au.\*:("National Institute for Materials ; Materials Engineering Laboratory (MEL)")
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Chiral metal surfaces from the adsorption of chiral and achiral moleculesHUMBLOT, V; RAVAL, R.Applied surface science. 2005, Vol 241, Num 1-2, pp 150-156, issn 0169-4332, 7 p.Conference Paper
Effects of surface cleaning on oxidation of NiAl(11 0)WEIJIE SONG; YOSHITAKE, Michiko.Applied surface science. 2005, Vol 241, Num 1-2, pp 164-168, issn 0169-4332, 5 p.Conference Paper
The 9th International Symposium on Advanced Physical FieldsFUJITA, Daisuke; KIDO, Giyuu; TOSA, Masahiro et al.Applied surface science. 2005, Vol 241, Num 1-2, issn 0169-4332, 278 p.Conference Proceedings
Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiationHASHIMOTO, Hisayuki; NAGUMO, Toshiaki; INABA, Tohru et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 227-230, issn 0169-4332, 4 p.Conference Paper
B-C-N hybrid synthesis by high-temperature ion implantationNIZAM UDDIN, Md; SHIMOYAMA, Iwao; BABA, Yuji et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 246-249, issn 0169-4332, 4 p.Conference Paper
Surface damage induced by focused-ion-beam milling in a Si/Si p-n junction cross-sectional specimenZHOUGUANG WANG; KATO, Takeharu; HIRAYAMA, Tsukasa et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 80-86, issn 0169-4332, 7 p.Conference Paper
X-ray absorption near edge structure of small FePt atomic clustersALAM, Sher; AHMED, Javed; MATSUI, Yoshio et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 199-204, issn 0169-4332, 6 p.Conference Paper
Electron energy-loss spectroscopic study of the surface of ceria abrasivesGILLISS, Shelley R; BENTLEY, James; CARTER, C. Barry et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 61-67, issn 0169-4332, 7 p.Conference Paper
Estimation of adsorbed hydrogen on Ni(111) surface by slow-positron beamOISHI, Y; WADA, T; KANAZAWA, I et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 169-173, issn 0169-4332, 5 p.Conference Paper
In situ synthesis and characterization of pure SiC nanowires on silicon waferYANG, W; ARAKI, H; THAVEETHAVORN, S et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 236-240, issn 0169-4332, 5 p.Conference Paper
Selective growth and characterization of nanostructures with transmission electron microscopesSHIMOJO, M; BYSAKH, S; MITSUISHI, K et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 56-60, issn 0169-4332, 5 p.Conference Paper
TEM in situ observation of fracture behavior in ceramic materialsII, S; IWAMOTO, C; MATSUNAGA, K et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 68-74, issn 0169-4332, 7 p.Conference Paper
Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phaseSUGIMOTO, Y; ABE, M; YOSHIMOTO, K et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 23-27, issn 0169-4332, 5 p.Conference Paper
HRTEM study on grain boundary atomic structures related to the sliding behavior in alumina bicrystalsMATSUNAGA, K; NISHIMURA, H; HANYU, S et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 75-79, issn 0169-4332, 5 p.Conference Paper
HRTEM and EELS characterization of atomic and electronic structures in Cu/α-Al2O3 interfacesSASAKI, T; MIZOGUCHI, T; MATSUNAGA, K et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 87-90, issn 0169-4332, 4 p.Conference Paper
Metastable-atom-stimulated desorption from dodecanethiolate self-assembled monolayersYAMAUCHI, Y; NORO, T; KURAHASHI, M et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 141-145, issn 0169-4332, 5 p.Conference Paper
Characterization of alkanethiol/ZnO structures by X-ray photoelectron spectroscopyOGATA, K; HAMA, T; HAMA, K et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 146-149, issn 0169-4332, 4 p.Conference Paper
Fabrication of nano-pits and the measurement of their local surface potentialsYOSHITAKE, Michiko; BOSE, Chandra; YAGYU, Sinjiro et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 157-163, issn 0169-4332, 7 p.Conference Paper
Optical monitoring of nanoparticle formation during negative 60 keV Cu ion implantation into LiNbO3PLAKSIN, O. A; TAKEDA, Y; AMEKURA, H et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 213-217, issn 0169-4332, 5 p.Conference Paper
First steps in the growth of Cu thin films on the five-fold surface of the icosahedral Al-Cu-Fe quasicrystalSHARMA, H. R; SHIMODA, M; FOURNEE, V et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 256-260, issn 0169-4332, 5 p.Conference Paper
Formation of isotope controlled SiC thin film by plasma chemical vapor deposition and its characterizationSUZUKI, H; ARAKI, H; YANG, W et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 266-269, issn 0169-4332, 4 p.Conference Paper
Reduction mechanism of surface oxide films and characterization of formations on pulse electric-current sintered Al-Mg alloy powdersGUOQIANG XIE; OHASHI, Osamu; MINGHUI SONG et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 102-106, issn 0169-4332, 5 p.Conference Paper
Scanning tunneling microscopy and spectroscopy studies of graphite edgesNIIMI, Y; MATSUI, T; KAMBARA, H et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 43-48, issn 0169-4332, 6 p.Conference Paper
X-ray photoelectron spectroscopic analysis of HfO2/Hf/SiO2/Si structureRUIQIN TAN; AZUMA, Yasushi; KOJIMA, Isao et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 135-140, issn 0169-4332, 6 p.Conference Paper
Nanometer-scale mapping of local work function with a photon-assisted STM techniqueNAKAYAMA, Yasuo; KONDOH, Hiroshi; OHTA, Toshiaki et al.Applied surface science. 2005, Vol 241, Num 1-2, pp 18-22, issn 0169-4332, 5 p.Conference Paper