Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Optical microscopy")

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 29554

  • Page / 1183

Export

Selection :

  • and

Dark-field optical microscopy : a new technique to study recrystallization in commercial purity aluminiumGEORGE, R; KASHYAP, K. T; DILIP, S et al.Materials characterization. 2007, Vol 58, Num 10, pp 1016-1018, issn 1044-5803, 3 p.Article

Characterization of near-field optical microscope probesKLAPETEK, Petr; VALTR, Miroslav; KLENOVSKY, Petr et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 482-485, issn 0142-2421, 4 p.Conference Paper

Quantitative composition of ancient mortars from the Notre Dame Cathedral in Tournai (Belgium)MERTENS, G; ELSEN, J; BRULET, R et al.Materials characterization. 2009, Vol 60, Num 7, pp 580-585, issn 1044-5803, 6 p.Conference Paper

Imaging of submicron index variations by scanning optical tunnelingCOURJON, D; BAINIER, C; SPAJER, M et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1992, Vol 10, Num 6, pp 2436-2439, issn 1071-1023Conference Paper

Dark-field optical coherence microscopyVILLIGER, Martin; PACHE, Christophe; LASSER, Theo et al.Optics letters. 2010, Vol 35, Num 20, pp 3489-3491, issn 0146-9592, 3 p.Article

Femtosecond and nanosecond laser damage thresholds of doped and undoped triazenepolymer thin filmsBONSE, J; SOLIS, J; URECH, L et al.Applied surface science. 2007, Vol 253, Num 19, pp 7787-7791, issn 0169-4332, 5 p.Conference Paper

The staining of blue stone limestones petrographically unraveledDREESEN, Roland; NIELSEN, Peter; LAGROU, David et al.Materials characterization. 2007, Vol 58, Num 11-12, pp 1070-1081, issn 1044-5803, 12 p.Conference Paper

Characterizing the non-stationary blinking of silicon nanocrystalsCICHOS, Frank; MARTIN, Jörg; VON BORCZYSKOWSKI, Christian et al.Journal of luminescence. 2004, Vol 107, Num 1-4, pp 160-165, issn 0022-2313, 6 p.Conference Paper

Reconocimiento automatizado de menas metálicas mediante análisis digital de imagen: un apoyo al proceso mineralúrgico. II: criterios metalogenéticos discriminantes(•) = Automated microscopic characterization of metallic ores with image analysis: a key to improve ore processing. II: metallogenetic discriminating criteriaCASTROVIEJO, R; BERREZUETA, E.Revista de metalurgia (Madrid). 2009, Vol 45, Num 6, pp 439-456, issn 0034-8570, 18 p.Article

Muscovite mica: Flatter than a pancakeDE POEL, Wester; PINTEA, Stelian; DRNEC, Jakub et al.Surface science. 2014, Vol 619, pp 19-24, issn 0039-6028, 6 p.Article

Estimation of phase fraction in dual phase steel using microscopic characterizations and dilatometric analysisKANG, Jun-Yun; PARK, Seong-Jun; SUH, Dong-Woo et al.Materials characterization. 2013, Vol 84, pp 205-215, issn 1044-5803, 11 p.Article

Application of petrographic examination techniques to the assessment of fire-damaged concrete and masonry structuresINGHAM, Jeremy P.Materials characterization. 2009, Vol 60, Num 7, pp 700-709, issn 1044-5803, 10 p.Conference Paper

Reconocimiento automatizado de menas metâlicas mediante anâlisis digital de imagen : un apoyo al proceso mineralùrgico. I: ensayo metodológico(·) = Automated microscopic characterization of metallic ores with image analysis : a key to improve ore processing. I: test of the methodologyBERREZUETA, E; CASTROVIEJO, R.Revista de metalurgia (Madrid). 2007, Vol 43, Num 4, pp 294-309, issn 0034-8570, 16 p.Article

Determination of pigments in colour layers on walls of some selected historical buildings using optical and scanning electron microscopySEVER SKAPIN, A; ROPRET, P; BUKOVEC, P et al.Materials characterization. 2007, Vol 58, Num 11-12, pp 1138-1147, issn 1044-5803, 10 p.Conference Paper

Superresolution in confocal scanning microscopy: experimental confirmation in the 1D coherent caseYOUNG, M. R; DAVIES, R. E; PIKE, E. R et al.Europhysics letters (Print). 1989, Vol 9, Num 8, pp 773-778, issn 0295-5075, 6 p.Article

Fiber laser probe for near-field scanning optical microscopyBETZIG, E; GRUBB, S. G; CHICHESTER, R. J et al.Applied physics letters. 1993, Vol 63, Num 26, pp 3550-3552, issn 0003-6951Article

Scanning-tunneling optical microscopy : a theoretical macroscopic approachVA LABEKE, D; BARCHIESI, D.Journal of the Optical Society of America. A, Optics and image science. 1992, Vol 9, Num 5, pp 732-739, issn 0740-3232Article

Resolution in near-field optical microscopyISAACSON, M; CLINE, J; BARSHATZKY, H et al.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 15-22, issn 0304-3991Conference Paper

Kinetic limits for sensing tip morphology in near-field scanning optical microscopesYAKOBSON, B. I; MOYER, P. J; PAESLER, M. A et al.Journal of applied physics. 1993, Vol 73, Num 11, pp 7984-7986, issn 0021-8979, 1Article

QNear field optics and light confinementCOURJON, D; BAINIER, C; GIRARD, C et al.Annalen der Physik (Leipzig). 1993, Vol 2, Num 2, pp 149-158, issn 0003-3804Conference Paper

Two-dimensional near-field optical spectroscopy in magnetic fields up to 4 TTANAKA, Kenichiro; TSUKAGOSHI, Kazuhito; AOYAGI, Yoshinobu et al.Optical review. 2006, Vol 13, Num 4, pp 276-278, issn 1340-6000, 3 p.Conference Paper

Extinction Ratio in Apertureless Reflection-Mode Magneto-Optical Scanning Near-Field Optical MicroscopyAOYAGI, Mitsuharu; NIRATISAIRAK, Sanyalak; SIODA, Tatsutoshi et al.IEEE transactions on magnetics. 2012, Vol 48, Num 11, pp 3670-3672, issn 0018-9464, 3 p.Conference Paper

Multifocused microscopyLOCKSHIN, G. R; KOZEL, S. M; BIELONUCHKIN, V. YE et al.Experimentelle Technik der Physik. 1990, Vol 38, Num 5-6, pp 463-465, issn 0014-4924Conference Paper

Überlegungen zu der Grengen des Auflösungsvermögens von Fernfeld-mikroskopen unter besonderer Berücksichtigung von Fernfeld-Rasterverfahren = On the resolution limits in far-field-microscopy with particular respect to scanning schemesGRÖBLER, B; LANGBEIN, U.Optik (Stuttgart). 1989, Vol 81, Num 4, pp 175-180, issn 0030-4026, 6 p.Article

Magneto-Optical Study of the Surface Reversal Process in Amorphous Glass-Coated Microwires With Positive MagnetostrictionRICHTER, Kornel; THIAVILLE, Andre; VARGA, Rastislav et al.IEEE transactions on magnetics. 2014, Vol 50, Num 4, issn 0018-9464, 2501404.1-2501404.4, 1Conference Paper

  • Page / 1183