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au.\*:("PICKAR KA")

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ION IMPLANTATION IN SILICON-PHYSICS, PROCESSING, AND MICROELECTRONIC DEVICES.PICKAR KA.1975; APPL. SOLID STATE SCI.; U.S.A.; DA. 1975; VOL. 5; PP. 151-249; BIBL. 7 P. 1/2Article

CARRIER TRANSPORT AND STORAGE EFFECTS IN AU ION IMPLANTED SIO2 STRUCTURESCHEN LI; PICKAR KA; SZE SM et al.1972; SOLID-STATE ELECTRON.; G.B.; DA. 1972; VOL. 15; NO 9; PP. 979-986; BIBL. 18 REF.Serial Issue

A DOPED SURFACE TWO-PHASE CCDKRAMBECK RH; WALDEN RH; PICKAR KA et al.1972; BELL SYST. TECH. J.; U.S.A.; DA. 1972; VOL. 51; NO 8; PP. 1849-1866; BIBL. 9 REF.Serial Issue

GETTERING RATES OF VARIOUS FAST-DIFFUSING METAL IMPURITIES AT ION-DAMAGED LAYERS ON SILICONBUCK TM; PICKAR KA; POATE JM et al.1972; APPL. PHYS. LETTERS; U.S.A.; DA. 1972; VOL. 21; NO 10; PP. 485-487; BIBL. 15 REF.Serial Issue

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