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Thermal magnetic noise in tunneling readersHEINONEN, Olle; HAE SEOK CHO.IEEE transactions on magnetics. 2004, Vol 40, Num 4, pp 2227-2232, issn 0018-9464, 6 p., 2Conference Paper

1/f Noise in the superconducting transition of a MgB2 thin filmLAKEW, B; ASIAM, S; JONES, H et al.Physica. C. Superconductivity. 2010, Vol 470, Num 9-10, pp 451-455, issn 0921-4534, 5 p.Article

Trap density characterization through low-frequency noise in junctionless transistorsRODRIGO TREVISOLI DORIA; RENAN DORIA TREVISOLI; DE SOUZA, Michelly et al.Microelectronic engineering. 2013, Vol 109, pp 79-82, issn 0167-9317, 4 p.Article

Effect of ionizing radiation on noise in MgB2 thin film : a candidate material for detector development for post-Cassini planetary missionsLAKEW, B; ASLAM, S; JONES, H et al.Physica. C. Superconductivity. 2006, Vol 440, Num 1-2, pp 1-5, issn 0921-4534, 5 p.Article

Calculation of the intrinsic spectral density of current fluctuations in nanometric Schottky-barrier diodes at terahertz frequenciesMAHI, F. Z; HELMAOUI, A; VARANI, L et al.Physica. B, Condensed matter. 2008, Vol 403, Num 19-20, pp 3765-3768, issn 0921-4526, 4 p.Article

Low-frequency noise in buried-channel SiGe n-MODFETsMADAN, Anuj; CRESSLER, John D; KOESTER, Steven J et al.Solid-state electronics. 2009, Vol 53, Num 8, pp 901-904, issn 0038-1101, 4 p.Conference Paper

C/N0-Based Criterion for Selecting BOC-Modulated GNSS Signals in Cognitive PositioningSIMONA LOHAN, Elena; SECO-GRANADOS, Gonzalo.IEEE communications letters. 2013, Vol 17, Num 3, pp 537-540, issn 1089-7798, 4 p.Article

The effect of single-halo doping on the low-frequency noise performance of deep submicrometer MOSFETsNARASIMHULU, K; VENKATASURYAM SETTY, I; RAMGOPAL RAO, V et al.IEEE electron device letters. 2006, Vol 27, Num 12, pp 995-997, issn 0741-3106, 3 p.Article

Melt-textured YBCO superconducting tube for magnetic shieldingFANG, H; CLAYCOMB, J. R; ZHOU, Y. X et al.IEEE transactions on applied superconductivity. 2003, Vol 13, Num 2, pp 3103-3105, issn 1051-8223, 3 p., 3Conference Paper

Low-frequency noise measurement-based reliability testing of VLSI interconnects with different geometryRAWAT, K. S; MASSIHA, G. H.IEEE electron device letters. 2004, Vol 25, Num 12, pp 781-783, issn 0741-3106, 3 p.Article

The effect of LAC doping on deep submicrometer transistor capacitances and its influence on device RF performanceNARASIMHULU, K; DESAI, Madhav P; NARENDRA, Siva G et al.I.E.E.E. transactions on electron devices. 2004, Vol 51, Num 9, pp 1416-1423, issn 0018-9383, 8 p.Article

Outage Analysis of Asynchronized Wireless Networks in Interference-Limited EnvironmentDARSHI, Sam; BHATTACHARJEE, Ratnajit.IEEE transactions on vehicular technology. 2013, Vol 62, Num 8, pp 3863-3874, issn 0018-9545, 12 p.Article

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