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THERMAL TRANSPIRATION: A COMPARISON OF EXPERIMENT AND THEORYSTORVICK TS; PARK HS.1978; J. VACUUM SCI. TECHNOL.; USA; DA. 1978; VOL. 15; NO 6; PP. 1844-1852; BIBL. 19 REF.Article

INACTIVATION OF SALMONELLA TYPHIMURIUM BY SORBIC ACIDPARK HS; MARTH EH.1972; J. MILK FOOD TECHNOL.; U.S.A.; DA. 1972; VOL. 35; NO 9; PP. 532-539; BIBL. 12REF.Serial Issue

ETUDE DES ALLIAGES AL-MG-ZN CONTENANT DES FORTES QUANTITES DE ZN ET MGHORIUCHI R; PARK HS.1974; J. JAP. INST. LIGHT METALS; JAP.; DA. 1974; VOL. 24; NO 10; PP. 458-466; ABS. ANGL.; BIBL. 14 REF.Article

GROWTH OF SALMONELLAE IN SKIMMILK WHICH CONTAINS ANTIBIOTICS = CROISSANCE DES SALMONELLES DANS LE LAIT ECREME CONTENANT DES ANTIBIOTIQUESPARK HS; MARTH EH.1972; J. MILK FOOD TECHNOL.; U.S.A.; DA. 1972; VOL. 35; NO 7; PP. 402-404; BIBL. 7REF.Serial Issue

SURVIVAL OF SALMONELLA TYPHIMURIUM IN REFRIGERATED CULTURED MILKS = SURVIE DE S. T. DANS DES LAITS FERMENTES REFRIGERESPARK HS; MARTH EH.1972; J. MILK FOOD TECHNOL.; U.S.A.; DA. 1972; VOL. 35; NO 8; PP. 489-495; BIBL. 28 REF.Serial Issue

A COMPARISON OF THE MOJONNIER AND ROESE-GOTTLIEB METHODS FOR DETERMINING MILKFAT CONTENT OF ICE CREAM.PARK HS; MCKEON JR.1978; J. FOOD PROTECT.; USA; DA. 1978; VOL. 41; NO 6; PP. 424-426; BIBL. 15 REF.Article

BEHAVIOR OF SALMONELLA TYPHIMURIUM IN SKIMMILK DURING FERMENTATION BY LACTIC ACID BACTERIA = COMPORTEMENT DE S. T. DANS LE LAIT ECREME PENDANT LA FERMENTATION PAR DES BACTERIES LACTIQUESPARK HS; MARTH EH.1972; J. MILK FOOD TECHNOL.; U.S.A.; DA. 1972; VOL. 35; NO 8; PP. 482-488; BIBL. 26 REF.Serial Issue

DEPENDENCE OF MOSFET NOISE PARAMETERS IN N-CHANNEL MOSFETS ON OXIDE THICKNESSPARK HS; VAN DER ZIEL A.1982; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1982; VOL. 25; NO 4; PP. 313-315; BIBL. 8 REF.Article

COMPARISON OF TWO 1/F NOISE MODELS IN MOSFETSPARK HS; VAN DER ZIEL A; LIU ST et al.1982; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1982; VOL. 25; NO 3; PP. 213-217; BIBL. 15 REF.Article

POISEUILLE FLOW AND THERMAL CREEP FLOW IN LONG, RECTANGULAR CHANNELS IN THE MOLECULAR AND TRANSITION FLOW REGIMES.LOYALKA SK; STORVICK TS; PARK HS et al.1976; J. VACUUM SOC. TECHNOL.; U.S.A.; DA. 1976; VOL. 13; NO 6; PP. 1188-1192; BIBL. 17 REF.Article

DISCRIMINATION BETWEEN ONE/F NOISE MODELS IN JUNCTIONS FIELD EFFECT TRANSISTORS AND METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTORS. NUMERICAL RESULTSVAN DER ZIEL A; ZIJLSTRA RJJ; PARK HS et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 6; PP. 4300-4304; BIBL. 5 REF.Article

A DISCREPANCY IN THE ELEMENTARY THEORY OF MOSFET MODELINGVAN DER ZIEL A; PARK HS; LIU ST et al.1979; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 12; PP. 942-944; BIBL. 10 REF.Article

DISCRIMINATION BETWEEN TWO NOISE MODELS IN METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORSPARK HS; VAN DER ZIEL A; ZIJLSTRA RJJ et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 1; PP. 296-299; BIBL. 9 REF.Article

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