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OPTICAL ANALYSIS OF NON-ABSORBING DOUBLE LAYERS BY MEANS OF IMMERSION REFLECTOMETRY. I: LIQUID IMMERSION METHODOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 245-251; BIBL. 8 REF.Article

DETERMINATION OF THE OPTICAL PARAMETERS AND PACKING DENSITY OF NON-ABSORBING COLUMNAR THIN FILMS BY MEANS OF IMMERSION REFLECTOMETRY: APPLICATION TO LIF THIN FILMSOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 74; NO 1; PP. 51-58; BIBL. 12 REF.Article

OPTICAL ANALYSIS OF NON-ABSORBING DOUBLE LAYERS BY MEANS OF IMMERSION REFLECTOMETRY. II: SOLID STATE IMMERSION METHODOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 71; NO 1; PP. 91-102; BIBL. 8 REF.Article

INFLUENCE OF THE PROPERTIES OF THIN FILMS ON THE DETERMINATION OF THE RELATIVE REFLECTANCE OF A RANDOMLY ROUGH SURFACE.OHLIDAL I; NAVRATIL K.1976; THIN SOLID FILMS; NETHERL.; DA. 1976; VOL. 31; NO 3; PP. 223-234; BIBL. 21 REF.Article

THE PROBLEM OF SURFACE ROUGHNESS IN ELLIPSOMETRY AND REFLECTOMETRY.OHLIDAL I; LUKES F; NAVRATIL K et al.1977; J. PHYS., COLLOQ.; FR.; DA. 1977; NO 5; PP. 77-88; ABS. FR.; BIBL. 56 REF.; (PROPR. OPT. INTERFACES SOLIDE-LIQUIDE. COLLOQ. INT.; LA COLLE-SUR-LOUP; 1977)Conference Paper

THE PHYSICAL STRUCTURE OF THE INTERFACE BETWEEN SINGLECRYSTAL GAAS AND ITS OXIDE FILMNAVRATIL K; OHLIDAL I; LUKES F et al.1979; THIN SOLID FILMS; NLD; DA. 1979; VOL. 56; NO 1-2; PP. 163-171; BIBL. 11 REF.Article

ROUGH SILICON SURFACES STUDIED BY OPTICAL METHODS.OHLIDAL I; LUKES F; NAVRATIL K et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 1; PP. 91-116; BIBL. 1 P.Article

SIMPLE METHOD FOR THE COMPLETE OPTICAL ANALYSIS OF VERY THICK AND WEAKLY ABSORBING FILMSOHLIDAL I; NAVRATIL K; SCHMIDT E et al.1982; APPLIED PHYSICS. A, SOLIDS AND SURFACES; ISSN 0721-7250; DEU; DA. 1982; VOL. 29; NO 3; PP. 157-162; BIBL. 22 REF.Article

A MODEL OF OXIDE FILM ORIGINATING AT THERMAL OXIDATION OF GAAS.NAVRATIL K; OHLIDAL I; LUKES F et al.1977; CZECHOSL. J. PHYS.; CZECHOSL.; DA. 1977; VOL. B27; NO 6; PP. 672-681; H.T. 1; BIBL. 17 REF.Article

OXIDE FILMS ON GAASLUKES F; NAVRATIL K; SOMMER I et al.1971; FOLIA FAC. SCI. NAT. UNIV. PURKYN. BRUN.; TCHECOSL.; DA. 1971; VOL. 12; NO 7; PP. 5-60; ABS. RUSSE; BIBL. 44 REF.Serial Issue

THIN ORGANOSILICON (OMTS) FILMS FORMED BY PLASMA POLYMERIZATION PROCESS IN RF DISCHARGEJANCA J; AMBROZ L; NAVRATIL K et al.1978; SCRIPTA FAC. SCI. NAT. UNIV. PURKYN. BRUN.; CSK; DA. 1978; VOL. 8; NO 5; PP. 51-60; ABS. RUS; BIBL. 19 REF.Article

