AFM: A valid reference tool ?MARCHMAN, H. M; DUNHAM, N.SPIE proceedings series. 1998, pp 2-9, isbn 0-8194-2777-2Conference Paper

Measurement of pitch and width samples with the NIST calibrated atomic force microscopeDIXSON, R; KÖNING, R; VORBURGER, T. V et al.SPIE proceedings series. 1998, pp 420-432, isbn 0-8194-2777-2Conference Paper

An atomic-resolution atomic-force microscope implemented using an optical leverALEXANDER, S; HELLEMANS, L; MARTI, O et al.Journal of applied physics. 1989, Vol 65, Num 1, pp 164-167, issn 0021-8979Article

A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFMPUTMAN, C. A. J; DE GROOTH, B. G; VAN HULST, N. F et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1509-1513, issn 0304-3991Conference Paper

Atomic force microscope coupled with an optical microscopeKANEKO, R; OGUCHI, S; HARA, S et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1542-1548, issn 0304-3991Conference Paper

Force microscopy utilizing tunnel junction controlKIM, H. S; BRYANT, P. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 641-644, issn 0734-2101, 1Conference Paper

High-frequency circuit characterization using the AFM as a reactive near-field probeBRIDGES, G. E; THOMSON, D. J.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 321-328, issn 0304-3991Conference Paper

Laser thermal effects on atomic force microscope cantileversALLEGRINI, M; ASCOLI, C; BASCHIERI, P et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 371-378, issn 0304-3991Conference Paper

Micro-tribological evaluations of a polymer surface by atomic force microscopesHAMADA, E; KANEKO, R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 184-190, issn 0304-3991Conference Paper

Ternary and senary representations using DNA double-crossover tilesBYEONGHOON KIM; SOOJIN JO; SUNG HA PARK et al.Nanotechnology (Bristol. Print). 2014, Vol 25, Num 10, issn 0957-4484, 105601.1-105601.5Article

Characterization of Surface Coats of Bacterial Spores with Atomic Force Microscopy and WaveletsWEI SUN; ROMAGNOLI, Jose A; PALAZOGLU, Ahmet et al.Industrial & engineering chemistry research. 2011, Vol 50, Num 5, pp 2877-2883, issn 0888-5885, 7 p.Conference Paper

Atomic force microscopy: probing the spatial organization, interactions and elasticity of microbial cell envelopes at molecular resolutionSCHEURING, Simon; DUFRENE, Yves F.Molecular microbiology (Print). 2010, Vol 75, Num 6, pp 1327-1336, issn 0950-382X, 10 p.Article

Measurement of elastic properties of prostate cancer cells using AFMCORREIA FARIA, Elsa; NAN MA; GAZI, Ehsan et al.Analyst (London. 1877. Print). 2008, Vol 133, Num 11, pp 1498-1500, issn 0003-2654, 3 p.Article

Fabrication moléculaire : la prochaine révolution industrielle ? = Molecular fabrication : the next industrial revolution ?SPAAK, M.-L.Technologies internationales (Strasbourg). 1997, Num 31, pp 3-7, issn 1165-8568Article

Regulation of microcantilever response by force feedbackMERTZ, J; MARTI, O; MLYNEK, J et al.Applied physics letters. 1993, Vol 62, Num 19, pp 2344-2346, issn 0003-6951Article

A novel ZnO whisker tip for atomic force microscopyKADO, H; YOKOYAMA, K; TOHDA, T et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1659-1663, issn 0304-3991Conference Paper

An evaluation of the use of the atomic force microscope for studies in nanomechanicsCOHEN, S. R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 66-72, issn 0304-3991Conference Paper

Forces in atomic force microscopy in air and waterWEISENHORN, A. L; HANSMA, P. K; ALBRECHT, T. R et al.Applied physics letters. 1989, Vol 54, Num 26, pp 2651-2653, issn 0003-6951, 3 p.Article

Atomic force microscope detection system using an optical fiber heterodyne interferometer free from from external disturbancesOSHIO, T; NAKATANI, N; SAKAI, Y et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 310-314, issn 0304-3991Conference Paper

AFM image artifactsGOŁEK, F; MAZUR, P; RYSZKA, Z et al.Applied surface science. 2014, Vol 304, pp 11-19, issn 0169-4332, 9 p.Conference Paper

Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscopeKUWAHARA, Masashi; ABE, Hidekazu; TOKUMOTO, Hiroshi et al.Materials characterization. 2004, Vol 52, Num 1, pp 43-48, issn 1044-5803, 6 p.Article

Scan speed limit in atomic force microscopyBUTT, H.-J; SIEDLE, P; SEIFERT, K et al.Journal of microscopy (Print). 1993, Vol 169, pp 75-84, issn 0022-2720, 1Article

Theoretical analysis of the static deflection of plates for atomic force microscope applicationsSADER, J. E; WHITE, L.Journal of applied physics. 1993, Vol 74, Num 1, pp 1-9, issn 0021-8979Article

An AFM with integrated micro-fluorescence optics : design and performanceRADMACHER, M; EBERLE, K; GAUB, H. E et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 968-972, issn 0304-3991Conference Paper

Microfabrication of AFM tips using focused ion and electron beam techniquesXIMEN, H; RUSSELL, P. E.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1526-1532, issn 0304-3991Conference Paper