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Results 1 to 25 of 775

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Combined scanning near field optical and force microscopyVAN HULST, N. F; MOERS, M. H. P; TACK, R. G et al.Microscopy research and technique. 1993, Vol 25, Num 2, pp 177-178, issn 1059-910XConference Paper

Near-field scanning optical microscopy : Electromagnetic coupling between the aperture tip and the sampleGU, B.-Y; LI, Z.-Y; YANG, G.-Z et al.SPIE proceedings series. 1998, pp 156-165, isbn 0-8194-2715-2Conference Paper

Cloaking apertureless near-field scanning optical microscopy tipsBILOTTI, Filiberto; TRICARICO, Simone; PIERINI, Francesco et al.Optics letters. 2011, Vol 36, Num 2, pp 211-213, issn 0146-9592, 3 p.Article

Operation of a wet near-field scanning optical microscope in stable zones by minimizing the resonance change of tuning forksPARK, Kyoung-Duck; DOO JAE PARK; SEUNG GOL LEE et al.Nanotechnology (Bristol. Print). 2014, Vol 25, Num 7, issn 0957-4484, 075704.1-075704.7Article

Fresh fruit ― microstructure, texture and qualityWOOD, Delilah F; IMAM, Syed H; ORTS, William J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781J.1-73781J.12Conference Paper

A novel tapping SNOM : Specifications and performancesLONGO, G; GIRASOLE, M; CRICENTI, A et al.Physica status solidi. B. Basic research. 2005, Vol 242, Num 15, pp 3070-3074, issn 0370-1972, 5 p.Conference Paper

Micromachining of diamond using near-field scanning optical microscopeSMOLYANINOV, Igor I; DAVIS, Christopher C.Materials letters (General ed.). 2002, Vol 52, Num 6, pp 408-411, issn 0167-577XArticle

Latex bead projection NanopatternsFISCHER, U. C; HEIMEL, J; MAAS, H.-J et al.Surface and interface analysis. 2002, Vol 33, Num 2, pp 75-80, issn 0142-2421Conference Paper

New dimension in nano-imaging: breaking through the diffraction limit with scanning near-field optical microscopyRASMUSSEN, Akiko; DECKERT, Volker.Analytical and bioanalytical chemistry. 2005, Vol 381, Num 1, pp 165-172, 8 p.Article

Ultrafast goes localACHERMANN, M; SIEGNER, U; KELLER, U et al.Materials science forum. 2002, pp 233-240, issn 0255-5476, isbn 0-87849-890-7Conference Paper

Prospects of apertureless SNOM with active probes : Electromagnetic opticsSANDOGHDAR, V; MLYNEK, J.Journal of optics. A, Pure and applied optics (Print). 1999, Vol 1, Num 4, pp 523-530, issn 1464-4258Conference Paper

Nano-Optical Microscopy: Now and Its IndustrializationWU SHIFA; WANG ZHAO; ZHANG JIAN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7658, issn 0277-786X, isbn 978-0-8194-8088-0, 76580O.1-76580O.9, 2Conference Paper

Sensitivity investigation of the different direction vibrations of a SNOM probeLU, Deng-Maw; CHANG, Feng-I.Optics communications. 2008, Vol 281, Num 18, pp 4771-4775, issn 0030-4018, 5 p.Article

Differential near-field scanning optical microscopyOZCAN, Aydogan; CUBUKCU, Ertugrul; BILENCA, Alberto et al.Nano letters (Print). 2006, Vol 6, Num 11, pp 2609-2616, issn 1530-6984, 8 p.Article

Cartographie de la densité locale d'états photoniques de surface = Local density photonic surface state cartographyCOLAS DES FRANCS, G; GIRARD, C; DAVID, T et al.Journal de physique. IV. 2006, Vol 135, pp 129-130, issn 1155-4339, 2 p.Conference Paper

Mapping of surface refractive-index distribution by reflection SNOMRADKO, Ilya P; VOLKOV, Valentyn S; BOZHEVOLNYI, Sergey I et al.Proceedings of SPIE. 2005, pp 585807.1-585807.7, isbn 0-8194-5858-9, 1VolConference Paper

Das Rasterkraftmikroskop : Ein Werkzeug zum Tasten, Ziehen und Graben für die NanowissenschaftWeitze, Marc-Denis.Naturwissenschafts- und Technikgeschichte - Originale, Modelle und Rekonstruktionen. 2003, isbn 3-928186-72-8, 52 p., isbn 3-928186-72-8Book

Theoretical investigations of a coaxial probe concept for scanning near-field optical microscopyRUDOW, O; VOLLKOPF, A; MÜLLER-WIEGAND, M et al.Optics communications. 2001, Vol 189, Num 4-6, pp 187-192, issn 0030-4018Article

Modulation imaging in reflection-mode near-field scanning optical microscopyKERIMO, J; BÜCHLER, M; SMYRL, W. H et al.Ultramicroscopy. 2000, Vol 84, Num 3-4, pp 127-131, issn 0304-3991Article

Near-field optical investigation of porous silicon samplesALLEGRINI, M; FUSO, F; LABARDI, M et al.Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic properties. 2000, Vol 80, Num 4, pp 611-621, issn 1364-2812Conference Paper

Numerical comparison between constant-height and constant-intensity images in scanning near field optical microscopyMUFEI XIAO; XIN CHEN.Optics communications. 1999, Vol 168, Num 1-4, pp 25-34, issn 0030-4018Article

Subdiffraction-limit light microscopy with specific application to silver halide researchVAEZ-IRAVANI, M.The Journal of imaging science and technology. 1998, Vol 42, Num 1, pp 31-38, issn 1062-3701Article

The use of a near-field probe for the study of semiconductor heterostructuresSTEVENSON, R; RICHARDS, D.Semiconductor science and technology. 1998, Vol 13, Num 8, pp 882-886, issn 0268-1242Article

Electromagnetic near field induced by surface defects in microstructuresLI, Z.-Y; YANG, G.-Z; GU, B.-Y et al.SPIE proceedings series. 1997, pp 338-347, isbn 0-8194-2419-6Conference Paper

Near-field microscopy moves into the mainstreamCOLLINS, G. J.Laser focus world. 1995, Vol 31, Num 11, pp 104-107, issn 1043-8092Article

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