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AVOGADRO CONSTANT-CORRECTIONS TO AN EARLIER REPORT.DESLATTES RD; HENINS A; SCHOONOVER RM et al.1976; PHYS. REV. LETTERS; U.S.A.; DA. 1976; VOL. 36; NO 15; PP. 898-900; BIBL. 11 REF.Article

THE AVOGADRO CONSTANTDESLATTES RD.1980; ANNU. REV. PHYS. CHEM.; ISSN 0066-426X; USA; DA. 1980; VOL. 31; PP. 435-461; BIBL. 82 REF.Article

NOVA DETERMINACAO DO NUMERO DE AVOGADRO = NOUVELLE DETERMINATION DU NOMBRE D'AVOGADROHAMBURGER EW.1975; CI. E CULT.; BRAS.; DA. 1975; VOL. 27; NO 9; PP. 952-954; ABS. ANGL.; BIBL. 1 REF.Article

DETERMINATION OF THE AVOGADRO CONSTANTDESLATTES RD; HENINS A; BOWMAN HA et al.1974; PHYS. REV. LETTERS; U.S.A.; DA. 1974; VOL. 33; NO 8; PP. 463-466; BIBL. 24 REF.Article

DAS MOL A BASISEINHEIT FUER DIE GROESSE STOFFMENGE = LA MOLE, UNITE FONDAMENTALE POUR LA GRANDEUR QUANTITE DE MATIEREDRATH P.1975; P.T.B. MITT.; DTSCH.; DA. 1975; VOL. 85; NO 1; PP. 44-46; ABS. ANGL.; BIBL. 9 REF.Article

DETERMINING THE AVOGADRO CONSTANT TO HIGH ACCURACY VIA IMPROVED MEASUREMENTS OF ABSOLUTE AMPERETAYLOR BN.1973; METROLOGIA; ALLEM.; DA. 1973; VOL. 9; NO 1; PP. 21-23; BIBL. 9 REF.Serial Issue

Accurate determination of the density of a crystal silicon sphereFUJII, K; TANAKA, M; NEZU, Y et al.IEEE transactions on instrumentation and measurement. 1993, Vol 42, Num 2, pp 395-400, issn 0018-9456Conference Paper

The importance of the Avogadro constant for amount-of-substance measurementsDE BIEVRE, P; VALKIERS, S; TAYLOR, P. D. P et al.Fresenius' journal of analytical chemistry. 1998, Vol 361, Num 3, pp 227-234, issn 0937-0633Conference Paper

A more accurate value for the Avogadro constantDE BIEVRE, P; VALKIERS, S; PEISER, S et al.IEEE transactions on instrumentation and measurement. 1995, Vol 44, Num 2, pp 530-532, issn 0018-9456Conference Paper

Measuring the molar mass of silicon for a better Avogadro constant : Reduced uncertaintyGONFIANTINI, R; DE BIEVRE, P; VALKIERS, S et al.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 566-571, issn 0018-9456Conference Paper

Progress in the measurement of lattice spacing d(220) of siliconNAKAYAMA, K; FUJIMOTO, H.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 580-583, issn 0018-9456Conference Paper

Intercomparison of silicon samples from the Avogadro projectsKESSLER, E. G; SCHWEPPE, J. E; DESLATTES, R. D et al.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 551-555, issn 0018-9456Conference Paper

A new determination of NABASILE, G; BECKER, P; PANCIERA, R et al.IEEE transactions on instrumentation and measurement. 1995, Vol 44, Num 2, pp 538-541, issn 0018-9456Conference Paper

Absolute measurement of the density of silicon crystals in vacuo for a determination of the Avogadro constantFUJII, K; TANAKA, M; NEZU, Y et al.IEEE transactions on instrumentation and measurement. 1995, Vol 44, Num 2, pp 542-545, issn 0018-9456Conference Paper

Prompt (n, γ)-spectrometry for the isotopic analysis of silicon crystals for the Avogadro ProjectRÖTTGER, S; PAUL, A; KEYSER, U et al.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 560-562, issn 0018-9456Conference Paper

Towards an atomic realization of the kilogram : The measurements of NA and NAhBECKER, P.The European physical journal. Special topics. 2008, Vol 163, pp 127-139, issn 1951-6355, 13 p.Conference Paper

The IMGC volume-density standards for the Avogadro constantSACCONI, A; PEUTO, A. M; MOSCA, M et al.IEEE transactions on instrumentation and measurement. 1995, Vol 44, Num 2, pp 533-537, issn 0018-9456Conference Paper

Comparison of silicon density standards at NRLM and IMGCPEUTO, A. M; SACCONI, A; MOSCA, M et al.IEEE transactions on instrumentation and measurement. 1993, Vol 42, Num 2, pp 242-246, issn 0018-9456Conference Paper

Development of a silicon density standard and precision density measurements of solid materials by hydrostatic weighing : Advanced measurement technology of thermophysical properties and reference materials for solidsFUJII, Kenichi; WASEDA, Atsushi; KURAMOTO, Naoki et al.Measurement science & technology (Print). 2001, Vol 12, Num 12, pp 2031-2038, issn 0957-0233Article

Estimating diffusion coefficients from count data : Einstein-Smoluchowski theory revisitedBINGHAM, N. H; DUNHAM, B.Annals of the Institute of Statistical Mathematics. 1997, Vol 49, Num 4, pp 667-679, issn 0020-3157Article

The (220) lattice spacing of siliconBASILE, G; BERGAMIN, A; CAVAGNERO, G et al.IEEE transactions on instrumentation and measurement. 1995, Vol 44, Num 2, pp 526-529, issn 0018-9456Conference Paper

Precision volume measurements on silicon spheresSACCONI, A; PANCIERA, R; PASIN, W et al.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 584-587, issn 0018-9456Conference Paper

The influence of Young's modulus on roundness in silicon sphere fabricationCOLLINS, J. G; GIARDINI, W. J; LEISTNER, A. J et al.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 2, pp 572-575, issn 0018-9456Conference Paper

New results from previously reported NBS fundamental constant determinationsTAYLOR, B. N.Journal of research of the National Bureau of Standards (1934). 1985, Vol 90, Num 2, pp 91-94, issn 0091-0635Article

REFERENCE WAVELENGTHS. INFRA-RED TO GAMMA-RAYS, AVOGADRO'S CONSTANT, MASS AND DENSITYDESLATTES RD.1980; METROLOGIA E COSTANTI FONDAMENTALI. SCUOLA INTERNAZIONALE DI FISICA ENRICO FERMI. CORSO. 68/1976/VARENNA; ITA/NLD/USA/GBR; BOLOGNA: SOCIETA ITALIANA DI FISICA/AMSTERDAM: NORTH-HOLLAND/NEW YORK: NORTH-HOLLAND/OXFORD: NORTH-HOLLAND; DA. 1980; PP. 38-113; BIBL. 4 P.Conference Paper

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