EXPRESSION FOR THE REFLECTANCE OF RANDOMLY ROUGH SURFACES DERIVED WITH FRESNEL APPROXIMATIONOHLIDAL I.1980; APPL. OPT.; USA; DA. 1980; VOL. 19; NO 11; PP. 1804-1811; BIBL. 17 REF.Article

OPTICAL ANALYSIS OF NON-ABSORBING DOUBLE LAYERS BY MEANS OF IMMERSION REFLECTOMETRY. I: LIQUID IMMERSION METHODOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 245-251; BIBL. 8 REF.Article

Immersion spectroscopic reflectometry of multilayer systems. I: TheoryOHLIDAL, I.Journal of the Optical Society of America. A, Optics and image science. 1988, Vol 5, Num 4, pp 459-464, issn 0740-3232Article

OPTICAL ANALYSIS OF THIN GOLD FILMS BY COMBINED REFLECTION AND TRANSMISSION ELLIPSOMETRY = ANALYSE OPTIQUE DE COUCHES MINCES D'OR PAR ELLIPSOMETRIE COMBINEE EN REFLEXION ET TRANSMISSIONOHLIDAL I; LUKES F.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 85; NO 2; PP. 181-190; BIBL. 10 REF.Article

Approximate formulas for the reflectance, transmittance, and scattering losses of nonabsorbin multialyer systems with randomly rough boundariesOHLIDAL, I.Journal of the Optical Society of America. A, Optics and image science. 1993, Vol 10, Num 1, pp 158-171, issn 0740-3232Article

CALCULATION OF THE ELLIPSOMETRIC PARAMETERS CHARACTERIZING A RANDOMLY ROUGH SURFACE BY MEANS OF THE STRATTON-CHU-SILVER INTEGRALOHLIDAL I; LUKES F.1973; OPT. COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 1; PP. 76-79; BIBL. 8 REF.Serial Issue

General formulae for the optical characterization of single layers with spectroscopic reflectometryOHLIDAL, I.Journal of modern optics (Print). 1988, Vol 35, Num 8, pp 1373-1381, issn 0950-0340Article

Influence of surface roughness on radiation from parabolic mirror collimators with cylindrical symmetry in the Fraunhofer regionOHLIDAL, I.Optica acta. 1985, Vol 32, Num 1, pp 27-37, issn 0030-3909Article

DETERMINATION OF THE OPTICAL PARAMETERS AND PACKING DENSITY OF NON-ABSORBING COLUMNAR THIN FILMS BY MEANS OF IMMERSION REFLECTOMETRY: APPLICATION TO LIF THIN FILMSOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 74; NO 1; PP. 51-58; BIBL. 12 REF.Article

OPTICAL ANALYSIS OF NON-ABSORBING DOUBLE LAYERS BY MEANS OF IMMERSION REFLECTOMETRY. II: SOLID STATE IMMERSION METHODOHLIDAL I; NAVRATIL K.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 71; NO 1; PP. 91-102; BIBL. 8 REF.Article

THE PHYSICAL STRUCTURE OF THE INTERFACE BETWEEN SINGLECRYSTAL GAAS AND ITS OXIDE FILMNAVRATIL K; OHLIDAL I; LUKES F et al.1979; THIN SOLID FILMS; NLD; DA. 1979; VOL. 56; NO 1-2; PP. 163-171; BIBL. 11 REF.Article

ROUGH SILICON SURFACES STUDIED BY OPTICAL METHODS.OHLIDAL I; LUKES F; NAVRATIL K et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 1; PP. 91-116; BIBL. 1 P.Article

SIMPLE METHOD FOR THE COMPLETE OPTICAL ANALYSIS OF VERY THICK AND WEAKLY ABSORBING FILMSOHLIDAL I; NAVRATIL K; SCHMIDT E et al.1982; APPLIED PHYSICS. A, SOLIDS AND SURFACES; ISSN 0721-7250; DEU; DA. 1982; VOL. 29; NO 3; PP. 157-162; BIBL. 22 REF.Article

A MODEL OF OXIDE FILM ORIGINATING AT THERMAL OXIDATION OF GAAS.NAVRATIL K; OHLIDAL I; LUKES F et al.1977; CZECHOSL. J. PHYS.; CZECHOSL.; DA. 1977; VOL. B27; NO 6; PP. 672-681; H.T. 1; BIBL. 17 REF.Article

Simple method of spectroscopic reflectometry for the complete optical analysis of weakly absorbing thin films: application to silicon filmsOHLIDAL, I; NAVRATIL, K.Thin solid films. 1988, Vol 156, Num 2, pp 181-189, issn 0040-6090Article

Multiple angle of incidence ellipsometric analysis of non-absorbing two-layer and three-layer systemsPANEVA, A; OHLIDAL, I.Thin solid films. 1986, Vol 145, Num 1, pp 23-37, issn 0040-6090Article

Influence of lateral dimensions of the irregularities on the optical quantities of rough surfacesFRANTA, D; OHLIDAL, I.Journal of optics. A, Pure and applied optics (Print). 2006, Vol 8, Num 9, pp 763-774, issn 1464-4258, 12 p.Article

Ellipsometric analysis of gallium arsenide surfacesOHLIDAL, I; LIBEZNY, M.Surface and interface analysis. 1991, Vol 17, Num 4, pp 171-176, issn 0142-2421, 6 p.Article

Optical analysis of absorbing double layers by combined reflection and transmission ellipsometryOHLIDAL, I; LUKES, F.Thin solid films. 1984, Vol 115, Num 4, pp 269-282, issn 0040-6090Article

Possibilities and limitations of the film thickness determination method based on white light interferenceMUSILOVA, J; OHLIDAL, I.Journal of physics. D, Applied physics (Print). 1990, Vol 23, Num 9, pp 1227-1238, issn 0022-3727Article

Analysis of semiconductor surfaces with very thin native oxide layers by combined immersion and multiple angle of incidence ellipsometryOHLIDAL, I; LUKES, F.Applied surface science. 1988, Vol 35, Num 2, pp 259-273, issn 0169-4332Article

Complete optical analysis of a non-absorbing thin film on an absorbing substrate by a new method of immersion spectroscopic reflectometryOHLIDAL, I; NAVRATIL, K.Thin solid films. 1987, Vol 148, Num 1, pp 17-27, issn 0040-6090Article

Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometryOHLIDAL, I; NAVRATIL, K.Applied optics. 1985, Vol 24, Num 16, pp 2690-2695, issn 0003-6935Article

Variable-angle spectroscopic ellipsometry of considerably non-uniform thin filmsNECAS, D; OHLIDAL, I; FRANTA, D et al.Journal of optics (Print). 2011, Vol 13, Num 8, issn 2040-8978, 085705.1-085705.10Article

A new method for the complete optical analysis of weakly absorbing thin films: application to polycrystalline silicon filmsOHLIDAL, I; NAVRATIL, K; MUSILOVA, J et al.Thin solid films. 1985, Vol 127, Num 3-4, pp 191-203, issn 0040-6090Article