kw.\*:("Microscopio barrido")
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Microscopic examination on cytological changes in Allium cepa and shift in phytoplankton population at different doses of AtrazineGHOSH, Nabarun; FINGER, Kristen; USNICK, Samantha et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77291W.1-77291W.14Conference Paper
The Bayesian approach to reporting GSR analysis results: some first-hand experiencesCHARLES, Sebastien; NYS, Bart.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77291B.1-77291B.15Conference Paper
Scanning force microscope using Point diffraction interferometerMOUXU DONG; YOU YIFENG; ZHUO YONGMO et al.SPIE proceedings series. 1998, pp 482-487, isbn 0-8194-2777-2Conference Paper
Scanning microsensors for nanotechnologySTEDMAN, M.Sensors and actuators. A, Physical. 1993, Vol 37-38, pp 11-15, issn 0924-4247Conference Paper
Opto-mechanical analysis for confocal laser scanning microscopesCHANG, Gao-Wei; TWU, Ming-Jenq; LIN, Yu-Hsuan et al.SPIE proceedings series. 2005, pp 587710.1-587710.9, isbn 0-8194-5882-1, 1VolConference Paper
A scanning confocal microscope for transmission and reflection imagingDIXON, A. E; DAMASKINOS, S; ATKINSON, M. R et al.Nature (London). 1991, Vol 351, Num 6327, pp 551-553, issn 0028-0836, 3 p.Article
A versatile scanning tunnelling microscope for use in airSTEER, W. S; HOFFMANN-MILLACK, B; ROBERTS, C. J et al.Measurement science & technology (Print). 1990, Vol 1, Num 9, pp 881-886, issn 0957-0233Article
Dynamic observation of Si(111) surface using a fast scanning tunneling microscopeHOSAKA, S; HASEGAWA, T; HOSOKI, S et al.Applied physics letters. 1990, Vol 57, Num 2, pp 138-140, issn 0003-6951Article
Scanning Electron Microscopy in characterizing seeds of some Leguminous treesGHOSH, Nabarun; CHATTERJEE, Amiyangshu; SMITH, Don W et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781I.1-7378I.14Conference Paper
Magnetically controlled coarse approach device for STMHE JIAN; WANG LANPING; CHANG YUE et al.Measurement science & technology (Print). 1990, Vol 1, Num 10, pp 1116-1118, issn 0957-0233Article
Resolution enhancement in three-dimensional confocal microscopyHEWLETT, S. J; WILSON, T.Machine vision and applications. 1991, Vol 4, Num 4, pp 233-242, issn 0932-8092Article
Scanning Methods Applied to Bitemark AnalysisBUSH, Peter J; BUSH, Mary A.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 772915.1-772915.8Conference Paper
Investigation into Sources of Random Uncertainties in the NanoScan-3Di Metrological Scanning Probe MicroscopeGOGOLINSKII, K. V; GUBSKII, K. L; KUZNETSOV, A. P et al.Nanotechnologies in Russia (Print). 2013, Vol 8, Num 5-6, pp 337-341, issn 1995-0780, 5 p.Article
Three-dimensional in vivo scanning microscopy with inertia-free focus controlMASCHIO, Marco Dal; STASI, Angela Michela De; BENFENATI, Fabio et al.Optics letters. 2011, Vol 36, Num 17, pp 3503-3505, issn 0146-9592, 3 p.Article
On the relationship between hidden Markov Models and convex functional transforms for simulating Scanning Probe MicroscopyADENLE, Omolabake A; FITZGERALD, William J.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737814.1-737814.8Conference Paper
Assessment of fluorochromes for two-photon laser scanning microscopy of biofilmsNEU, Thomas R; KUHLICKE, Ute; LAWRENCE, John R et al.Applied and environmental microbiology (Print). 2002, Vol 68, Num 2, pp 901-909, issn 0099-2240, 9 p.Article
Combined shear force and near-field scanning optical microscopyBETZIG, E; FINN, P. L; WEINER, J. S et al.Applied physics letters. 1992, Vol 60, Num 20, pp 2484-2486, issn 0003-6951Article
Description of the defocus effects of an acoustic reflection scanning microscope (SAM)BLOCK, H; BOSECK, S; HEYGSTER, G et al.Optik (Stuttgart). 1990, Vol 86, Num 1, pp 27-37, issn 0030-4026Article
The role of detector geometry in confocal imagingWILSON, T.Journal of microscopy (Print). 1990, Vol 158, pp 133-144, issn 0022-2720, 3Article
Miniature electrostatic column for a compact scanning electron microscopeAMBE, T; TANAKA, H; TEGURI, H et al.Microelectronic engineering. 2002, Vol 61-62, pp 317-321, issn 0167-9317Conference Paper
Scanning electrochemical microscopy. XV: Improvements in imaging via tip-position modulation and lock-in detectionWIPF, D. O; BARD, A. J.Analytical chemistry (Washington, DC). 1992, Vol 64, Num 13, pp 1362-1367, issn 0003-2700Article
Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopyWILLIAMS, C. C; SLINKMAN, J; HOUGH, W. P et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1990, Vol 8, Num 2, pp 895-898, issn 0734-2101Article
Two-photon laser scanning fluorescence microscopyDENK, W; STRICKLER, J. H; WEBB, W. W et al.Science (Washington, D.C.). 1990, Vol 248, Num 4951, pp 73-76, issn 0036-8075Article
Fresh fruit ― microstructure, texture and qualityWOOD, Delilah F; IMAM, Syed H; ORTS, William J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781J.1-73781J.12Conference Paper
Calibration of transfer standards for SPMGAO-FENG; PENG, G.-S; KOENDERS, L et al.Microelectronic engineering. 1998, Vol 41-42, pp 615-618, issn 0167-9317Conference Paper