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IVNC 2004 (technical digest of the 17th International Vacuum Nanoelectronics Conference)Akinwande, Akintunde I.International Vacuum Nanoelectronics Conference. 2004, isbn 0-7803-8397-4, 1Vol, 301 p., isbn 0-7803-8397-4Conference Proceedings

2002 silicon nanoelectronics workshop, June 9-10, 2002, Honolulu, HI, USAFRANK, David J.IEEE transactions on nanotechnology. 2002, Vol 1, Num 4, issn 1536-125X, 97 p.Conference Proceedings

Special Issue of IEEE INEC 2011 (IEEE International Nano Electronics Conference)CHAO SUNG LAI; LIOU, Juin J; WANG, Jer-Chyi et al.Solid-state electronics. 2012, Vol 77, issn 0038-1101, 108 p.Conference Proceedings

Advances in Nanoelectronics Circuits and SystemsPAUL, Bipul C; CHAKRABARTY, Krishnendu.IET computers & digital techniques (Print). 2009, Vol 3, Num 6, issn 1751-8601, 110 p.Serial Issue

On nanoelectronic architectural challenges and solutionsBEIU, Valeriu; RÜCKERT, Ulrich; ROY, Sandip et al.IEEE conference on nanotechnology. 2004, pp 628-631, isbn 0-7803-8536-5, 1Vol, 4 p.Conference Paper

Emission statistics for Si and HfC/Si emitter arrays after gas exposureNICOLAESCU, D; NAGAO, M; SATO, T et al.International Vacuum Nanoelectronics Conference. 2004, pp 140-141, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Emerging nanoelectronics : Multi-functional nanowiresIONESCU, A. M; POTT, V; ECOFFEY, S et al.International Semiconductor Conference. 2004, isbn 0-7803-8499-7, Vol I, 3-8Conference Paper

Bottom-up approach to silicon nanoelectronicsMIZUTA, Hiroshi; ODA, Shunri.Microelectronics journal. 2008, Vol 39, Num 2, pp 171-176, issn 0959-8324, 6 p.Conference Paper

Trends in Nanotechnology (TNT 2000) conference (Toledo, Spain, October 12-16 2000)CORREIA, Antonio; WELLAND, Mark; SERENA, Pedro A et al.Nanotechnology (Bristol. Print). 2001, Vol 12, Num 2, issn 0957-4484, 103 p.Conference Proceedings

Percolation study of defect tolerance in missing-crossbar networksZWOLAK, Michael P; ZALLEN, Richard; DI VENTRA, Massimiliano et al.Solid state communications. 2002, Vol 124, Num 5-6, pp 167-170, issn 0038-1098, 4 p.Article

Regional, National, and International Nanoelectronics Research Programs: Topical Concentration and GapsBRILLOUËT, Michel; BOURIANOFF, George I; KEARY CAVIN, Ralph et al.Proceedings of the IEEE. 2010, Vol 98, Num 12, pp 1993-2004, issn 0018-9219, 12 p.Article

Optical Impedance Transformer for Transparent Conducting ElectrodesKEN XINGZE WANG; PIPER, Jessica R; SHANHUI FAN et al.Nano letters (Print). 2014, Vol 14, Num 5, pp 2755-2758, issn 1530-6984, 4 p.Article

2004 Silicon Nanoelectronics Workshop, Honolulu, HI, USA, 13-14 June 2004ASENOV, Asen; BERNSTEIN, Gary H.IEEE transactions on nanotechnology. 2005, Vol 4, Num 3, issn 1536-125X, 80 p.Conference Proceedings

Experiments in structural DNA nanotechnology : Arrays and devicesSEEMAN, Nadrian C; BAOQUAN DING; YAN, H et al.SPIE proceedings series. 2005, pp 71-81, isbn 0-8194-5545-8, 11 p.Conference Paper

Dielectrics for nanosystems : materials science, processing, reliability, and manufacturing (Honolulu HI, 3-8 October 2004)Singh, R; Iwai, H; Tummala, R.R et al.Proceedings - Electrochemical Society. 2004, issn 0161-6374, isbn 1-56677-417-9, X, 490 p, isbn 1-56677-417-9Conference Proceedings

Laser cleaning technology for micro and nano devices applicationsULIERU, D; APOSTOL, I.International Semiconductor Conference. 2004, pp 113-116, isbn 0-7803-8499-7, 4 p.Conference Paper

Low temperature fabrication of poly-Si FEA for display applicationNAGAO, M; SACHO, Y; KANEMARU, S et al.International Vacuum Nanoelectronics Conference. 2004, pp 134-135, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

SUSTAINABLE NANOELECTRONICSQI JIE WANG; TAN, Cherming; RADHAKRISHNAN, K et al.International journal of nanotechnology. 2014, Vol 11, Num 1-4, issn 1475-7435, 389 p.Conference Proceedings

European Micro and Nano SystemsMicroelectronics journal. 2005, Vol 36, Num 7, issn 0959-8324, 75 p.Conference Proceedings

Si nanodevices for random number generating circuits for cryptographic securityFUJITA, S; UCHIDA, K; YASUDA, S et al.IEEE International Solid-State Circuits Conference. 2004, pp 294-295, isbn 0-7803-8267-6, 2Vol, 2 p.Conference Paper

Silicon technology: From micro to nano, and why federal investment mattersKINGSCOTT, Kathleen.SPIE proceedings series. 2002, pp 24-25, isbn 0-8194-4347-6, 2 p.Conference Paper

New mechanism of cluster field evaporation in rf breakdownINSEPOV, Z; NOREM, J. H; HASSANEIN, A et al.International Vacuum Nanoelectronics Conference. 2004, pp 180-181, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Notes from the nist/nrl/spie workshop on nanostructure science, metrology & technology: Microelectronics groupSPIE proceedings series. 2002, pp 147-150, isbn 0-8194-4347-6, 4 p.Conference Paper

Sensing at the nanoscaleHIEROLD, Christofer.Nanotechnology (Bristol. Print). 2013, Vol 24, Num 44, issn 0957-4484, [136 p.]Serial Issue

Development of electron optical instrument for evaluation of multi emitters : Real time observation of operating conditions of multi emitters by LEEM, PEEM and FEEMMURATA, H; KIMURA, T; NISHIMURA, Y et al.International Vacuum Nanoelectronics Conference. 2004, pp 188-189, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

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