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A PATTERN-RECOGNITION PROCEDURE FOR SCANNING OSCILLATION FILMS.KABSCH W.1977; J. APPL. CRYSTALLOGR.; DENM.; DA. 1977; VOL. 10; NO 5; PP. 426-429; BIBL. 5 REF.Article

PROCESSING AND POST-REFINEMENT OF OSCILLATION CAMERA DATAROSSMANN MG; LESLIE AGW; ABDEL MEGUID SS et al.1979; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1979; VOL. 12; NO 6; PP. 570-581; BIBL. 19 REF.Article

X-RAY ROCKING CURVES FOR SILICON-ON-SAPPHIRE CHARACTERIZATIONTRILHE J; BOREL J; GONCHOND JP et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 4; PP. 2003-2006; BIBL. 8 REF.Article

PROCESSING OSCILLATION DIFFRACTION DATA FOR VERY LARGE UNIT CELLS WITH AN AUTOMATIC CONVOLUTION TECHNIQUE AND PROFILE FITTINGROSSMANN MG.1979; J. APPL. CRYSTALLOGR.; DNK; DA. 1979; VOL. 12; NO 2; PP. 225-238; BIBL. 22 REF.Article

AN EMPIRICAL METHOD FOR CORRECTING ROTATION-CAMERA DATA FOR ABSORPTION AND DECAY EFFECTSSTUART D; WALKER N.1979; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS. DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1979; VOL. 35; NO 6; PP. 925-933; BIBL. 11 REF.Article

OSCILLATORY STRUCTURE OF LAUE CASE ROCKING CURVES.BONSE U; GRAEFF W; TEWORTE R et al.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 43; NO 2; PP. 487-492; ABS. ALLEM.; BIBL. 10 REF.Article

OSCILLATION CAMERA DATA PROCESSING: REFLECTING RANGE AND PREDICTION OF PARTIALITY. I: CONVENTIONAL X-RAYSOURCESGREENHOUGH TJ; HELLIWELL JR.1982; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 3; PP. 338-351; BIBL. 21 REF.Article

ROTATION DATA COLLECTION FOR PROTEIN CRYSTALLOGRAPHY WITH TIME-VARIABLE INCIDENT INTENSITY FROM SYNCHROTON RADIATION SOURCESBARTUNIK HD; CLOUT PN; ROBRAHN B et al.1981; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1981; VOL. 14; NO 2; PP. 134-136; BIBL. 2 REF.Article

SECONDARY EXTINCTION IN ROTATING SINGLE-CRYSTAL SLABSGIEBULTOWICZ T; MINOR W; SOSNOWSKA I et al.1979; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS. DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1979; VOL. 35; NO 6; PP. 861-870; BIBL. 18 REF.Article

OSCILLATION CAMERA DATA PROCESSING. 3. GENERAL DIFFRACTION SPOT SIZE, SHAPE AND ENERGY PROFILE: FORMALISM FOR POLYCHROMATIC DIFFRACTION EXPERIMENTS WITH MONOCHROMATIZED SYNCHROTRON X-RADIATION FROM A SINGLY BENT TRIANGULAR MONOCHROMATORGREENHOUGH TJ; HELLIWELL JR; RULE SA et al.1983; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1983; VOL. 16; NO 2; PP. 242-250; BIBL. 8 REF.Article

IMPROVED TECHNIQUE FOR PEAK INTEGRATION FOR CRYSTALLOGRAPHIC DATA COLLECTED WITH POSITION-SENSITIVE DETECTORS: A DYNAMIC MASK PROCEDURESJOELIN L; WLODAWER A.1981; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1981; VOL. 37; NO 4; PP. 594-604; BIBL. 30 REF.Article

ON THE TREATMENT OF PROTEIN DATA MEASURED ON THE OSCILLATION CAMERAWILSON K; YEATES D.1979; ACTA CRYSTALLOGR., A; DNK; DA. 1979; VOL. 35; NO 1; PP. 146-157; BIBL. 21 REF.Article

A COMBINATION OF OSCILLATING SLIT AND OSCILLATING FILM TECHNIQUES FOR THE INVESTIGATION OF LATTICE DEFECTSAULEYTNER J; FURMANIK Z.1983; CRYSTAL RESEARCH AND TECHNOLOGY (1979); ISSN 0232-1300; DDR; DA. 1983; VOL. 18; NO 2; PP. 275-279; ABS. GER; BIBL. 3 REF.Article

MESSUNG VON ROCKINGKURVEN EINES POLIERTEN CAF2-KRISTALLS. = MESURE DES COURBES D'OSCILLATIONS D'UN CRISTAL CAF2 POLIDIETRICH B; FORSTER E.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 6; PP. 609-615; ABS. ANGL.; BIBL. 12 REF.Article

