Colour selection in the channel-multiplier CRTMANSELL, J. R; WOODHEAD, A. W; KNAPP, A. G et al.IEE proceedings. Part I. Solid-state and electron devices. 1984, Vol 131, Num 1, pp 13-16, issn 0143-7100Article

Flat deflection system for a channel multiplier CRTLAMPORT, D. L; WOODHEAD, A. W; WASHINGTON, D et al.IEE proceedings. Part I. Solid-state and electron devices. 1984, Vol 131, Num 1, pp 10-12, issn 0143-7100Article

Effects of electrode structure on output electron energy distribution of microchannel platesKOSHIDA, N.Review of scientific instruments. 1986, Vol 57, Num 3, pp 354-358, issn 0034-6748Article

Large-area channel electron multiplier for CRT applicationsKNAPP, A. G; WASHINGTON, D; GUEST, A. J et al.IEE proceedings. Part I. Solid-state and electron devices. 1984, Vol 131, Num 1, pp 6-9, issn 0143-7100Article

Design of proximity-focused electron lensesLYONS, A.Journal of physics. E. Scientific instruments. 1985, Vol 18, Num 2, pp 127-128, issn 0022-3735Article

Gain degradation mechanism for channel electron multipliersLICHTENSTEIGER, M; WEBB, C.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1984, Vol 2, Num 4, pp 1513-1515, issn 0734-2101Article

Characteristics of a channel electron multiplier for detection of positive ionTAKAGI, S; KAWASUMI, Y; NODA, N et al.Japanese journal of applied physics. 1983, Vol 22, Num 9, pp 1453-1459, issn 0021-4922Article

Continuous dynode electron multiplier using lead zirconate titanate ceramicDIXIT, A. V; BHORASKAR, S. V.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1985, Vol 3, Num 6, pp 2211-2212, issn 0734-2101Article

Channel multiplier compatible materials and lifetime testsMCCOMAS, D. J; BAME, S. J.Review of scientific instruments. 1984, Vol 55, Num 4, pp 463-467, issn 0034-6748Article

IMAGE TUBES (INCLUDING CHANNEL MULTIPLIER ARRAYS)1972; ADV. ELECTRON. ELECTRON PHYS.; U.S.A.; DA. 1972; VOL. 33A; PP. 83-205; BIBL. DISSEM.Serial Issue

CARACTERISTIQUES TEMPORELLES DES MULTIPLICATEURS A CANAUX VEHU-6BAKHTIZIN RZ; YUMAGUZIN YU M.1982; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1982; NO 2; PP. 145-146; BIBL. 4 REF.Article

RESPONSE OF A CHEVRON MICROCHANNEL PLATE TO 2.5 AND 14 MEV NEUTRONSMEDLEY SS; PERSING R.1981; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1981; VOL. 52; NO 10; PP. 1463-1468; BIBL. 6 REF.Article

CHANGEMENT DES PARAMETRES DES MULTIPLICATEURS ELECTRONIQUES A CANAUX PENDANT LEUR STOCKAGESHYUTTE NM; PUOLOKAJNEN AI; VOLKOV GI et al.1981; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1981; NO 3; PP. 172-174; BIBL. 6 REF.Article

CERAMIC SECONDARY ELECTRON MULTIPLIER FOR ELECTRON AND ION DETECTION.EHARA S; WAKINO K; YAMAMOTO H et al.1974; JAP. ELECTRON. ENGNG; JAP.; DA. 1974; NO 91; PP. 42-47 (5P.)Article

PRELIMINARY RESULTS WITH SATURABLE MICROCHANNEL ARRAY PLATES.TIMOTHY JG.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 6; PP. 834-837; BIBL. 9 REF.Article

MAQUETTE DEMONTABLE D'UN AMPLIFICATEUR DE BRILLANCE DE L'IMAGE A ETAGE AMPLIFICATEUR A MICROCANAUXPLETNEVA NI; SEMENOV EP.1974; OPT.-MEKH. PROMYSL.; S.S.S.R.; DA. 1974; VOL. 41; NO 4; PP. 56-57; BIBL. 6 REF.Article

UNTERSUCHUNGEN ZUR STABILITAET DER VERSTAERKUNG VON KANAL-SEV BEIM AUSHEIZEN IM HOCHVAKUUM. = ETUDES SUR LA STABILITE DE L'AMPLIFICATION DE MULTIPLICATEURS D'ELECTRONS SECONDAIRES DE GENRE CANAL CHAUFFES DANS UN VIDE ELEVEBLASEK G; GUTTER D.1974; EXPER. TECH. PHYS.; DTSCH.; DA. 1974; VOL. 22; NO 6; PP. 597-603; ABS. ANGL. RUSSE; BIBL. 8 REF.Article

INFLUENCE DES CONDITIONS D'EXPLOITATION SUR L'AMPLIFICATION ET LA RESOLUTION DES SYSTEMES DE PLAQUETTES A MICRO-CANAUXTYUTIKOV AM; KRAVCHIK GS.1974; OPT.-MEKH. PROMYSL.; S.S.S.R.; DA. 1974; VOL. 41; NO 10; PP. 6-9; BIBL. 8 REF.Article

USE OF OPEN-STRUCTURE CHANNEL ELECTRON MULTIPLIERS IN SOUNDING ROCKET EXPERIMENTSTIMOTHY JG.1973; REV. SCI. INSTRUM.; U.S.A.; DA. 1973; VOL. 44; NO 2; PP. 207-211; BIBL. 4 REF.Serial Issue

DETERMINATION DU GAIN DES MULTIPLICATEURS ELECTRONIQUES A CANAUX A DISTRIBUTION D'AMPLITUDE EXPONENTIELLE DE LA CHARGE A LA SORTIEMAR'IN BV; TEL'TSOV MV.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 1; PP. 164-165; BIBL. 4 REF.Article

REVERSIBILITY OF PARAMETER CHANGES OF MICROCHANNEL ELECTRON MULTIPLIERS DUE TO OUTGASSING.RAGER JP; RENAUD JF; TEZENAS DU MONTCEL V et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 7; PP. 927-928; BIBL. 4 REF.Article

MICROCHANNEL PLATE READ-OUT USING GRADED-DENSITY ELECTRODESSMITH GC; PEARSON JF; MATHIESON E et al.1982; NUCL. INSTRUM. METHODS PHYS. RES.; ISSN 0167-5087; NLD; DA. 1982; VOL. 192; NO 2-3; PP. 383-386; BIBL. 12 REF.Article

PLAQUES MICROCANAUX EN PHYSIQUE EXPERIMENTALE (REVUE)DMITRIEV VD; LUK'YANOV SM; PENIONZHKEVICH YU EH et al.1982; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1982; NO 2; PP. 7-18; BIBL. 69 REF.Article

CARACTERISTIQUES DES MULTIPLICATEURS ELECTRONIQUES A CANAUX AVEC PAVILLON A L'ENTREEAJNBUND MR; KOVALENKO VG; POLENOV BV et al.1974; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1974; NO 4; PP. 154-156; BIBL. 10 REF.Article

Proceedings. B/Photo-electronic image devices, 8th symposium, London, September 5-7, 1983MORGAN, B. L.Advances in electronics and electron physics. 1985, Vol 64, pp 299-680, issn 0065-2539, BConference Proceedings