LONG-TERM MONITORING OF A GROUP OF STANDARD CELLS BY MEANS OF THE AC JOSEPHSON EFFECT.HARVEY IK; MACFARLANE JC; FRENKEL et al.1976; METROLOGIA; ALLEM.; DA. 1976; VOL. 12; NO 2; PP. 55-56; BIBL. 3 REF.Article

ANALYSE DES DONNEES SUR LA PERIODICITE DU CONTROLE DES ETALONS DE MESURE DES LABORATOIRES DE CONTROLE D'ETATZELENCOV BP; MOSKVICHJEKOVA TS.1972; IZMERITEL. TEKH.; S.S.S.R.; DA. 1972; NO 8; PP. 70-71Serial Issue

ANALYSE STATISTIQUE DE L'ETAT DES PILES ETALONSZELENTSOV BP; SHILOV AM.1977; IZMERITEL. TEKH.; S.S.S.R.; DA. 1977; NO 9; PP. 57-58; BIBL. 5 REF.Article

LE CENTRE D'ETALONNAGE "ELECTRICITE DU CERT". II: GESTION AUTOMATIQUE D'UN ENSEMBLE DE PILES ETALONSJOUVE M; PANIER M; ZAGO F et al.1979; BULL. INFORM. BUR. NATION. METROL.; FRA; DA. 1979; VOL. 10; NO 36; PP. 18-24; ABS. ENGArticle

MONITORING THE NSL STANDARD OF EMF USING THE AC JOSEPHSON EFFECTHARVEY IK; MACFARLANE JC; FRENKEL RB et al.1972; METROLOGIX; ALLEM.; DA. 1972; VOL. 8; NO 3; PP. 114-124; BIBL. 22 REF.Serial Issue

AUTOMATED MEASUREMENTS1972; IN: CONF. PRECIS ELECTROMAGN. MEAS. BOULDER, COLO, 1972; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1972; PP. 178-190; BIBL. DISSEM.Conference Paper

MEASUREMENT STANDARDS LABORATORY, IMPROVED CAPABILITY.SKINNER AD.1977; MARCONI INSTRUMENT.; G.B.; DA. 1977; VOL. 15; NO 6; PP. 123-127; ABS. FR. ALLEM. ITAL. ESP.; BIBL. 2 REF.Article

ETALONS REPRESENTATIFS DE L'OHM ET DU VOLT. SITUATION AU 1ER JANVIER 1977LECLERC G.1978; METROLOGIA; DEU; DA. 1978; VOL. 14; NO 4; PP. 171-174; ABS. ENG; BIBL. 7 REF.Article

THERMOSTAT POUR ELEMENTS NORMAUXPASHKEVICH R EH; EGORYCHEV LN; ASMUS VI et al.1975; IZMERITEL. TEKH.; S.S.S.R.; DA. 1975; NO 12; PP. 67Article

UTILISATION DE JONCTIONS TUNNEL SUPRACONDUCTRICES STABLES AU MAINTIEN DES PILES ETALONS DE TENSION.PECH T.1975; IN: ELECTRON. MES. COLLOQ. INT. COMMUN.; PARIS; 1975; PARIS; COM. ORGAN. COLLOQ. INT. ELECTRON. MES.; DA. 1975; PP. 59-66; ABS. ANGL.; BIBL. 1 REF.Conference Paper

The characteristic of Millivolt EMF standard cellsJIN QU; LIU TIANQING; DIAO GUOWANG et al.IEEE transactions on instrumentation and measurement. 1993, Vol 42, Num 3, pp 783-785, issn 0018-9456Article

Automatisation des mesures de piles étalons au LCIE = Automatization of the measurement on standard cells at LCIESOUCEK, R.Onde électrique. 1988, Vol 68, Num 4, pp 50-53, issn 0030-2430Article

An automatic system for accurate standard cell comparisonsWITT, T. J.IEEE transactions on instrumentation and measurement. 1985, Vol 34, Num 2, pp 270-274, issn 0018-9456Article

The automation of standard cell intercomparisonsDUNN, A. F.IEEE transactions on instrumentation and measurement. 1985, Vol 34, Num 2, pp 275-278, issn 0018-9456Article

A PRECISE DETERMINATION OF THE EMF-TEMPERATURE COEFFICIENT OF THE SATURATED STANDARD CELLS1980; SCI. SIN.; ISSN 0582-236X; CHN; DA. 1980; VOL. 23; NO 11; PP. 1481-1490; BIBL. 8 REF.Article

Empirical and theoretical studies of the simulated evolution method applied to standard cell placementKLING, R. M; BANERJEE, P.IEEE transactions on computer-aided design of integrated circuits and systems. 1991, Vol 10, Num 10, pp 1303-1315, issn 0278-0070Article

High speed regenerator-section terminating LSI operating up to 2.5 Gbit/s using 0.5μm Si bipolar standard-cell technologyKAWAI, K; KOIKE, K; ICHINO, H et al.Electronics Letters. 1995, Vol 31, Num 10, pp 791-792, issn 0013-5194Article

Automatic synthesis of large Moore sequencersGERBAUX, L; SAUCIER, G.Integration (Amsterdam). 1992, Vol 13, Num 3, pp 259-281, issn 0167-9260Article

Fuzzy-clustering-based algorithm for circuit partitioning in standard cell placementJIN-TAI YAN.Electronics Letters. 1995, Vol 31, Num 3, pp 151-152, issn 0013-5194Article

RET compliant cell generation for sub-130nm processesTORRES, J. A; CHOW, D; DE DOOD, P et al.SPIE proceedings series. 2002, pp 529-539, isbn 0-8194-4439-1, 11 p.Conference Paper