 5 p.Article

Tight focusing with a binary microaxiconKOTLYAR, V. V; STAFEEV, S. S; O'FAOLAIN, L et al.Optics letters. 2011, Vol 36, Num 16, pp 3100-3102, issn 0146-9592, 3 p.Article

On the relationship between hidden Markov Models and convex functional transforms for simulating Scanning Probe MicroscopyADENLE, Omolabake A; FITZGERALD, William J.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737814.1-737814.8Conference Paper

Probing into adsorption behavior of human plasma fibrinogen on self-assembled monolayers with different chemical properties by scanning probe microscopyISHIZAKI, Takahiro; SAITO, Nagahiro; SATO, Yuki et al.Surface science. 2007, Vol 601, Num 18, pp 3861-3865, issn 0039-6028, 5 p.Conference Paper

Applications of scanning thermal microscopy in the analysis of the geometry of patterned structuresKLAPETEK, Petr; OHLIDAL, Ivan; BURSIK, Jiri et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 383-387, issn 0142-2421, 5 p.Conference Paper

Nanopositioning and nanomeasuring machine for high accuracy measuring procedures of small features in large areasMANSKE, E; HAUSOTTE, T; MASTYLO, R et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 596509.2-596509.11, issn 0277-786X, isbn 0-8194-5983-6, 1VolConference Paper

Nanostructured chalcogenide glassesTANAKA, Keiji.Journal of non-crystalline solids. 2003, Vol 326-27, Num 1, pp 21-28, issn 0022-3093, 8 p.Conference Paper

Study of the dynamic behaviour of a piezo-walkerMARIOTTO, G; D'ANGELO, M; KRESNIN, J et al.Applied surface science. 1999, Vol 144-45, pp 530-533, issn 0169-4332Conference Paper

Applications of scanning probe microscopy, part 4 : Paints and coatingsGILICINSKI, A. G.American laboratory (Fairfield). 1997, Vol 29, Num 7, pp 28-30, issn 0044-7749, 2 p.Article

Contribution à l'étude d'un microscope thermoélastique fonctionnant en champ proche = Contribution to the study of a near-field thermoelastic microscopeFARNAULT, Etienne; CRETIN, B.1996, 157 p.Thesis

Map-free line-scanning tomographic optical microscopeSINKO, József; DUDAS, László; GAJDATSY, Gábor et al.Optics letters. 2011, Vol 36, Num 20, pp 4011-4013, issn 0146-9592, 3 p.Article

Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopyGUANGYI SHANG; CHEN WANG; HENING LEI et al.Surface and interface analysis. 2001, Vol 32, Num 1, pp 289-292, issn 0142-2421Conference Paper

Field enhancement of optical radiation in the nearfield of scanning probe microscope tipsJERSCH, J; DEMMING, F; HILDENHAGEN, L. J et al.Applied physics. A, Materials science & processing (Print). 1998, Vol 66, Num 1, pp 29-34, issn 0947-8396Article

Chemical and electrochemical study of fabrics coated with reduced graphene oxideMOLINA, J; FERNANDEZ, J; DEL RIO, A. I et al.Applied surface science. 2013, Vol 279, pp 46-54, issn 0169-4332, 9 p.Article