Pascal and Francis Bibliographic Databases

Help

Search results

Your search

ct.\*:("Nanoscale pattern formation")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 1355

  • Page / 55
Export

Selection :

  • and

Effect of surface crack on nanoimprint process of Al thin filmWANG, Y. P; XU, J. G; SONG, H. Y et al.Physica. B, Condensed matter. 2014, Vol 434, pp 194-199, issn 0921-4526, 6 p.Article

Measuring scientific research in emerging nano-energy fieldJIANCHENG GUAN; NA LIU.Journal of nanoparticle research. 2014, Vol 16, Num 4, issn 1388-0764, 2356.1-2356.15Article

An electrothermochromic paper display based on colorimetrically reversible polydiacetylenesHYORA SHIN; BORA YOON; IN SUNG PARK et al.Nanotechnology (Bristol. Print). 2014, Vol 25, Num 9, issn 0957-4484, 094011.1-094011.8Article

Directional Transport by Nonprocessive Motor Proteins on Fascin-Cross-Linked Actin ArraysLEE, Yongkuk; FAMOURI, Parviz.Nano letters (Print). 2013, Vol 13, Num 8, pp 3775-3782, issn 1530-6984, 8 p.Article

Fabrication of 3D fractal structures using nanoscale anisotropic etching of single crystalline siliconBERENSCHOT, Erwin J. W; JANSEN, Henri V; TAS, Niels R et al.Journal of micromechanics and microengineering (Print). 2013, Vol 23, Num 5, issn 0960-1317, 055024.1-055024.10Article

Nanobubbles and their role in slip and drag : SPECIAL SECTION ON SURFACE NANOBUBBLES AND MICROPANCAKESMAALI, Abdelhamid; BHUSHAN, Bharat.Journal of physics. Condensed matter (Print). 2013, Vol 25, Num 18, issn 0953-8984, 184003.1-184003.12Article

T Cell Activation is Determined by the Number of Presented AntigensDEEG, Janosch; AXMANN, Markus; MATIC, Jovana et al.Nano letters (Print). 2013, Vol 13, Num 11, pp 5619-5626, issn 1530-6984, 8 p.Article

Broadband transmission masks, gratings and filters for extreme ultraviolet and soft X-ray lithographyBROSE, S; DANYLYUK, S; JUSCHKIN, L et al.Thin solid films. 2012, Vol 520, Num 15, pp 5080-5085, issn 0040-6090, 6 p.Article

Comparison of stress migration and electromigration in the fabrication of thin Al wiresYEBO LU; TOHMYOH, Hironori; SAKA, Masumi et al.Thin solid films. 2012, Vol 520, Num 9, pp 3448-3452, issn 0040-6090, 5 p.Article

Femtosecond laser color marking of metal and semiconductor surfacesIONIN, Andrey A; KUDRYASHOV, Sergey I; MAKAROV, Sergey V et al.Applied physics. A, Materials science & processing (Print). 2012, Vol 107, Num 2, pp 301-305, issn 0947-8396, 5 p.Article

Ion multi-beam direct sputtering of Si imprint stamps and simulation of resulting structuresEDER-KAPL, Stefan; STEIGER-THIRSFELD, Andreas; WELLENZOHN, Markus et al.Journal of micromechanics and microengineering (Print). 2012, Vol 22, Num 5, issn 0960-1317, 055008.1-055008.9Article

Study of process parameters and formative mechanism of patterns on a dip-pen nanolithography array using molecular dynamics simulationsWU, Cheng-Da; FANG, Te-Hua; WU, Tsung-Tse et al.Polymer (Guildford). 2012, Vol 53, Num 3, pp 857-863, issn 0032-3861, 7 p.Article

Model for the Mass Transport during Metal-Assisted Chemical Etching with Contiguous Metal Films As CatalystsGEYER, Nadine; FUHRMANN, Bodo; ZHIPENG HUANG et al.Journal of physical chemistry. C. 2012, Vol 116, Num 24, pp 13446-13451, issn 1932-7447, 6 p.Article

Nanostructure formation on metal-chalcogenide surface using electron beam irradiationKOLBJONOKS, Vadims; GERBREDERS, Vjaceslavs; TAMANIS, Edmunds et al.Journal of non-crystalline solids. 2011, Vol 357, Num 11-13, pp 2375-2379, issn 0022-3093, 5 p.Conference Paper

Applications of excimer laser in nanofabricationQIANGFEI XIA; CHOU, Stephen Y.Applied physics. A, Materials science & processing (Print). 2010, Vol 98, Num 1, pp 9-59, issn 0947-8396, 51 p.Article

Molecular dynamics simulations of nanopore processing in a graphene sheet by using gas cluster ion beamINUI, Norio; MOCHIJI, Kozo; MORITANI, Kousuke et al.Applied physics. A, Materials science & processing (Print). 2010, Vol 98, Num 4, pp 787-794, issn 0947-8396, 8 p.Article

Self-assembled InGaAs tandem nanostructures consisting of a hole and pyramid on GaAs (311)A by droplet epitaxyLEE, J. H; WANT, Zh. M; KIM, E. S et al.Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 2, pp 348-353, issn 1862-6300, 6 p.Article

Fabrication of open-ended TiO2 nanotube arrays by a simple two-step anodizationZHANG, Zhi-Kun; GUO, Deng-Zhu; XING, Ying-Jie et al.Physica status solidi. Rapid research letters (Print). 2010, Vol 4, Num 11, pp 299-301, issn 1862-6254, 3 p.Article

Mesoscopic nanomaterials generated by interfering femtosecond laser processingNAKATA, Yoshiki; HIROMOTO, Takuya; MIYANAGA, Noriaki et al.Applied physics. A, Materials science & processing (Print). 2010, Vol 101, Num 3, pp 471-474, issn 0947-8396, 4 p.Article

Dislocation Reduction in CdTe Epilayers Grown on Silicon Substrates Using Buffered NanostructuresSHINTRI, Shashidhar; SUNIL RAO; WIJEWARNASURIYA, Priyalal et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7768, issn 0277-786X, isbn 9780819482648, 77680A.1-77680A.9Conference Paper

Critical stability of gold nanofingers on a zero-gradient stepped surfaceYIN, F; PALMER, R. E; GUO, Q et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 44, issn 0953-8984, 445001.1-445001.6Article

Ion beam sputtering induced nanostructuring of polycrystalline metal films : SURFACE NANOPATTERNS INDUCED BY ION-BEAM SPUTTERINGGHOSE, Debabrata.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 22, issn 0953-8984, 224001.1-224001.15Article

Sub-10 nm Nanoimprint Lithography by Wafer BowingWEI WU; TONG, William M; WANG, Shih-Yuan et al.Nano letters (Print). 2008, Vol 8, Num 11, pp 3865-3869, issn 1530-6984, 5 p.Article

Uniaxial alignment of nanoconfined columnar mesophasesMOUTHUY, Pierre-Olivier; MELINTE, Sorin; GEERTS, Yves H et al.Nano letters (Print). 2007, Vol 7, Num 9, pp 2627-2632, issn 1530-6984, 6 p.Article

Peeling analysis of resist line pattern of 170 nm width due to crack formation by using atomic force microscope tipINOUE, Daisuke; KAWAI, Akira.Surface & coatings technology. 2003, Vol 169-70, pp 311-315, issn 0257-8972, 5 p.Conference Paper

  • Page / 55