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Heterodyne force-detection for high frequency local dielectric spectroscopy by scanning Maxwell stress microscopyYOKOYAMA, H; JEFFERY, M. J; INOUE, T et al.Japanese journal of applied physics. 1993, Vol 32, Num 12B, pp L1845-L1848, issn 0021-4922, 2Article

Tunneling stabilized, magnetic force microscopy with a gold-coated nickel-film tipMORELAND, J; RICE, P.Journal of applied physics. 1991, Vol 70, Num 1, pp 520-522, issn 0021-8979Article

Apparent and true feature heights in force microscopyBURNHAM, N. A.Applied physics letters. 1993, Vol 63, Num 1, pp 114-116, issn 0003-6951Article

Models for the stray field from magnetic tips used in magnetic force microscopyWADAS, A; HUG, H. J.Journal of applied physics. 1992, Vol 72, Num 1, pp 203-206, issn 0021-8979Article

Magnetic force microscope using a direct resonance frequency sensor operating in airKIKUKAWA, A; HOSAKA, S; HONDA, Y et al.Applied physics letters. 1992, Vol 61, Num 21, pp 2607-2609, issn 0003-6951Article

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Tip-structure effects on atomic force microscopy imagesTEKMAN, E; CIRACI, S.Journal of physics. Condensed matter (Print). 1991, Vol 3, Num 16, pp 2613-2619, issn 0953-8984, 7 p.Article

Fundamentals and special applications of non-contact scanning force microscopyHARTMANN, U.Advances in electronics and electron physics. 1994, Vol 87, pp 49-200, issn 0065-2539Article

Novel design for a compact fiber-optic scanning force microscopeBINGGELI, M; KOTROTSIOS, G; CHRISTOPH, R et al.Review of scientific instruments. 1993, Vol 64, Num 10, pp 2888-2891, issn 0034-6748Article

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A magnetic force microscope using an optical lever sensor and its application to longitudinal recording mediaHONDA, Y; HOSAKA, S; KIKUGAWA, A et al.Japanese journal of applied physics. 1992, Vol 31, Num 8A, pp L1061-L1064, issn 0021-4922, 2Article

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Micromachined silicon cantilevers and tips for bidirectional force microscopyBUSER, R. A; BRUGGER, J; DE ROOJI, N. F et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1476-1480, issn 0304-3991Conference Paper

Scan control and data acquisition for bidirectional force microscopyBRODBECK, D; HOWALD, L; LÜTHI, R et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1580-1584, issn 0304-3991Conference Paper

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Theoretical study of short- and long-range forces and atom transfer in scanning force microscopyCIRACI, S; TEKMAN, E; BARATOFF, A et al.Physical review. B, Condensed matter. 1992, Vol 46, Num 16, pp 10411-10422, issn 0163-1829Article

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Numerical simulations of a tapping-mode scanning force microscope operating in a liquidSARID, D; CHEN, J; WORKMAN, R. K et al.Computational materials science. 1995, Vol 3, Num 4, pp 475-480, issn 0927-0256Article

Phase controlled scanning force microscopeKIKUKAWA, A; HOSAKA, S; HONDA, Y et al.Japanese journal of applied physics. 1994, Vol 33, Num 9A, pp L1286-L1288, issn 0021-4922, 2Article

Scanning force microscopy at -25°CLUO, K; YORGANCIOGLU, M; KELLER, D et al.Ultramicroscopy. 1993, Vol 50, Num 2, pp 147-155, issn 0304-3991Article