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Optics in Italy. Part IIIFERRARO, Pietro; RASTOGI, Pramod K.Optics and lasers in engineering. 2003, Vol 39, Num 2, issn 0143-8166, 142 p.Serial Issue

Optical metrology for arts and multimedia (Munich, 25-26 June 2003)Salimbeni, Renzo.SPIE proceedings series. 2003, isbn 0-8194-5016-2, XII, 266 p, isbn 0-8194-5016-2Conference Proceedings

Advanced characterization techniques for optics, semiconductors, and nanotechnologies (San Diego CA, 3-5 August 2003)Duparré, Angela; Singh, Bhanwar.SPIE proceedings series. 2003, isbn 0-8194-5061-8, X, 402 p, isbn 0-8194-5061-8Conference Proceedings

Multichannel spectrograph using CCD as a detector for Raman spectroscopic applicationsShukla, R. P; Kumar, Sanjiva; Mallick, Manika et al.2002, [5], 55 pReport

Quantum-well-based phonon detectors; performance analysisBAI, X; KURDAK, C; KRISHNA, S et al.Physica. B, Condensed matter. 2002, Vol 316-17, pp 362-365, issn 0921-4526Conference Paper

An endoscopic imaging system for turbine engine pressure sensitive paint measurementsALARURI, Sami; BONSETT, Tom; SMITH, Donald et al.Optics and lasers in engineering. 2001, Vol 36, Num 3, pp 277-287, issn 0143-8166Article

Digitizing particle size analysisWEBB, Paul A.American Ceramic Society bulletin. 2001, Vol 80, Num 5, pp 37-40, issn 0002-7812Article

Piezothermoelastic analysis of an optical beam deflectorFUNG, Rong-Fong; CHAO, Shih-Chi; KUNG, Ying-Shieh et al.Sensors and actuators. A, Physical. 2001, Vol 87, Num 3, pp 179-187, issn 0924-4247Article

Second-order focusing of a bounded cylindrical field for a distant sourceILYIN, A. M; BORISOV, B. A.Measurement science & technology (Print). 2001, Vol 12, Num 11, pp 2015-2017, issn 0957-0233Article

Downconversion offers UV sensing optionFRICKE, B; GANOPOULOS, M; MARTIN, C et al.Laser focus world. 2000, Vol 36, Num 1, pp 199-205, issn 1043-8092, 5 p.Article

Adjusted quarter wave plate using γ-Fe₂O₃ ferrofluidDJENDLI, S; SAHSAH, H; JAMON, D et al.Journal of magnetism and magnetic materials. 2000, Vol 217, Num 1-3, pp 170-174, issn 0304-8853Article

The measurement of diffuse optical densities. Part II : The German standard reference densitometersBUHR, E; HOESCHEN, D; BERGMANN, D et al.The Journal of imaging science and technology. 1999, Vol 43, Num 4, pp 382-387, issn 1062-3701Article

Spectroscopic energy characterization of laser-induced titanium plumeCHU, S. S; MENGI YE; GRIGOROPOULOS, C. P et al.Microscale thermophysical engineering (Print). 1999, Vol 3, Num 3, pp 189-197, issn 1089-3954Article

Optical measurement systems for industrial inspection (Munich, 16-17 June 1999)Kujawińska, Małgorzata; Osten, Wolfgang.SPIE proceedings series. 1999, isbn 0-8194-3310-1, IX, 394 p, isbn 0-8194-3310-1Conference Proceedings

An optical system for measuring the eccentricity of glass wool pipe for : industrial useUEDA, M; MURASE, F; TAKAHASHI, F et al.Optics and lasers in engineering. 1999, Vol 31, Num 6, pp 493-501, issn 0143-8166Article

Applications of laser speckle photography for thermal flow problemsKIHM, K. D.Optics and lasers in engineering. 1998, Vol 29, Num 2-3, pp 171-200, issn 0143-8166Article

Recent developments in optical gauge block metrology (San Diego CA, 20-21 July 1998)Decker, Jennifer E; Brown, Nicholas.SPIE proceedings series. 1998, isbn 0-8194-2932-5, XII, 308 p, isbn 0-8194-2932-5Conference Proceedings

Optical determination of the thickness of thin films symmetrically deposited on both sides of the substratesCHENGYUN, W; XUEGUANG, S; JUNJUN, M et al.Measurement science & technology (Print). 1997, Vol 8, Num 8, pp 911-916, issn 0957-0233Article

Real-time optical measuring system for dye colour and concentration-II. Dispersive dyeUEDA, M; MATSUMURA, A; KAWAZU, M et al.Optics and lasers in engineering. 1997, Vol 27, Num 3, pp 259-267, issn 0143-8166Article

High-pressure stopped-flow spectrometer for kinetic studies of fast reactions by absorbance and fluorescence detectionBUGNON, P; LAURENCZY, G; DUCOMMUN, Y et al.Analytical chemistry (Washington, DC). 1996, Vol 68, Num 17, pp 3045-3049, issn 0003-2700Article

Singlemode optical fiber electronic speckle pattern interferometryLIU, W; TAN, Y; SHANG, H. M et al.Optics and lasers in engineering. 1996, Vol 25, Num 2-3, pp 103-109, issn 0143-8166Article

Some new optical measurement techniques for the study of crystal growth and electrode processesYU, X; YU, X et al.LIU, Y; YU, X; YU, X et al.Optics and lasers in engineering. 1996, Vol 25, Num 2-3, pp 191-204, issn 0143-8166Article

An optical instrument for monitoring the internal conditions of high-voltage circuit breakersCOLOMBO, E; EMOLUMENTO, E; MENCHISE, M et al.Measurement science & technology (Print). 1995, Vol 6, Num 11, pp 1582-1587, issn 0957-0233Article

Description of an integrated scatter instrument for measuring scatter losses of superpolished optical surfacesKIENZLE, O; STAUB, J; TSCHUDI, T et al.Measurement science & technology (Print). 1994, Vol 5, Num 6, pp 747-752, issn 0957-0233Article