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LINEARIZATION OF POLYCRYSTALLINE FILM GAUGE FACTORSPICHARD CR; TELLIER CR.1979; REV. PHYS. APPL.; FRA; DA. 1979; VOL. 14; NO 8; PP. 743-747; ABS. FRE; BIBL. 20 REF.Article

LIMITING VALUES OF THE SPECULARITY REFLECTION COEFFICIENT IN THE COTTEY SIZE EFFECT MODEL = VALEURS LIMITES DU COEFFICIENT DE REFLEXION SPECULAIRE DANS LE MODELE DE L'EFFET DIMENSIONNEL DE COTTEYTELLIER CR; PICHARD CR; TOSSER AJ et al.1982; JOURNAL OF MATERIALS SCIENCE LETTERS; ISSN 510106; GBR; DA. 1982; VOL. 1; NO 6; PP. 271-273; BIBL. 18 REF.Article

THERMOELECTRIC POWER OF SUPPORTED THIN POLYCRYSTALLINE FILMSPICHARD CR; TOSSER AJ; TELLIER CR et al.1982; JOURNAL OF MATERIALS SCIENCE; ISSN 0022-2461; GBR; DA. 1982; VOL. 17; NO 1; PP. 10-16; BIBL. 41 REF.Article

EXPERIMENTAL DETERMINATION OF ELECTRONIC TRANSPORT PARAMETERS IN MONOCRYSTALLINE METALLIC FILMS = DETERMINATION EXPERIMENTALE DES PARAMETRES DE TRANSPORT ELECTRONIQUE DANS DES COUCHES MINCES METALLIQUES MONOCRISTALLINESTELLIER CR; PICHARD CR; TOSSER AJ et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 76; NO 2; PP. 129-139; BIBL. 29 REF.Article

MODELISATION UNIQUE DES DIVERSES SENSIBILITES DE CAPTEURS EN COUCHES MINCES CONDUCTRICES = UNIQUE MODELLING OF THE VARIOUS SENSIBILITIES OF CONDUCTING FILM SENSORSTOSSER AJ; TELLIER CR; PICHARD CR et al.1981; APPLIED MODELLING AND SIMULATION. INTERNATIONAL CONFERENCE. 1/1980/LYON; FRA; TASSIN-LA-DEMI-LUNE: ASSOCIATION POUR LA PROMOTION DES TECHNIQUES DE MODELISATION ET DE SIMULATION DANS L'ENTREPRISE; DA. 1981; VOL. 2; PP. 63-67; BIBL. 37 REF.Conference Paper

PHYSICAL BASIS OF WARKUSZ'S EQUATION FOR POLYCRYSTALLINE METALLIC CONDUCTIVITY = BASE PHYSIQUE DE L'EQUATION DE WARKUSZ POUR LA CONDUCTIVITE DE POLYCRISTAUX METALLIQUESPICHARD CR; TOSSER AJ; TELLIER CR et al.1980; ELECTROCOMPON. SCI. TECHNOL.; GBR; DA. 1980; VOL. 6; NO 2; PP. 87-89; BIBL. 9 REF.Article

GRAPHICAL DETERMINATION OF THE ENERGY DEPENDENCE OF THE THERMOELECTRIC POWER OF THIN MONOCRYSTALLINE METAL FILMSTELLIER CR; PICHARD CR; TOSSER AJ et al.1982; JOURNAL OF MATERIALS SCIENCE; ISSN 0022-2461; GBR; DA. 1982; VOL. 17; NO 1; PP. 290-294; BIBL. 52 REF.Article

THICKNESS DEPENDENCE OF THE TEMPERATURE COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE FILMS IN A THREE-DIMENSIONAL CONDUCTION MODELPICHARD CR; TELLIER CR; TOSSER AJ et al.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-05-16; VOL. 65; NO 1; PP. 327-334; BIBL. 42 REF.Article

LINEAR VARIATIONS IN CONDUCTIVITY WITH THICKNESS OF THIN POLYCRYSTALLINE FILMSPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1980; VOL. 15; NO 9; PP. 2236-2240; BIBL. 19 REF.Article

THERMAL STRAINS IN THIN METALLIC FILMSPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 7; PP. 1325-1329; BIBL. 9 REF.Article

THREE-DIMENSIONAL ANALYTICAL EXPRESSIONS OF STRAIN GAUGE COEFFICIENTS OF INFINITELY THICK POLYCRISTALLINE METAL FILMSPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1980; VOL. 15; NO 12; PP. 2991-2994; BIBL. 22 REF.Article

APPROXIMATE ANALYTICAL EXPRESSIONS FOR THE RESISTIVITY AND TCR OF THIN MONOCRYSTALLINE METALLIC FILMSTELLIER CR; PICHARD CR; TOSSER AJ et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 65; NO 2; PP. L1-L2; BIBL. 9 REF.Article

EXPRESSION OF HALL COEFFICIENT OF THIN METAL FILMS IN THE PRESENCE OF IMPURITY EFFECTS = EXPRESSION DU COEFFICIENT DE HALL DE COUCHES MINCES METALLIQUES EN PRESENCE D'EFFETS D'IMPURETESPICHARD CR; TELLIER CR; TOSSER AJ et al.1982; J. MATER. SCI. LETT.; ISSN 0261-8028; GBR; DA. 1982; VOL. 1; NO 10; PP. 423-425; BIBL. 32 REF.Article

