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Studies on scattering of fast H and He atoms from fe films grown on Cu(001)BARON, M; BERNHARD, T; GRUYTERS, M et al.Surface science. 2006, Vol 600, Num 18, pp 3924-3927, issn 0039-6028, 4 p.Conference Paper

Surface bismuth removal after Bi nanoline encapsulation in siliconYAGI, Shuhei; YASHIRO, Wataru; SAKAMOTO, Kunihiro et al.Surface science. 2005, Vol 595, Num 1-3, pp L311-L317, issn 0039-6028Article

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Oxidation of TiAl surface with hyperthermal oxygen molecular beamsHASHINOKUCHI, Michihiro; TODE, Mayumi; YOSHIGOE, Akitaka et al.Applied surface science. 2013, Vol 276, pp 276-283, issn 0169-4332, 8 p.Article

Controllable growth of semiconductor nanometer structuresWANG, Z. G; WU, J.Microelectronics journal. 2003, Vol 34, Num 5-8, pp 379-382, issn 0959-8324, 4 p.Conference Paper

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Diagnosis of hydrogen ions (H⁺, H⁺2, H⁺3, H^-) from the near-electrode region of dielectric barrier discharge plasmasWENCHUN WANG; YONG XU; WEIGUO WANG et al.Journal of physics. D, Applied physics (Print). 2004, Vol 37, Num 8, pp 1185-1189, issn 0022-3727, 5 p.Article

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Thermal imaging of wafer temperature in MBE using a digital cameraJACKSON, A. W; GOSSARD, A. C.Journal of crystal growth. 2007, Vol 301-302, pp 105-108, issn 0022-0248, 4 p.Conference Paper

Three decades of molecular beam epitaxyFOXON, C. T.Journal of crystal growth. 2003, Vol 251, Num 1-4, pp 1-8, issn 0022-0248, 8 p.Conference Paper