Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localizationINFANTE, F; PERDU, P; KOR, H. B et al.Microelectronics and reliability. 2011, Vol 51, Num 9-11, pp 1684-1688, issn 0026-2714, 5 p.Conference Paper

Failure analysis of micro-heating elements suspended on thin membranesBRIAND, D; BEAUDOIN, F; COURBAT, J et al.Microelectronics and reliability. 2005, Vol 45, Num 9-11, pp 1786-1789, issn 0026-2714, 4 p.Conference Paper

Thermal laser stimulation effects on NMOS transistorFIRITI, A; HALLER, G; LEWIS, D et al.International Symposium on the Physical & Failure Analysis of Integrated Circuits. 2004, pp 107-110, isbn 0-7803-8454-7, 1Vol, 4 p.Conference Paper

ESD defect localization and analysis using pulsed OBIC techniquesBEAUCHENE, T; LEWIS, D; TREMOUILLES, D et al.Proceedings - Electrochemical Society. 2003, pp 156-165, issn 0161-6374, isbn 1-56677-389-X, 10 p.Conference Paper

Backside spectroscopic photon emission microscopy using intensified silicon CCDGLOWACKI, A; BOIT, C; PERDU, P et al.Microelectronics and reliability. 2014, Vol 54, Num 9-10, pp 2105-2108, issn 0026-2714, 4 p.Conference Paper

Frequency mapping in dynamic light emission with wavelet transformCHEF, S; JACQUIR, S; SANCHEZ, K et al.Microelectronics and reliability. 2013, Vol 53, Num 9-11, pp 1387-1392, issn 0026-2714, 6 p.Conference Paper

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysisBASCOUL, G; PERDU, P; BENIGNI, A et al.Microelectronics and reliability. 2011, Vol 51, Num 9-11, pp 1640-1645, issn 0026-2714, 6 p.Conference Paper

CADless laser assisted methodologies for failure analysis and device reliabilityDEYINE, A; SANCHEZ, K; PERDU, P et al.Microelectronics and reliability. 2010, Vol 50, Num 9-11, pp 1236-1240, issn 0026-2714, 5 p.Conference Paper

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniquesBOUYA, M; MALBERT, N; LABAT, N et al.Microelectronics and reliability. 2008, Vol 48, Num 8-9, pp 1366-1369, issn 0026-2714, 4 p.Conference Paper

Time resolved imaging using synchronous picosecond Photoelectric Laser StimulationDOUIN, A; POUGET, V; DE MATOS, M et al.Microelectronics and reliability. 2006, Vol 46, Num 9-11, pp 1514-1519, issn 0026-2714, 6 p.Conference Paper

Effect of physical defect on shmoos in CMOS DSM technologiesMACHOUATA, A; HALLER, G; GOUBIER, V et al.Microelectronics and reliability. 2008, Vol 48, Num 8-9, pp 1333-1338, issn 0026-2714, 6 p.Conference Paper

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICsSIENKIEWICZ, M; PERDU, P; FIRITI, A et al.Microelectronics and reliability. 2008, Vol 48, Num 8-9, pp 1529-1532, issn 0026-2714, 4 p.Conference Paper

Long-term reliability of silicon bipolar transistors subjected to low constraintsCROSSON, A; ESCOTTE, L; BAFLEUR, M et al.Microelectronics and reliability. 2007, Vol 47, Num 9-11, pp 1590-1594, issn 0026-2714, 5 p.Conference Paper

Descrambling and data reading techniques for Flash-EEPROM memories. Application to smart cardsDENARDI, C; DESPLATS, R; PERDU, P et al.Microelectronics and reliability. 2006, Vol 46, Num 9-11, pp 1569-1574, issn 0026-2714, 6 p.Conference Paper

Light emission to time resolved emission for IC debug and failure analysisREMMACH, M; PIGOZZI, A; DESPLATS, R et al.Microelectronics and reliability. 2005, Vol 45, Num 9-11, pp 1476-1481, issn 0026-2714, 6 p.Conference Paper

Study of the ESD defects impact on ICS reliabilityESSELY, F; BESTORY, C; GUITARD, N et al.Microelectronics and reliability. 2004, Vol 44, Num 9-11, pp 1811-1815, issn 0026-2714, 5 p.Conference Paper

Improving yield and reliability of FIB modifications using electrical testingDESPLATS, R; BENBRIK, J; BENTEO, B et al.SPIE proceedings series. 1998, pp 47-53, isbn 0-8194-2969-4Conference Paper

Dynamic study of the thermal laser stimulation response on advanced technology structuresREVERDY, A; DE LA BARDONNIE, M; POIRIER, P et al.Microelectronics and reliability. 2008, Vol 48, Num 10, pp 1689-1695, issn 0026-2714, 7 p.Article

Dynamic laser stimulation techniques for advanced failure analysis and design debug applicationsBEAUDOIN, F; SANCHEZ, K; PERDU, P et al.Microelectronics and reliability. 2007, Vol 47, Num 9-11, pp 1517-1522, issn 0026-2714, 6 p.Conference Paper

Different failure signatures of multiple TLP and HBM stresses in an ESD robust protection structureGUITARD, N; ESSELY, F; TREMOUILLES, D et al.Microelectronics and reliability. 2005, Vol 45, Num 9-11, pp 1415-1420, issn 0026-2714, 6 p.Conference Paper

NIR laser stimulation for dynamic timing analysisSANCHEZ, K; DESPLATS, R; BEAUDOIN, F et al.Microelectronics and reliability. 2005, Vol 45, Num 9-11, pp 1459-1464, issn 0026-2714, 6 p.Conference Paper

Oxide charge measurements in EEPROM devicesDE NARDI, C; DESPLATS, R; PERDU, P et al.Microelectronics and reliability. 2005, Vol 45, Num 9-11, pp 1514-1519, issn 0026-2714, 6 p.Conference Paper

Backside failure analysis of GaAs MMIC ASICsBEAUDOIN, F; CARISETTI, D; CLEMENT, J. C et al.EPJ. Applied physics (Print). 2004, Vol 27, Num 1-3, pp 475-477, issn 1286-0042, 3 p.Conference Paper

Implementation of TRE systems into Emission MicroscopesTOSI, A; REMMACH, M; DESPLATS, R et al.Microelectronics and reliability. 2004, Vol 44, Num 9-11, pp 1529-1534, issn 0026-2714, 6 p.Conference Paper

Femtosecond laser ablation for backside silicon thinningBEAUDOIN, F; LOPEZ, J; FAUCON, M et al.Microelectronics and reliability. 2004, Vol 44, Num 9-11, pp 1605-1609, issn 0026-2714, 5 p.Conference Paper