Contact area calculation between elastic solids bounded by mound rough surfacesPALASANTZAS, G.Solid state communications. 2003, Vol 125, Num 11-12, pp 611-615, issn 0038-1098, 5 p.Article

Influence of self-affine interface roughness on the charge capacitance between two dielectric mediaPALASANTZAS, G.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 7, pp 075309.1-075309.5, issn 1098-0121Article

Ballistic thermal conductance limited by phonon roughness scattering: A comparison of power-law and Gaussian roughnessPALASANTZAS, G.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 15, pp 153404.1-153404.4, issn 1098-0121Article

Influence of self-affine and mound roughness on the surface impedance and skin depth of conductive materialsPALASANTZAS, G.The Journal of physics and chemistry of solids. 2004, Vol 65, Num 7, pp 1271-1275, issn 0022-3697, 5 p.Article

Influence of self-affine roughness on the friction coefficient of rubber at high sliding velocityPALASANTZAS, G.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 19, pp 195409.1-195409.6, issn 1098-0121, 1Article

Adhesion of elastic films on mound rough surfacesPALASANTZAS, G.Surface science. 2003, Vol 529, Num 3, pp 527-532, issn 0039-6028, 6 p.Article

A study of (1+1)-dimensional height-height correlation functions for self-affine fractal morphologiesPALASANTZAS, G.Solid state communications. 1996, Vol 100, Num 10, pp 705-710, issn 0038-1098Article

Slope-slope correlations for self-affine rough surfacesPALASANTZAS, G.Solid state communications. 1996, Vol 100, Num 10, pp 699-703, issn 0038-1098Article

Roughness spectrum and surface width of self-affine fractal surfaces via the K-correlation modelPALASANTZAS, G.Physical review. B, Condensed matter. 1993, Vol 48, Num 19, pp 14472-14478, issn 0163-1829Article

Estimation of kinetic properties of particles forming random rough surfacesPALASANTZAS, G; GEERLIGS, L. J.Solid state communications. 1997, Vol 103, Num 10, pp 555-558, issn 0038-1098Article

Conductivity of quantum wires with rough boundariesPALASANTZAS, G; BARNAS, J.Physica status solidi. B. Basic research. 1999, Vol 211, Num 2, pp 671-679, issn 0370-1972Article

Effect of the form of the height-height correlation function on diffuse x-ray scattering from a self-affine surfacePALASANTZAS, G; KRIM, J.Physical review. B, Condensed matter. 1993, Vol 48, Num 5, pp 2873-2877, issn 0163-1829Article

Pull-in characteristics of electromechanical switches in the presence of Casimir forces : Influence of self-affine surface roughnessPALASANTZAS, G; DE HOSSON, J. Th. M.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 11, pp 115426.1-115426.5, issn 1098-0121Article

Roughness effect on the measurement of interface stressPALASANTZAS, G; DE HOSSON, J. Th. M.Acta materialia. 2000, Vol 48, Num 14, pp 3641-3645, issn 1359-6454Article

Surface roughness influence on the pull-in voltage of microswitches in presence of thermal and quantum vacuum fluctuationsPALASANTZAS, G; DEHOSSON, J. Th. M.Surface science. 2006, Vol 600, Num 7, pp 1450-1455, issn 0039-6028, 6 p.Article

Wetting on rough surfacesPALASANTZAS, G; DE HOSSON, J. Th. M.Acta materialia. 2001, Vol 49, Num 17, pp 3533-3538, issn 1359-6454Article

Influence of quasi-layer-by-layer roughness on proximity effects in thin film superconducting/normal-metal junctionsPALASANTZAS, G; DE HOSSON, J. Th. M.Physica. C. Superconductivity and its applications. 2001, Vol 355, Num 3-4, pp 211-216Article

Influence of proximity effects in superconductor/normal-metal junctions from mound roughness and film growth mechanismsPALASANTZAS, G; DE HOSSON, J. Th. M.Physica. C. Superconductivity and its applications. 2000, Vol 330, Num 1-2, pp 99-104Article

Interface roughness fractality effects on the electron mobility in semiconducting quantum wellsPALASANTZAS, G; BARNAS, J; GEERLIGS, L. J et al.Physica status solidi. B. Basic research. 1998, Vol 209, Num 2, pp 319-327, issn 0370-1972Article

Diffusion, nucleation and annealing of Co on the H-passivated Si(100) surfacePALASANTZAS, G; ILGE, B; DE NIJS, J et al.Surface science. 1998, Vol 412-13, pp 509-517, issn 0039-6028Article

Roughness of Microspheres for Force MeasurementsVAN ZWOL, P. J; PALASANTZAS, G; VAN DE SCHOOTBRUGGE, M et al.Langmuir. 2008, Vol 24, Num 14, pp 7528-7531, issn 0743-7463, 4 p.Article

Roughening aspects of room temperature vapor deposited oligomer thin films onto Si substratesPALASANTZAS, G; TSAMOURAS, D; DE HOSSON, J. Th. M et al.Surface science. 2002, Vol 507-10, pp 357-361, issn 0039-6028Conference Paper

Non-conformal interface roughness effects on the giant magnetoresistance in magnetic multilayersPALASANTZAS, G; BARNAS, J; DE HOSSON, J. Th. M et al.Surface science. 2001, Vol 482-85, pp 1026-1029, issn 0039-6028, 2Conference Paper

Influence of surface roughness on capillary and Casimir forcesVAN ZWOL, P. J; PALASANTZAS, G; DE HOSSON, J. Th. M et al.Proceedings of SPIE - The International Society for Optical EngineeringE. 2008, Vol 6800, pp 68000E.1-68000E.12, issn 0277-786X, isbn 978-0-8194-6971-7 0-8194-6971-8, 1VolConference Paper

Opportunities from the nanoworld : Gas phase nanoparticlesPALASANTZAS, G; KOCH, S. A; VYSTAVEL, T et al.Journal of alloys and compounds. 2008, Vol 449, Num 1-2, pp 237-241, issn 0925-8388, 5 p.Conference Paper