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CHECKING OF LINEARITY OF THE PHOTOELECTRIC SYSTEM OF A MICROSCOPE PHOTOMETERPILLER H.1981; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1981; VOL. 121; NO 2; PP. 221-224; BIBL. 4 REF.Article

DOMAINS OF MICROSCOPE PHOTOMETRY IN MATERIALS SCIENCEPILLER H.1979; J. MICR.; GBR; DA. 1979; VOL. 116; NO 3; PP. 295-310; BIBL. 1 P.Article

A UNIVERSAL SYSTEM FOR MEASURING AND PROCESSING THE CHARACTERISTIC GEOMETRICAL AND OPTICAL MAGNITUDES OF MICROSCOPIC OBJETSPILLER H.1973; ADV. OPT. ELECTRON MICR.; G.B.; DA. 1973; VOL. 5; PP. 95-114; BIBL. 10 REF.Serial Issue

Refinements in the measurement of reflectance = Amélioration dans la mesure du pouvoir réflecteurPILLER, H.Ore microscopy summer school. 1979, Num 3, pp 59-72, issn 0085-1019Conference Paper

AU SUJET DE L'OPTIQUE DE LA COVELLINE.GEHLEN K VON; PILLER H.1968; TRAD. B.R.G.M.; FRA; 1968, NUM. 4895, P. 1 A 23Miscellaneous

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