THICKNESS DEPENDENCE OF THE TEMPERATURE COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE FILMS IN A THREE-DIMENSIONAL CONDUCTION MODELPICHARD CR; TELLIER CR; TOSSER AJ et al.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1981; VOL. 65; NO 1; PP. 327-334; ABS. GER; BIBL. 42 REF.Article

THIN POLYCRYSTALLINE METALLIC-FILM CONDUCTIVITY UNDER THE ASSUMPTION OF ISOTROPIC GRAIN-BOUNDARY SCATTERINGTOSSER AJ; TELLIER CR; PICHARD CR et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 4; PP. 944-948; BIBL. 27 REF.Article

RELATION BETWEEN THE METAL FILM RESISTIVITY, ITS TEMPERATURE COEFFICIENT OF RESISTIVITY AND ITS HALL COEFFICIENT IN A GRAIN BOUNDARY CONDUCTION MODELPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; J. PHYS. F; ISSN 0305-4608; GBR; DA. 1980; VOL. 10; NO 3; PP. L101-L103; BIBL. 13 REF.Article

STATISTICAL MODEL OF ELECTRICAL CONDUCTION IN POLYCRYSTALLINE METALS = MODELE STATISTIQUE POUR LA CONDUCTION ELECTRIQUE DANS LES METAUX POLYCRISTALLINSTELLIER CR; PICHARD CR; TOSSER AJ et al.1979; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1979; VOL. 61; NO 3; PP. 349-354; BIBL. 6 REF.Article

DEPENDENCE OF THE RESISTIVITY AND HALL COEFFICIENT IN THIN METALLIC FILMS ON THE THICKNESS AND THE TRANSVERSE MAGNETIC FIELD = VARIATION DE LA RESISTIVITE ET DU COEFFICIENT DE HALL DANS LES COUCHES MINCES METALLIQUES AVEC L'EPAISSEUR ET LE CHAMP MAGNETIQUE TRANSVERSALPICHARD CR; TOSSER AJ; TELLIER CR et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 81; NO 2; PP. 169-180; BIBL. 32 REF.Article

THREE DIMENSIONAL ANALYTICAL SEPARATION OF GRAIN BOUNDARY AND SURFACE SCATTERINGS IN POLYCRYSTALLINE METAL FILMS IN THE CASE OF NON CUBIC GRAINS = SEPARATION ANALYTIQUE A TROIS DIMENSIONS DES DIFFUSIONS AUX JOINTS DE GRAINS ET EN SURFACE POUR LES COUCHES MINCES METALLIQUES POLYCRISTALLINES DANS LE CAS DE GRAINS NON CUBIQUESTELLIER CR; PICHARD CR; TOSSER AJ et al.1981; ELECTROCOMPON. SCI. TECHNOL.; ISSN 0305-3091; GBR; DA. 1981; VOL. 9; NO 2; PP. 125-130; BIBL. 21 REF.Article

SUPERIMPOSED EFFECTS OF THREE ARRAYS OF SCATTERING PLANES ON ELECTRICAL CONDUCTIVITYPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; PHYS. STATUS SOLIDI (B), BASIC RES.; DDR; DA. 1980; VOL. 99; NO 1; PP. 353-358; ABS. FRE; BIBL. 11 REF.Article

THEORETICAL ANALYSIS OF THE HALL EFFECT IN THIN POLYCRYSTALLINE METALLIC FILMSPICHARD CR; TOSSER AJ; TELLIER CR et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 2; PP. 451-456; BIBL. 32 REF.Article

THREE-DIMENSIONAL STRAIN COEFFICIENTS OF RESISTIVITY OF THIN POLYCRYSTALLINE METAL FILMSTELLIER CR; PICHARD CR; TOSSER AJ et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 8; PP. 2281-2286; BIBL. 23 REF.Article

CONTRIBUTION DES JOINTS DE GRAINS PARALLELES ET PERPENDICULAIRES AU CHAMP ELECTRIQUE A LA RESISTIVITE ELECTRIQUE DE COUCHES METALLIQUES POLYCRISTALLINES = CONTRIBUTION OF PARALLEL AND PERPENDICULAR TO ELECTRIC FIELD GRAIN BOUNDARIES TO ELECTRICAL RESISTIVITY OF POLYCRYSTALLINE THIRIFILMSPICHARD CR; TELLIER CR; TOSSER AJ et al.1981; VIDE COUCHES MINCES; ISSN 0223-4335; FRA; DA. 1981; VOL. 36; NO 208; PP. 619-626; ABS. ENG; BIBL. 38 REF.Article

ABOUT THE ORIGIN OF MAGNETORESISTANCE IN RELATIVELY THIN METAL FILMSTELLIER CR; TOSSER AJ; PICHARD CR et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 4; PP. 1118-1121; BIBL. 16 REF.Article

HALL COEFFICIENT OF THIN POLYCRYSTALLINE METALLIC FILMS IN A THREE-DIMENSIONAL SCATTERING MODEL = COEFFICIENT HALL DE COUCHES MINCES METALLIQUES POLYCRISTALLINES DANS UN MODELE DE DIFFUSION A TROIS DIMENSIONSPICHARD CR; TELLIER CR; TOSSER AJ et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 69; NO 2; PP. 157-164; BIBL. 21 REF.Article

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