ABSOLUTE LATTICE PARAMETER MEASUREMENTS OF EPITAXIAL LAYERSFEWSTER PF.1982; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 3; PP. 275-278; BIBL. 6 REF.Article

DETERMINATION OF THE CRYSTALLITE SIZE IN EPITAXIAL LAYERS OF PBTE BY MEANS OF X-RAY DIFFRACTION ROCKING CURVESSCHAEFER P; BERGER H.1979; KRISTALL U. TECH.; DDR; DA. 1979; VOL. 14; NO 6; PP. 711-715; ABS. GER; BIBL. 3 REF.Article

SPIN POLARIZATION IN DOUBLE DIFFRACTION OF LOW-ENERGY ELECTRONS FROM W(001): EXPERIMENT AND THEORYKIRSCHNER J; FEDER R.1979; PHYS. REV. LETTERS; USA; DA. 1979; VOL. 42; NO 15; PP. 1008-1011; BIBL. 14 REF.Article

ROCKING CURVE HALF-WIDTH OBTAINED BY MEANS OF A DOUBLE X-RAY CRYSTAL SPECTROMETER AND DISLOCATION DENSITY IN SINGLE CRYSTALS.TSIVINSKII SV; MASLOVA LA.1977; MATER. SCI. ENGNG; NETHERL.; DA. 1977; VOL. 30; NO 2; PP. 147-153; BIBL. 25 REF.Article

EVIDENCE FOR THE ISOMORPHISM OF THE LOW-TEMPERATURE FORM OF HEXAAMINECOBALT(III) IODIDE WITH ROOM-TEMPERATURE STRUCTURE OF HEXAAMINECOBALT(III) CHLORIDEWELBERRY TR; WILLIAMSON BE.1983; ACTA CRYSTALLOGRAPHICA. SECTION C. CRYSTAL STRUCTURE COMMUNICATIONS; ISSN 51277X; DNK; DA. 1983; VOL. 39; NO 5; PP. 513-514; BIBL. 9 REF.Article

THE MEASUREMENT OF THE X-RAY SCATTERING FACTORS OF SILICON FROM THE FINE STRUCTURE OF LAUE-CASE ROCKING CURVESBONSE U; TEWORTE R.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 5; PP. 410-416; BIBL. 24 REF.Article

ERFAHRUNGEN MIT DER KRISTALL-FILM-OSZILLATION BEI DER BERG-BARRETT-TOPOGRAPHIE = EXPERIENCES AVEC OSCILLATION DU FILM ET DU CRISTAL AU COURS DE LA TOPOGRAPHIE BERG-BARRETTDRESSLER L; BLUHM KD.1979; KRIST. TECH.; ISSN 0023-4753; DDR; DA. 1979; VOL. 14; NO 8; PP. K45-K47; BIBL. 4 REF.Article

PROGRAM AND ABSTRACTS/AMERICAN CRYSTALLOGRAPHIC ASSOCIATION SUMMER MEETING, BOSTON UNIVERSITY, BOSTON MA, AUGUST 12-17, 1979sdAMERICAN CRYSTALLOGRAPHIC ASSOCIATION. SUMMER MEETING/1979-08-12/BOSTON MA; USA; DA. S.D.; 57 P.: ILL.; 28 CM; BIBL. DISSEM.;AMERICAN CRYSTALLOGRAPHIC ASSOCIATION SERIES 2;_ISSN 0569-4221;_VOL. 7;_NO 1Conference Proceedings

IDENTIFICATION OF POLYTYPES OF MX2-TYPE COMPOUNDS. II: STRUCTURES OF 20 NEW POLYTYPES OF CADMIUM IODIDEPALOSZ B.1983; ACTA CRYSTALLOGRAPHICA. SECTION C. CRYSTAL STRUCTURE COMMUNICATIONS; ISSN 51277X; DNK; DA. 1983; VOL. 39; NO 5; PP. 521-528; BIBL. 11 REF.Article

DETERMINATION OF THE ORIENTATION SYMMETRY AXIS OF GRAPHITE SPECIMENSSCHRYER DR.1980; CARBON; ISSN 0008-6223; GBR; DA. 1980; VOL. 18; NO 3; PP. 225-229; BIBL. 6 REF.Article

THE OSCILLATION METHOD FOR CRYSTALS WITH VERY LARGE UNIT CELLSWINKLER FK; SCHUTT CE; HARRISON SC et al.1979; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1979; VOL. 35; NO 6; PP. 901-911; BIBL. 10 REF.Article

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