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ON THE USE OF AN ELECTRON SPECTROMETER AS DETECTOR FOR SOFT X-RAY SPECTRAEBEL MF.1975; X-RAY SPECTROM.; G.B.; DA. 1975; VOL. 4; NO 1; PP. 43-46; BIBL. 6 REF.Article

X-RAY PHOTOELECTRON SPECTROSCOPY OF GLASS IN THEORY AND EXPERIMENTSTEPHENSON DA; BINKOWSKI NJ.1975; J. NON-CRYST. SOLIDS; NETHERL.; DA. 1975; VOL. 19; PP. 87-88; (GLASS SURF. ROLLA CERAM. MATER. CONF. GLASS SURF. 4. PROC.; ST. LOUIS, MO.; 1975)Conference Paper

ELEMENTAL SENSITIVITIES OF METALS IN X-RAY PHOTOELECTRON SPECTROSCOPYJANGHORBANI M; VULLI M; STARKE K et al.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 13; PP. 2200-2208; BIBL. 11 REF.Article

CHOIX D'UN ETALON POUR ESCANEFEDOV VI; KAKHANA MM.1972; ZH. ANAL. KHIM.; S.S.S.R.; DA. 1972; VOL. 27; NO 10; PP. 2049-2052; ABS. ANGL.; BIBL. 8 REF.Serial Issue

RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCEBERTHOU H; JORGENSEN CK.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 3; PP. 482-488; BIBL. 15 REF.Article

X-RAY PHOTOELECTRON SPECTROSCOPY (ESCA), A CHEMICAL AND SURFACE ANALYSIS METHODVAN DER KELEN G.1975; SILIC. INDUSTR.; BELG.; DA. 1975; VOL. 40; NO 3; PP. 75-80; ABS. FR. ALLEM.; BIBL. 11 REF.Article

APPLICATIONS OF PHOTOELECTRON SPECTROSCOPY TO ANALYTICAL CHEMISTRYCHENG KL; PRATHER JW II.1975; C.R.C. CRIT. REV. ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 5; NO 1; PP. 37-84; BIBL. 3 P. 1/2Article

X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF PBO SURFACES BOMBARDED WITH HE+, NE+, AR+, XE+ AND KR+KIM KS; BAITINGER WE; WINOGRAD N et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 55; NO 1; PP. 285-290; BIBL. 16 REF.Article

QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY (ESCA)SWINGLE RS II.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 1; PP. 21-24; BIBL. 30 REF.Article

AUGER PARAMETER IN ELECTRON SPECTROSCOPY FOR THE IDENTIFICATION OF CHEMICAL SPECIESWAGNER CD.1975; ANAL. CHEM.; U.S.A.; DA. 1975; VOL. 47; NO 7; PP. 1201-1203; BIBL. 7 REF.Article

CONCENTRATION PROFILES FOR IRREGULAR SURFACES FROM X-RAY PHOTOELECTRON ANGULAR DISTRIBUTIONSBAIRD RJ; FADLEY CS; KAWAMOTO SK et al.1976; ANAL. CHEM.; U.S.A.; DA. 1976; VOL. 48; NO 6; PP. 843-846; BIBL. 13 REF.Article

ELECTRON SPECTROSCOPY: X-RAY AND ELECTRON EXCITATIONHERCULES DM.1976; ANAL. CHEM.; U.S.A.; DA. 1976; VOL. 48; NO 5; PP. 294R-313R; BIBL. 7 P.Article

SOME RECENT APPLICATIONS OF X-RAY PHOTOELECTRON SPECTROSCOPYSWIFT P.1975; U.V. SPECTROM. GROUP BULL.; G.B.; DA. 1975; NO 3; PP. 5-42; BIBL. 1 P. 1/2Article

APPLICATION DE L'ESCA A L'ETUDE D'OXYDES A BASE DE COBALTBONNELLE JP; GRIMBLOT J; D'HUYSSER A et al.1975; VIDE; FR.; DA. 1975; VOL. 30; NO 176; PP. 86-87; ABS. ANGL.; BIBL. 6 REF.Article

