Application comparison of NIR spectrometers: Fourier transform (FT) versus diode arraysBEUERMANN, Thomas; WITTWER, Robert; WOHLFARTH, Michael et al.GIT laboratory journal Europe. 2004, Vol 8, Num 6, pp 40-42, issn 1611-6038, 3 p.Article

The challenge of nanometrologyPOSTEK, Michael T.SPIE proceedings series. 2002, pp 84-96, isbn 0-8194-4347-6, 13 p.Conference Paper

Guide to NISTKAMMER, Raymond.NIST special publication. 1998, issn 1048-776X, 184 p., GUIDESerial Issue

Solid electrolytes and materials science researchCHANDRASEKHARAIAH, M. S; MARGRAVE, J. L.High temperature and materials science. 1995, Vol 33, Num 2/3, pp 231-237, issn 1080-1278Conference Paper

Metrology break-out group SPIE conferenceBENNETT, Marylyn; BANKE, Bill; LYONS, Kevin et al.SPIE proceedings series. 2002, pp 97-101, isbn 0-8194-4347-6, 5 p.Conference Paper

Nanometer-Scale metrology: Meeting the nanotechnology measurement challengesPOSTEK, Michael T.SPIE proceedings series. 2002, pp 102-111, isbn 0-8194-4347-6, 10 p.Conference Paper

How to optimize spatial resolution in infrared microscopy & imagingNUNN, Simon.GIT laboratory journal Europe. 2004, Vol 8, Num 6, issn 1611-6038, p. 39Article

Standardisation: The future in NIRSEIDEL, Stefan.GIT laboratory journal Europe. 2004, Vol 8, Num 5, pp 22-23, issn 1611-6038, 2 p.Article

La métrologie au Brésil = Metrology in BrazilKINDUNDU, Christian.Technologies internationales (Strasbourg). 2003, Num 94, pp 3-6, issn 1165-8568, 4 p.Article

The critical role of metrology in nanotechnologySCHATTENBURG, Mark L; SMITH, Henry I.SPIE proceedings series. 2002, pp 116-124, isbn 0-8194-4347-6, 9 p.Conference Paper

A fast algorithm for determining the Gaussian filtered mean line in surface metrologyYUAN, Y.-B; QIANG, X.-F; SONG, J.-F et al.Precision engineering. 2000, Vol 24, Num 1, pp 62-69, issn 0141-6359Article

Calibration of micropipettes for pressure-probe studiesMURPHY, R; ORTEGA, J. K. E.Australian journal of plant physiology. 1998, Vol 25, Num 8, pp 947-951, issn 0310-7841Article

Rôle du porte-échantillon lors de mesures en cavité hyperfréquence (bande X) = Accounting for the sample holder when performing microwave cavity measurements (X band)JOUFFROY, M.Annales scientifiques de l'Université de Franche-Comté. Physique. 1995, Num 11, pp 23-34, issn 1162-9592Article

Robotic Video Photogrammetry SystemGUSTAFSON, P. C.SPIE proceedings series. 1997, pp 190-196, isbn 0-8194-2596-6Conference Paper

On-line ac magnetic measurements accuracyHAVLICEK, V; ZEMANEK, I.Journal of magnetism and magnetic materials. 1994, Vol 133, Num 1-3, pp 399-401, issn 0304-8853Conference Paper

The electronic detection of fine grain in large grained electrical steelsTAYLOR, R.Journal of magnetism and magnetic materials. 1994, Vol 133, Num 1-3, pp 402-404, issn 0304-8853Conference Paper

Non-equilibrium, irreversibility, non-linearity and instability in the operation of sensorsKIRSCHNER, I; LEPPAVUORI, S.Sensors and actuators. A, Physical. 1992, Vol 31, Num 1-3, pp 275-282, issn 0924-4247Conference Paper

Control of ionization in e-beam evaporators via optimum choice of focus-coil currentBHATIA, M. S; PATEL, K; JOSHI, A et al.Review of scientific instruments. 1989, Vol 60, Num 8, pp 2794-2796, issn 0034-6748Article

Elimination des distorsions d'appareil à l'aide du principe de rang des composantes modèles de l'information: propriétés de la solutionYAKOVLEV, A. A.Optika i spektroskopiâ. 1988, Vol 64, Num 1, pp 193-198, issn 0030-4034Article

Electronic controller for motorized micrometersKEEN, G. R; O'NEILL, J. A; PAUL, G. L et al.Review of scientific instruments. 1988, Vol 59, Num 7, pp 1248-1249, issn 0034-6748Article

NanotechnologyFRANKS, A.Journal of physics. E. Scientific instruments. 1987, Vol 20, Num 12, pp 1442-1451, issn 0022-3735Article

Performances and applications of the vector network analyzer HP 8510BBELLOMO, S; KOMRIJ, H.Alta frequenza. 1987, Vol 56, Num 4, pp 245-247, issn 0002-6557Article

Développement de l'antenne métrologie de l'école nationale d'ingénieurs de Tarbes = Development of Tarbes national school of engineering metrology departmentMUGNIERY, Bernard.1986, 3 p.Report

Correlation between the quasi-peak value of noise measured by Aiya's noise meter and the rms value measured by the ARN-2 recorderAGARWALA, R. A.IEEE transactions on electromagnetic compatibility. 1983, Vol 25, Num 4, pp 389-395, issn 0018-9375Article

Centro SIT 28/M ENEA-CR faenzaTIMPANARO, Marcello.Energia, ambiente e innovazione. 2006, Vol 52, Num 5, pp 51-57, issn 1124-0016, 7 p.Article