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A high-sensitivity alternating-gradient magnetometer for use in quantifying magnetic force microscopyGIBSON, G. A; SCHULTZ, S.Journal of applied physics. 1991, Vol 69, Num 8, pp 5880-5882, issn 0021-8979, 3 p., p.2BConference Paper

The point dipole approximation in magnetic force microscopyHARTMAN, U.Physics letters. A. 1989, Vol 137, Num 9, pp 475-478, issn 0375-9601, 4 p.Article

Nanotribology : friction on a nanometer scaleMARTI, O.Physica scripta. T. 1993, Vol 49B, pp 599-604, issn 0281-1847Conference Paper

Heterodyne force-detection for high frequency local dielectric spectroscopy by scanning Maxwell stress microscopyYOKOYAMA, H; JEFFERY, M. J; INOUE, T et al.Japanese journal of applied physics. 1993, Vol 32, Num 12B, pp L1845-L1848, issn 0021-4922, 2Article

Tunneling stabilized, magnetic force microscopy with a gold-coated nickel-film tipMORELAND, J; RICE, P.Journal of applied physics. 1991, Vol 70, Num 1, pp 520-522, issn 0021-8979Article

Modeling the behavior of the magnetic force microscopeBRYANT, P; SCHULTZ, S; FREDKIN, D. R et al.Journal of applied physics. 1991, Vol 69, Num 8, pp 5877-5879, issn 0021-8979, 3 p., p.2BConference Paper

Apparent and true feature heights in force microscopyBURNHAM, N. A.Applied physics letters. 1993, Vol 63, Num 1, pp 114-116, issn 0003-6951Article

Models for the stray field from magnetic tips used in magnetic force microscopyWADAS, A; HUG, H. J.Journal of applied physics. 1992, Vol 72, Num 1, pp 203-206, issn 0021-8979Article

Magnetic force microscope using a direct resonance frequency sensor operating in airKIKUKAWA, A; HOSAKA, S; HONDA, Y et al.Applied physics letters. 1992, Vol 61, Num 21, pp 2607-2609, issn 0003-6951Article

Magnetic force microscopy utilizing an ultrasensitive vertical cantilever geometryDICARLO, A; SCHEINFEIN, M. R; CHAMBERLIN, R. V et al.Applied physics letters. 1992, Vol 61, Num 17, pp 2108-2110, issn 0003-6951Article

Tip-structure effects on atomic force microscopy imagesTEKMAN, E; CIRACI, S.Journal of physics. Condensed matter (Print). 1991, Vol 3, Num 16, pp 2613-2619, issn 0953-8984, 7 p.Article

A high performance scanning force microscope head designCLARK, S. M; BALDESCHWIELER, J. D.Review of scientific instruments. 1993, Vol 64, Num 4, pp 904-907, issn 0034-6748Article

Fundamentals and special applications of non-contact scanning force microscopyHARTMANN, U.Advances in electronics and electron physics. 1994, Vol 87, pp 49-200, issn 0065-2539Article

Novel design for a compact fiber-optic scanning force microscopeBINGGELI, M; KOTROTSIOS, G; CHRISTOPH, R et al.Review of scientific instruments. 1993, Vol 64, Num 10, pp 2888-2891, issn 0034-6748Article

Interaction force detection in scanning probe microscopy : methods and applicationsDÜRIG, U; ZÜGER, O; STALDER, A et al.Journal of applied physics. 1992, Vol 72, Num 5, pp 1778-1798, issn 0021-8979Article

A magnetic force microscope using an optical lever sensor and its application to longitudinal recording mediaHONDA, Y; HOSAKA, S; KIKUGAWA, A et al.Japanese journal of applied physics. 1992, Vol 31, Num 8A, pp L1061-L1064, issn 0021-4922, 2Article

Low-temperature force microscope with all-fiber interferometerALBRECHT, T. R; GRÜTTER, P; RUGAR, D et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1638-1646, issn 0304-3991Conference Paper

Force microscopyBINNIG, G.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 7-15, issn 0304-3991Conference Paper

Micromachined silicon cantilevers and tips for bidirectional force microscopyBUSER, R. A; BRUGGER, J; DE ROOJI, N. F et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1476-1480, issn 0304-3991Conference Paper

Scan control and data acquisition for bidirectional force microscopyBRODBECK, D; HOWALD, L; LÜTHI, R et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1580-1584, issn 0304-3991Conference Paper

Local C(U) spectroscopy on chemically bounded Au55 clustersMÜLLER, F; MÜLLER, A.-D; PESCHEL, S et al.Surface and interface analysis. 1999, Vol 27, Num 5-6, pp 530-532, issn 0142-2421Conference Paper

Nanomanipulation of single DNA molecules and its applicationsHU, J; ZHANG, Y; LI, B et al.Surface and interface analysis. 2004, Vol 36, Num 2, pp 124-126, issn 0142-2421, 3 p.Conference Paper

An update on scanning force microscopiesLOUDER, D. R; PARKINSON, B. A.Analytical chemistry (Washington, DC). 1995, Vol 67, Num 9, pp 297A-303A, issn 0003-2700Article

A novel combined scanning tunnelling/scanning force microscopeHAMMICHE, A; WEBB, R. P; WILSON, I. H et al.Vacuum. 1994, Vol 45, Num 5, pp 575-577, issn 0042-207XConference Paper

Applications of scanning probe microscopy. III: Lateral and chemical force microscopy for mapping surface friction and adhesionHEATON, M. G; PRATER, C. B; KJOLLER, K. J et al.American laboratory (Fairfield). 1995, Vol 27, Num 16, issn 0044-7749, p. 16Article

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