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A TECHNIQUE TO IMPROVE THE SENSITIVITY OF THIN FILM INSB MAGNETORESISTORSNADKARNI GS.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 87; NO 1; PP. 17-21; BIBL. 8 REF.Article

ON THE THEORY AND ANALYSES OF THE AC CHARACTERISTICS OF DEFECT THIN FILMS.NADKARNI GS; SIMMONS JG.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 9; PP. 4223; BIBL. 3 REF.Article

THEORY AND ANALYSES OF THE AC CHARACTERISTICS OF DEFECT THIN-FILM INSULATORS.NADKARNI GS; SIMMONS JG.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 1; PP. 114-119; BIBL. 17 REF.Article

DETERMINATION OF THE DEFECT NATURE OF MOO3 FILMS USING DIELECTRIC-RELAXATION CURRENTSNADKARNI GS; SIMMONS JG.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 9; PP. 3650-3656; BIBL. 13 REF.Serial Issue

AC ELECTRICAL PROPERTIES AND I-V CHARACTERISTICS OF MOO3 FILM UNDER DC BIASNADKARNI GS; SIMMONS JG.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 9; PP. 3741-3747; BIBL. 7 REF.Serial Issue

STEADY-STATE AND NON-STEADY-STATE CURRENT FLOW IN THIN-FILM AL-CEF3-AL SAMPLES.SIMMONS JG; NADKARNI GS.1975; PHYS. REV., B; U.S.A.; DA. 1975; VOL. 12; NO 12; PP. 5459-5464; BIBL. 19 REF.Article

TEMPERATURE DEPENDENCE OF THIN FILM METAL/MOO3/METAL CAPACITORSNADKARNI GS; SHIRODKAR VS; SIMMONS JG et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 94; NO 2; PP. 101-109; BIBL. 8 REF.Article

ELECTRICAL PROPERTIES OF THIN-FILM AL-CEF3-AL CAPACITORS.KALRA AD; SIMMONS JG; NADKARNI GS et al.1975; J. APPL. PHYS.; U.S.A.; DA. 1975; VOL. 46; NO 12; PP. 5076-5079; BIBL. 5 REF.Article

FABRICATION OF HIGH SENSITIVITY THIN-FILM INDIUM ANTIMONIDE MAGNETORESISTORS.NADKARNI GS; SIMONI A; SIMMONS JG et al.1975; SOLID-STATE ELECTRON.; G.B.; DA. 1975; PP. 393-397; BIBL. 9 REF.Article

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