Simple method of spectroscopic reflectometry for the complete optical analysis of weakly absorbing thin films: application to silicon filmsOHLIDAL, I; NAVRATIL, K.Thin solid films. 1988, Vol 156, Num 2, pp 181-189, issn 0040-6090Article

Complete optical analysis of a non-absorbing thin film on an absorbing substrate by a new method of immersion spectroscopic reflectometryOHLIDAL, I; NAVRATIL, K.Thin solid films. 1987, Vol 148, Num 1, pp 17-27, issn 0040-6090Article

Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometryOHLIDAL, I; NAVRATIL, K.Applied optics. 1985, Vol 24, Num 16, pp 2690-2695, issn 0003-6935Article

Diffusion growth of oxide layers on GaAs single crystalsKUCERA, J; NAVRATIL, K.Thin solid films. 1990, Vol 191, Num 2, pp 211-220, issn 0040-6090Article

Optical analysis of inhomogeneous weakly absorbing thin films by spectroscopic reflectometry: application to carbon filmOHLIDAL, I; NAVRATIL, K.Thin solid films. 1988, Vol 162, pp 101-109, issn 0040-6090Article

A new method for the complete optical analysis of weakly absorbing thin films: application to polycrystalline silicon filmsOHLIDAL, I; NAVRATIL, K; MUSILOVA, J et al.Thin solid films. 1985, Vol 127, Num 3-4, pp 191-203, issn 0040-6090Article

Optical properties of thin films of poly(methyl-phenylsilylene)NAVRATIL, K; SIK, J; HUMLICEK, J et al.Optical materials (Amsterdam). 1999, Vol 12, Num 1, pp 105-113, issn 0925-3467Article

Influence of oxygen concentration on optical properties of semi-insulating polycrystalline silicon filmsKUCIRKOVA, A; NAVRATIL, K; PAJASOVA, L et al.Applied physics. A, Materials science & processing (Print). 1996, Vol 63, Num 5, pp 495-503, issn 0947-8396Article

Effizienzsteigernde Dienstleistungen : innovative Kundenbindungskonzepte = Increasing efficiency of contractors : innovative client commitment conceptsNAVRATIL, K; SCHWARZE, R; WISBEREIT, S et al.ET. Energiewirtschaftliche Tagesfragen. 2000, Vol 50, Num 1-2, pp 25-28, issn 0720-6240Conference Paper

A note on the study of the refractive index of As2S3 films evaporated onto glass substratesLUKES, F; NAVRATIL, K; CIMPL, Z et al.Physica status solidi. A. Applied research. 1991, Vol 124, Num 2, pp K145-K148, issn 0031-8965Article

Depth inhomogeneity of deposited thin films : application to semi-insulating polycrystalline silicon filmsKUCIRKOVA, A; NAVRATIL, K; ZEMEK, J et al.Thin solid films. 1998, Vol 323, Num 1-2, pp 53-58, issn 0040-6090Article

Optical anisotropy of SrLaAlO4 and SrLaAl0.75Ga0.25O4 single crystalsHORA, J; NAVRATIL, K; HUMLICEK, J et al.Physica status solidi. B. Basic research. 1996, Vol 195, Num 2, pp 625-635, issn 0370-1972Article

Oblique incidence specular reflectance spectra of a Bi2Se3 : Ge single crystal at plasma resonanceFOLTIN, O; NAVRATIL, K; LOSTAK, P et al.Physica status solidi. A. Applied research. 1992, Vol 132, Num 2, pp K97-K99, issn 0031-8965Article

Immersion spectroscopic reflectometry of multilayer systems. II: Experimental resultsOHLIDAL, I; NAVRATIL, K; HOLY, V et al.Journal of the Optical Society of America. A, Optics and image science. 1988, Vol 5, Num 4, pp 465-470, issn 0740-3232Article

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