OPTICAL ANALYSIS OF NON-ABSORBING DOUBLE LAYERS BY MEANS OF IMMERSION REFLECTOMETRY. I: LIQUID IMMERSION METHODOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 245-251; BIBL. 8 REF.Article

DETERMINATION OF THE OPTICAL PARAMETERS AND PACKING DENSITY OF NON-ABSORBING COLUMNAR THIN FILMS BY MEANS OF IMMERSION REFLECTOMETRY: APPLICATION TO LIF THIN FILMSOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 74; NO 1; PP. 51-58; BIBL. 12 REF.Article

OPTICAL ANALYSIS OF NON-ABSORBING DOUBLE LAYERS BY MEANS OF IMMERSION REFLECTOMETRY. II: SOLID STATE IMMERSION METHODOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 71; NO 1; PP. 91-102; BIBL. 8 REF.Article

THE PHYSICAL STRUCTURE OF THE INTERFACE BETWEEN SINGLECRYSTAL GAAS AND ITS OXIDE FILMNAVRATIL K; OHLIDAL I; LUKES F et al.1979; THIN SOLID FILMS; NLD; DA. 1979; VOL. 56; NO 1-2; PP. 163-171; BIBL. 11 REF.Article

ROUGH SILICON SURFACES STUDIED BY OPTICAL METHODS.OHLIDAL I; LUKES F; NAVRATIL K et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 1; PP. 91-116; BIBL. 1 P.Article

SIMPLE METHOD FOR THE COMPLETE OPTICAL ANALYSIS OF VERY THICK AND WEAKLY ABSORBING FILMSOHLIDAL I; NAVRATIL K; SCHMIDT E et al.1982; APPLIED PHYSICS. A, SOLIDS AND SURFACES; ISSN 0721-7250; DEU; DA. 1982; VOL. 29; NO 3; PP. 157-162; BIBL. 22 REF.Article

A MODEL OF OXIDE FILM ORIGINATING AT THERMAL OXIDATION OF GAAS.NAVRATIL K; OHLIDAL I; LUKES F et al.1977; CZECHOSL. J. PHYS.; CZECHOSL.; DA. 1977; VOL. B27; NO 6; PP. 672-681; H.T. 1; BIBL. 17 REF.Article

THIN ORGANOSILICON (OMTS) FILMS FORMED BY PLASMA POLYMERIZATION PROCESS IN RF DISCHARGEJANCA J; AMBROZ L; NAVRATIL K et al.1978; SCRIPTA FAC. SCI. NAT. UNIV. PURKYN. BRUN.; CSK; DA. 1978; VOL. 8; NO 5; PP. 51-60; ABS. RUS; BIBL. 19 REF.Article

Simple method of spectroscopic reflectometry for the complete optical analysis of weakly absorbing thin films: application to silicon filmsOHLIDAL, I; NAVRATIL, K.Thin solid films. 1988, Vol 156, Num 2, pp 181-189, issn 0040-6090Article

Complete optical analysis of a non-absorbing thin film on an absorbing substrate by a new method of immersion spectroscopic reflectometryOHLIDAL, I; NAVRATIL, K.Thin solid films. 1987, Vol 148, Num 1, pp 17-27, issn 0040-6090Article

Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometryOHLIDAL, I; NAVRATIL, K.Applied optics. 1985, Vol 24, Num 16, pp 2690-2695, issn 0003-6935Article

A new method for the complete optical analysis of weakly absorbing thin films: application to polycrystalline silicon filmsOHLIDAL, I; NAVRATIL, K; MUSILOVA, J et al.Thin solid films. 1985, Vol 127, Num 3-4, pp 191-203, issn 0040-6090Article

Optical properties of thin films of poly(methyl-phenylsilylene)NAVRATIL, K; SIK, J; HUMLICEK, J et al.Optical materials (Amsterdam). 1999, Vol 12, Num 1, pp 105-113, issn 0925-3467Article

Influence of oxygen concentration on optical properties of semi-insulating polycrystalline silicon filmsKUCIRKOVA, A; NAVRATIL, K; PAJASOVA, L et al.Applied physics. A, Materials science & processing (Print). 1996, Vol 63, Num 5, pp 495-503, issn 0947-8396Article

Effizienzsteigernde Dienstleistungen : innovative Kundenbindungskonzepte = Increasing efficiency of contractors : innovative client commitment conceptsNAVRATIL, K; SCHWARZE, R; WISBEREIT, S et al.ET. Energiewirtschaftliche Tagesfragen. 2000, Vol 50, Num 1-2, pp 25-28, issn 0720-6240Conference Paper

A note on the study of the refractive index of As₂S₃ films evaporated onto glass substratesLUKES, F; NAVRATIL, K; CIMPL, Z et al.Physica status solidi. A. Applied research. 1991, Vol 124, Num 2, pp K145-K148, issn 0031-8965Article

Vibrational modes in germanium-rich Si_xGe_1-x alloysHUMLICEK, J; NAVRATIL, K; KEKOUA, M. G et al.Solid state communications. 1990, Vol 76, Num 3, pp 243-246, issn 0038-1098, 4 p.Article

Ellipsometric and reflectance studies of Ga/As/AlAs superlatticesHUMLICEK, J; LUKES, F; NAVRATIL, K et al.Applied physics. A, Solids and surfaces. 1989, Vol 49, Num 4, pp 407-412, issn 0721-7250Article

Optical properties of natural glasses-moldavitesZAVETOVA, M; PACESOKA, S; SIMECKOVA, M et al.Journal of non-crystalline solids. 1989, Vol 108, Num 3, pp 294-300, issn 0022-3093Article

Exciton-polariton edge of GaAs : MBE layers between multiple-quantum-well structuresHUMLICEK, J; BOCANEK, L; NAVRATIL, K et al.Solid state communications. 1995, Vol 93, Num 9, pp 725-728, issn 0038-1098Article

Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)BONAVENTUROVA ZRZAVECKA, O; NEBOJSA, A; NAVRATIL, K et al.Thin solid films. 2004, Vol 455-56, pp 278-282, issn 0040-6090, 5 p.Conference Paper

Study of thin oxide films by ellipsometry and ARXPSTICHOPADEK, P; NEBOJSA, A; CECHAL, J et al.Surface and interface analysis. 2002, Vol 34, Num 1, pp 531-534, issn 0142-2421Conference Paper

Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometryFRANTA, D; OHLIDAL, I; MUNZAR, D et al.Thin solid films. 1999, Vol 343-4, pp 295-298, issn 0040-6090Conference Paper

In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin filmsSPOUSTA, J; URBANEK, M; CHMELIK, R et al.Surface and interface analysis. 2002, Vol 34, Num 1, pp 664-667, issn 0142-2421Conference Paper

Deposition of metal nitrides by IBADSIKOLA, T; SPOUSTA, J; CESKA, R et al.Surface & coatings technology. 1998, Vol 108-09, Num 1-3, pp 284-291, issn 0257-8972Conference Paper