Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Microscopie force atomique")

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 30072

  • Page / 1203

Export

Selection :

  • and

AFM: A valid reference tool ?MARCHMAN, H. M; DUNHAM, N.SPIE proceedings series. 1998, pp 2-9, isbn 0-8194-2777-2Conference Paper

Measurement of pitch and width samples with the NIST calibrated atomic force microscopeDIXSON, R; KÖNING, R; VORBURGER, T. V et al.SPIE proceedings series. 1998, pp 420-432, isbn 0-8194-2777-2Conference Paper

An atomic-resolution atomic-force microscope implemented using an optical leverALEXANDER, S; HELLEMANS, L; MARTI, O et al.Journal of applied physics. 1989, Vol 65, Num 1, pp 164-167, issn 0021-8979Article

Feedforward Control of Piezoactuators in Atomic Force Microscope SystemsLEANG, Kam K; QINGZE ZOU; DEVASIA, Santosh et al.IEEE control systems. 2009, Vol 29, Num 1, pp 70-82, issn 1066-033X, 13 p.Article

Application of scanning probe microscopy in interfacial phenomena (Part II)DRELICH, Jaroslaw.Journal of adhesion science and technology. 2002, Vol 16, Num 7, issn 0169-4243, 249 p.Serial Issue

Proposal for a new optical device to sense AFM forcesDIASPRO, A; AGUILAR, M.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1668-1670, issn 0304-3991Conference Paper

Theoretical modelling of AFM for bimetallic tip-substrate interactionsBOZZOLO, G; FERRANTE, J.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 55-58, issn 0304-3991Conference Paper

A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFMPUTMAN, C. A. J; DE GROOTH, B. G; VAN HULST, N. F et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1509-1513, issn 0304-3991Conference Paper

Atomic force microscope coupled with an optical microscopeKANEKO, R; OGUCHI, S; HARA, S et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1542-1548, issn 0304-3991Conference Paper

Force microscopy utilizing tunnel junction controlKIM, H. S; BRYANT, P. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 4, pp 641-644, issn 0734-2101, 1Conference Paper

High-frequency circuit characterization using the AFM as a reactive near-field probeBRIDGES, G. E; THOMSON, D. J.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 321-328, issn 0304-3991Conference Paper

Laser thermal effects on atomic force microscope cantileversALLEGRINI, M; ASCOLI, C; BASCHIERI, P et al.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 371-378, issn 0304-3991Conference Paper

Micro-tribological evaluations of a polymer surface by atomic force microscopesHAMADA, E; KANEKO, R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 184-190, issn 0304-3991Conference Paper

Ternary and senary representations using DNA double-crossover tilesBYEONGHOON KIM; SOOJIN JO; SUNG HA PARK et al.Nanotechnology (Bristol. Print). 2014, Vol 25, Num 10, issn 0957-4484, 105601.1-105601.5Article

Characterization of Surface Coats of Bacterial Spores with Atomic Force Microscopy and WaveletsWEI SUN; ROMAGNOLI, Jose A; PALAZOGLU, Ahmet et al.Industrial & engineering chemistry research. 2011, Vol 50, Num 5, pp 2877-2883, issn 0888-5885, 7 p.Conference Paper

Atomic force microscopy: probing the spatial organization, interactions and elasticity of microbial cell envelopes at molecular resolutionSCHEURING, Simon; DUFRENE, Yves F.Molecular microbiology (Print). 2010, Vol 75, Num 6, pp 1327-1336, issn 0950-382X, 10 p.Article

Measurement of elastic properties of prostate cancer cells using AFMCORREIA FARIA, Elsa; NAN MA; GAZI, Ehsan et al.Analyst (London. 1877. Print). 2008, Vol 133, Num 11, pp 1498-1500, issn 0003-2654, 3 p.Article

Fabrication moléculaire : la prochaine révolution industrielle ? = Molecular fabrication : the next industrial revolution ?SPAAK, M.-L.Technologies internationales (Strasbourg). 1997, Num 31, pp 3-7, issn 1165-8568Article

Regulation of microcantilever response by force feedbackMERTZ, J; MARTI, O; MLYNEK, J et al.Applied physics letters. 1993, Vol 62, Num 19, pp 2344-2346, issn 0003-6951Article

A novel ZnO whisker tip for atomic force microscopyKADO, H; YOKOYAMA, K; TOHDA, T et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1659-1663, issn 0304-3991Conference Paper

An evaluation of the use of the atomic force microscope for studies in nanomechanicsCOHEN, S. R.Ultramicroscopy. 1992, Vol 42-44, Num A, pp 66-72, issn 0304-3991Conference Paper

Forces in atomic force microscopy in air and waterWEISENHORN, A. L; HANSMA, P. K; ALBRECHT, T. R et al.Applied physics letters. 1989, Vol 54, Num 26, pp 2651-2653, issn 0003-6951, 3 p.Article

Atomic force microscopyTENDLER, Saul J. B; WILLIAMS, Philip M.Analytica chimica acta. 2003, Vol 479, Num 1, issn 0003-2670, 117 p.Serial Issue

Early detection of cytotoxic events between hepatic natural killer cells and colon carcinoma cells as probed with the atomic force microscopeBRAET, F; VERMIJLEN, D; BOSSUYT, V et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 265-273, issn 0304-3991Article

Scanned-cantilever atomic force microscopeBASELT, D. R; BALDESCHWIELER, J. D.Review of scientific instruments. 1993, Vol 64, Num 4, pp 908-911, issn 0034-6748Article

  • Page / 1203