ELECTRON SPECTROSCOPY WITH MONOCHROMATIZED X-RAYS. THIS TECHNIQUE CONSTITUES A SECOND-GENERATION APPROACH FOR A NEW ANALYTICAL METHODSIEGBAHN K; HAMMOND D; FELLNER FELDEGG H et al.1972; SCIENCE; U.S.A.; DA. 1972; VOL. 176; NO 4032; PP. 245-252; BIBL. 12 REF.Serial Issue

Transitions radiatives du cœur à la bande de valence dans les cristaux CsCl et CsCaCl2MEL'CHAKOV, E.N; RODNYJ, P.A; RYBAKOV, B.V et al.Fizika tverdogo tela. 1989, Vol 31, Num 5, pp 276-278, issn 0367-3294Article

QUANTITATIVE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLESEBEL MF; EBEL H; HIROKAWA K et al.1982; SPECTROCHIM. ACTA, B: AT. SPECTROSC.; ISSN 0584-8547; GBR; DA. 1982; VOL. 37; NO 6; PP. 461-471; BIBL. 33 REF.Article

EXTERNAL STANDARDS IN X-RAY PHOTOELECTRON SPECTROSCOPY. A COMPARISON OF GOLD, CARBON, AND MOLYBDENUM TRIOXIDEDIANIS WP; LESTER JE.1973; ANAL. CHEM.; U.S.A.; DA. 1973; VOL. 45; NO 8; PP. 1416-1420; BIBL. 19 REF.Serial Issue

SELECTED AREA X-RAY PHOTOELECTRON SPECTROSCOPYKEAST DJ; DOWNING KS.1981; SURF. INTERFACE; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 99-101; BIBL. 3 REF.Article

X-RAY PHOTOELECTRON ANALYSIS OF SURFACE LAYERS WITH COMPOSITION GRADIENTSNEFEDOV VI.1981; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1981; VOL. 3; NO 2; PP. 72-75; BIBL. 9 REF.Article

SURFACE ANALYSIS OF INSB BY X-RAY PHOTOELECTRON SPECTROSCOPY (XPS).COPPERTHWAITE RG; KUNZE OA; LLOYD J et al.1978; Z. NATURFORSCH., A; DTSCH.; DA. 1978; VOL. 33; NO 5; PP. 523-527; BIBL. 15 REF.Article

USEFULNESS OF PHOTON MASS ATTENUATION COEFFICIENTS IN ELEMENTAL ANALYSISKOURIS K; SPYROU NM.1978; NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 153; NO 2-3; PP. 477-483; BIBL. 11 REF.Article

A NEW METHOD FOR DETERMINING SULFOXIDES IN PEPTIDE MOLECULES USING X-RAY PHOTOELECTRON SPECTROSCOPYJONES D; DISTEFANO G; TONIOLO C et al.1978; BIOPOLYMERS; USA; DA. 1978; VOL. 17; NO 11; PP. 2703-2713; BIBL. 47 REF.Article

X-RAY PHOTOELECTRON SPECTROSCOPIE CHARACTERIZATION OF COPPER OXIDE SURFACES TREATED WITH BENZOTRIAZOLEROBERTS RF.1974; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1974; VOL. 4; NO 4; PP. 273-291; BIBL. 30 REF.Article

DIE ANALYTISCHEN MOEGLICHKEITEN DER ROENTGEN-PHOTOELEKTRONEN-SPEKTROSKOPIE = LES POSSIBILITES ANALYTIQUES DE LA SPECTROSCOPIE PHOTOELECTRONIQUE RXBRUGEL W.1973; Z. (FRESENIUS') ANAL. CHEM.; DTSCH.; DA. 1973; VOL. 263; NO 4; PP. 272-282; ABS. ANGL.; BIBL. 9 REF.Serial Issue

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