Birefringence characterization of mono-dispersed silicon nanocrystals planar waveguidesNAVARRO-URRIOS, D; RIBOLI, F; ZACHARIAS, M et al.Optical materials (Amsterdam). 2005, Vol 27, Num 5, pp 763-768, issn 0925-3467, 6 p.Conference Paper

Bloch oscillations and resonant Zener tunneling of light in optical superlatticesGHULINYAN, M; SAPIENZA, R; TONINELLI, C et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5835-X, 2Vol, vol 2, 421-433Conference Paper

Porous silicon-based Notch filters and waveguidesOTON, C. J; LORENZO, E; CAPUJ, N et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5835-X, 2Vol, vol 2, 434-443Conference Paper

An analysis of erbium excited state absorption in silicon-rich silicaKENYON, A. J; LOH, W. H; OTON, C. J et al.Journal of luminescence. 2006, Vol 121, Num 2, pp 193-198, issn 0022-2313, 6 p.Conference Paper

Light propagation in one-dimensional porous silicon complex systemsOTON, C. J; DAL NEGRO, L; GABURRO, Z et al.Physica status solidi. A. Applied research. 2003, Vol 197, Num 1, pp 298-302, issn 0031-8965, 5 p.Conference Paper

Multiparametric porous silicon gas sensors with improved quality and sensitivityOTON, C. J; PANCHERI, L; GABURRO, Z et al.Physica status solidi. A. Applied research. 2003, Vol 197, Num 2, pp 523-527, issn 0031-8965, 5 p.Conference Paper

Role of microstructure and layer thickness in porous silicon conductometric gas sensorsGABURRO, Z; OTON, C. J; GHULINYAN, M et al.Physica status solidi. A. Applied research. 2005, Vol 202, Num 8, pp 1467-1471, issn 0031-8965, 5 p.Article

Structural and light-emission modification in chemically-etched porous siliconNAVARRO-URRIOS, D; PEREZ-PADRON, C; LORENZO, E et al.Physica status solidi. A. Applied research. 2005, Vol 202, Num 8, pp 1518-1523, issn 0031-8965, 6 p.Conference Paper

Interferometric method for monitoring electrochemical etching of thin filmsGABURRO, Z; OTON, C. J; BETTOTTI, P et al.Journal of the Electrochemical Society. 2003, Vol 150, Num 6, pp C381-C384, issn 0013-4651Article

Chemical etching effects in porous silicon layersNAVARRO-URRIOS, D; PEREZ-PADRON, C; LORENZO, E et al.SPIE proceedings series. 2003, pp 109-116, isbn 0-8194-4978-4, 8 p.Conference Paper