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MOESSBAUER STUDY OF AN IRON-CONTAINING SODIUM DISILICATE GLASS.JACH J; NABATIAN D.1977; SEMICONDUCT. AND INSULAT.; G.B.; DA. 1977; VOL. 3; NO 1; PP. 33-41; BIBL. 2 REF.Article

A MOESSBAUER STUDY OF THE REACTION BETWEEN FE AND SODIUM DISILICATE GLASS.JACH J; NABATIAN D.1977; SEMICONDUCT. AND INSULAT.; G.B.; DA. 1977; VOL. 3; NO 1; PP. 23-32; BIBL. 7 REF.Article

Low-K dielectric for high frequency microcircuitsNABATIAN, D. J; FENG HE; KELLERMAN, D et al.SPIE proceedings series. 1997, pp 60-64, isbn 0-930815-50-5Conference Paper

RF characterization of thick film materials for portable transceiversHARRER, J; PETIT, R; BROWN, O et al.The International journal of microcircuits and electronic packaging. 1997, Vol 20, Num 2, pp 116-123, issn 1063-1674Article

Thick film conductors for 175°C operation in automotive electronicsNABATIAN, D; SHAHBAZI, S; BROWN, O et al.SPIE proceedings series. 1997, pp 522-528, isbn 0-930815-50-5Conference Paper

Thick film resistors for high power and current sensing applicationsNABATIAN, D. J; BROWN, O. W; DURANT, J. E et al.SPIE proceedings series. 1999, pp 124-130, isbn 0-930815-58-0Conference Paper

Low dielectric constant thick film silver and gold systems characterization for high frequency Ceramic substratesKELLERMAN, D; NABATIAN, D. J; RETHERFORD, L et al.SPIE proceedings series. 1998, pp 795-801, isbn 0-930815-52-1Conference Paper

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