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SEMICONDUCTOR MEASUREMENT TECHNOLOGY: THERMAL RESISTANCE MEASUREMENTS ON POWER TRANSISTORSRUBIN S; OETTINGER FF.1979; NATION. BUR. STAND., SPEC. PUBL.; USA; DA. 1979; NO 400-14; 68 P.; BIBL. DISSEM.Serial Issue

TRANSIENT THERMAL RESPONSE MEASUREMENTS OF POWER TRANSISTORS. = MESURES RELATIVES A LA REPONSE THERMIQUE TRANSITOIRE DE TRANSITORS DE PUISSANCEBLACKBURN DL; OETTINGER FF.1975; I.E.E.E. TRANS. INDUSTR. ELECTRON. CONTROL INSTRUMENT.; U.S.A.; DA. 1975; VOL. 22; NO 2; PP. 134-141; BIBL. 10 REF.Article

THERMAL CHARACTERIZATION OF POWER TRANSISTORS.OETTINGER FF; BLACKBURN DL; RUBIN S et al.1976; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1976; VOL. 23; NO 8; PP. 831-838; BIBL. 24 REF.Article

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